Naim Ben-Hamida

45 papers A* 1A 4C 7Misc 2Journal 12Unranked 19

Year	Rank	Type	Title / Venue / Authors
2025	—	`conf`	Net 3.2 Tbps 225 Gbaud PAM4 O-Band IM/DD 2 km Transmission Using FR8 and DR8 with a CMOS 3 nm SerDes and TFLN Modulators. OFC Charles St-Arnault, Santiago Bernal, Derek Kita, Ross Dickson, Mariam Yehia Abdelaziz, Aleksandar Nikic, Benton Qiu, Benjamin Krueger, Fabio Pittalà, Christian Reimer, Bruce Beggs, Naim Ben-Hamida, David V. Plant
2025	—	`conf`	Net 512 Gbps 320 Gbaud PAM4 Faster-Than-Nyquist Transmission with a 3 nm SerDes and TFLN Modulators. ECOC Charles St-Arnault, Benton Qiu, Santiago Bernal, Derek Kita, Ross Dickson, Mariam Yehia Abdelaziz, Aleksandar Nikic, Benjamin Krüger, Fabio Pittalà, Christian Reimer, Bruce Beggs, Naim Ben-Hamida, David V. Plant
2024	J	`jnl`	Digital Compensation of Timing Skew Mismatches in Time-Interleaved ADCs by Source Separation. IEEE Trans. Instrum. Meas. Hamidreza Mafi, Naim Ben-Hamida, Sadok Aouini, Yvon Savaria
2024	—	`conf`	Digital Compensation of Timing-Skew Mismatches in TI-ADCs by Modulation and Source Separation. NewCAS Hamidreza Mafi, Naim Ben-Hamida, Sadok Aouini, Yvon Savaria
2024	C	`conf`	Utilization of Noise-Shaping in Mixed-Signal Timing-Skew Mismatch Calibration of TI-ADCs. ISCAS Hamidreza Mafi, Mohamed Amine Bensenouci, Sadok Aouini, Mohammad Honarparvar, Naim Ben-Hamida, Yvon Savaria
2023	—	`conf`	Background Calibration of Time-Interleaved ADCs with Polyphase Filters. NEWCAS Hamidreza Mafi, Mohamed Ali, Yvon Savaria, Mohammad Honarparvar, Naim Ben-Hamida
2023	J	`jnl`	High Speed DMT for 224 Gb/s and Faster Wireline Transmission. IEEE Trans. Circuits Syst. I Regul. Pap. Zhe Jiang, Hazem Beshara, Jerry Lam, Naim Ben-Hamida, Calvin Plett
2022	J	`jnl`	A Memory-Based Direct-Digital Frequency Synthesizer for Fractional Synchronization. IEEE Trans. Circuits Syst. II Express Briefs Soheyl Ziabakhsh, Sadok Aouini, Robert G. Gibbins, Matt Mikkelsen, Sanam Moslemi-Tabrizi, Naim Ben-Hamida
2021	J	`jnl`	An Area-Efficient High-Resolution Segmented ΣΔ-DAC for Built-In Self-Test Applications. IEEE Trans. Very Large Scale Integr. Syst. Ahmed S. Emara, Denis Romanov, Gordon W. Roberts, Sadok Aouini, Soheyl Ziabakhsh, Mahdi Parvizi, Naim Ben-Hamida
2021	—	`conf`	Delay-Locked Loop Based Multiphase Clock Generator for Time-Interleaved ADCs. ICECS Ibrahim Alhousseiny, Mohamed Ali, Naim Ben-Hamida, Mohammad Honarparvar, Mohamad Sawan, Yvon Savaria
2021	J	`jnl`	New Charge-Steering DFEs in 55-nm CMOS. IEEE Trans. Circuits Syst. II Express Briefs Jacob Pike, Mahdi Parvizi, David Berton, Naim Ben-Hamida, Sadok Aouini, Calvin Plett
2020	J	`jnl`	Low-Power Built-in Jitter Injection Using Linearized Phase Interpolator. IEEE Trans. Instrum. Meas. Ahmad Abdo, Sadok Aouini, Naim Ben-Hamida, Claude D'Amours
2020	J	`jnl`	Optimized Periodic ΣΔ Bitstreams for DC Signal Generation Used in Dynamic Calibration Applications. IEEE Open J. Circuits Syst. Ahmed S. Emara, Denis Romanov, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida
2020	C	`conf`	Seizure Prediction with a Single iEEG Electrode Using Non-linear Techniques. ISNCC Tahar Haddad, Naim Ben-Hamida, Sadok Aouini, Jihene Rezgui
2020	A	`conf`	Study on the Compensation of Silicon Photonics-Based Modulators in DCI Applications. DATE Naim Ben-Hamida, Ahmad Abdo, Xueyang Li, Md Samiul Alam, Mahdi Parvizi, Claude D'Amours, David V. Plant
2020	—	`conf`	Using Optimized Butterworth-Based ΣΔ Bitstreams for the Testing of High-Resolution Data Converters. NEWCAS Ahmed S. Emara, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida
2019	—	`conf`	A 60 GS/s 8-b DAC with > 29.5dB SINAD up to Nyquist frequency in 7nm FinFET CMOS. BCICTS Yuriy M. Greshishchev, Tingjun Wen, Naim Ben-Hamida, Jorge Aguirre, Sadok Aouini, Marinette Besson, Robert Gibbins, Young Gouk Cho, Jerry Lam, Douglas McPherson, Mahdi Parvizi
2019	J	`jnl`	Adaptive Coherent Receiver Settings for Optimum Channel Spacing in Gridless Optical Networks. Future Internet Ahmad Abdo, Sadok Aouini, Bilal Riaz, Naim Ben-Hamida, Claude D'Amours
2019	—	`conf`	On the Design of DACs for Dynamic Calibration Applications using Periodic Sequences from ΣΔ Modulators. CCECE Ahmed S. Emara, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida
2019	J	`jnl`	Partial Pre-Emphasis for Pluggable 400 G Short-Reach Coherent Systems. Future Internet Ahmad Abdo, Xueyang Li, Md Samiul Alam, Mahdi Parvizi, Naim Ben-Hamida, Claude D'Amours, David V. Plant
2019	—	`conf`	Selecting the Fastest Settling-Time Filter in PDM-based DACs used for Dynamic Calibration Applications. MWSCAS Ahmed S. Emara, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida
2018	Misc	`conf`	A coherent subsampling test system arrangement suitable for phase domain measurements. VTS Young Gouk Cho, Gordon W. Roberts, Sadok Aouini, Mahdi Parvizi, Naim Ben-Hamida
2018	C	`conf`	New Charge-Steering Latches in 28nm CMOS for Use in High-Speed Wireline Transceivers. ISCAS Jacob Pike, Mahdi Parvizi, Naim Ben-Hamida, Sadok Aouini, Calvin Plett
2018	—	`conf`	Ultra-Broadband and Ultra-Compact Optical 90° Hybrid Based on 2×4 MMI Coupler with Subwavelength Gratings on Silicon-on-Insulator. OFC Luhua Xu, Yun Wang, David Patel, Mohamed H. Morsy-Osman, Rui Li, Michael Hui, Mahdi Parvizi, Naim Ben-Hamida, David V. Plant
2015	J	`jnl`	Analysis and Modeling of the Phase Detector Hysteresis in Bang-Bang PLLs. IEEE Trans. Circuits Syst. I Regul. Pap. Samira Bashiri, Sadok Aouini, Naim Ben-Hamida, Calvin Plett
2014	—	`conf`	Epilepsy seizure prediction using graph theory. NEWCAS Tahar Haddad, Larbi Talbi, Ahmed Lakhssassi, Naim Ben-Hamida, Sadok Aouini
2013	—	`conf`	A programmable analog frequency-locked loop for VCO characterization and test with 8 ppm resolution. CICC Sadok Aouini, Jean-Francois Bousquet, Naim Ben-Hamida, Lukas Jakober, John Wolczanski, Christopher Kurowski
2011	—	`conf`	A 56GS/S 6b DAC in 65nm CMOS with 256×6b memory. ISSCC Yuriy M. Greshishchev, Daniel Pollex, Shing-Chi Wang, Marinette Besson, Philip Flemeke, Stefan Szilagyi, Jorge Aguirre, Chris Falt, Naim Ben-Hamida, Robert Gibbins, Peter Schvan
2010	—	`conf`	A 40GS/s 6b ADC in 65nm CMOS. ISSCC Yuriy M. Greshishchev, Jorge Aguirre, Marinette Besson, Robert Gibbins, Chris Falt, Philip Flemke, Naim Ben-Hamida, Daniel Pollex, Peter Schvan, Shing-Chi Wang
2009	—	`conf`	Clock recovery for a 40 Gb/s QPSK optical receiver. ICECS Naim Ben-Hamida, John Sitch, Philip Flemke, Daniel Pollex, Peter Schvan, Yuriy M. Greshishchev, Shing-Chi Wang, Chris Falt
2008	—	`conf`	A 24GS/s 6b ADC in 90nm CMOS. ISSCC Peter Schvan, Jérôme Bach, Chris Falt, Philip Flemke, Robert Gibbins, Yuriy M. Greshishchev, Naim Ben-Hamida, Daniel Pollex, John Sitch, Shing-Chi Wang, John Wolczanski
2006	—	`conf`	A 22GS/s 5b adc in 0.13µm SiGe BiCMOS. ISSCC Peter Schvan, Daniel Pollex, Shing-Chi Wang, Chris Falt, Naim Ben-Hamida
2001	J	`jnl`	Closing the gap between analog and digital testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Khaled Saab, Naim Ben-Hamida, Bozena Kaminska
2000	A*	`conf`	Closing the gap between analog and digital. DAC Khaled Saab, Naim Ben-Hamida, Bozena Kaminska
2000	A	`conf`	Parametric Fault Simulation and Test Vector Generation. DATE Khaled Saab, Naim Ben-Hamida, Bozena Kaminska
1997	—	`conf`	A perturbation based fault modeling and simulation for mixed-signal circuits. Asian Test Symposium Naim Ben-Hamida, Khaled Saab, David Marche, Bozena Kaminska
1996	A	`conf`	LIMSoft: Automated Tool for Design and Test Integration of Analog Circuits. ITC Naim Ben-Hamida, Khaled Saab, David Marche, Bozena Kaminska, Guy Quesnel
1996	C	`conf`	Testing of embedded A/D converters in mixed-signal circuit. ICCD Naim Ben-Hamida, Bechir Ayari, Bozena Kaminska
1995	—	`conf`	Automatic test vector generation for mixed-signal circuits. ED&TC Bechir Ayari, Naim Ben-Hamida, Bozena Kaminska
1994	C	`conf`	High Level Synthesis with Testability Constraints. ISCAS Naim Ben-Hamida, Bozena Kaminska
1994	Misc	`conf`	Multiple Fault Testing in Analog Circuits. VLSI Design Naim Ben-Hamida, Bozena Kaminska
1994	C	`conf`	Pseudo-Random Vector Compaction for Sequential Testability. ISCAS Naim Ben-Hamida, Bozena Kaminska, Yvon Savaria
1993	A	`conf`	Analog Circuit Testing Based on Sensitivity Computation and New Circuit Modeling. ITC Naim Ben-Hamida, Bozena Kaminska
1993	C	`conf`	Initiability: A Measure of Sequential Testability. ISCAS Naim Ben-Hamida, Bozena Kaminska, Yvon Savaria
1993	J	`jnl`	Multiple fault analog circuit testing by sensitivity analysis. J. Electron. Test. Naim Ben-Hamida, Bozena Kaminska