Nagesh Tamarapalli

22 papers A 11Misc 6Journal 3Unranked 2

Year	Rank	Type	Title / Venue / Authors
2015	Misc	`conf`	Tutorial T5: High Performance Low Power Designs - Challenges and Best practices in Design, Verification and Test. VLSID Nagesh Tamarapalli, Prashanth Vallur, Sachin Kulkarni
2014	Misc	`conf`	Application of Test-View Modeling to Hierarchical ATPG. VLSID Rahul Shukla, Phong Loi, Ken Pham, Arie Margulis, Kathy Yang, Nagesh Tamarapalli
2013	Misc	`conf`	Tutorial T10: Post - Silicon Validation, Debug and Diagnosis. VLSI Design Prabhat Mishra, Masahiro Fujita, Virendra Singh, Nagesh Tamarapalli, Sharad Kumar, Rajesh Mittal
2012	Misc	`conf`	Tutorial T3: DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. VLSI Design Srikanth Venkataraman, Nagesh Tamarapalli
2008	Misc	`conf`	DFM / DFT / SiliconDebug / Diagnosis. VLSI Design Srikanth Venkataraman, Nagesh Tamarapalli
2006	A	`conf`	A Rapid Yield Learning Flow Based on Production Integrated Layout-Aware Diagnosis. ITC Martin Keim, Nagesh Tamarapalli, Huaxing Tang, Manish Sharma, Janusz Rajski, Chris Schuermyer, Brady Benware
2006	Misc	`conf`	DFM, DFT, Silicon Debug and Diagnosis - The Loop to Ensure Product Yield. VLSI Design David Abercrombie, Bernd Koenemann, Nagesh Tamarapalli, Srikanth Venkataraman
2006	A	`conf`	Diagnosis with Limited Failure Information. ITC Yu Huang, Wu-Tung Cheng, Nagesh Tamarapalli, Janusz Rajski, Randy Klingenberg, Will Hsu, Yuan-Shih Chen
2006	A	`conf`	Improving Transition Fault Test Pattern Quality through At-Speed Diagnosis. ITC Nandu Tendolkar, Dawit Belete, Bill Schwarz, Bob Podnar, Akshay Gupta, Steve Karako, Wu-Tung Cheng, Alex Babin, Kun-Han Tsai, Nagesh Tamarapalli, Greg Aldrich
2006	—	`conf`	The Next Step in Volume Scan Diagnosis: Standard Fail Data Format. ATS Andreas Leininger, Ajay Khoche, Martin Fischer, Nagesh Tamarapalli, Wu-Tung Cheng, Randy Klingenberg, Wu Yang
2005	A	`conf`	Achieving higher yield through diagnosis. ITC Nagesh Tamarapalli
2005	A	`conf`	Compression mode diagnosis enables high volume monitoring diagnosis flow. ITC Andreas Leininger, Peter Muhmenthaler, Wu-Tung Cheng, Nagesh Tamarapalli, Wu Yang, Kun-Han Hans Tsai
2004	—	`conf`	Compactor Independent Direct Diagnosis. Asian Test Symposium Wu-Tung Cheng, Kun-Han Tsai, Yu Huang, Nagesh Tamarapalli, Janusz Rajski
2003	J	`jnl`	Embedded Deterministic Test for Low-Cost Manufacturing. IEEE Des. Test Comput. Janusz Rajski, Mark Kassab, Nilanjan Mukherjee, Nagesh Tamarapalli, Jerzy Tyszer, Jun Qian
2003	J	`jnl`	High-Frequency, At-Speed Scan Testing. IEEE Des. Test Comput. Xijiang Lin, Ron Press, Janusz Rajski, Paul Reuter, Thomas Rinderknecht, Bruce Swanson, Nagesh Tamarapalli
2003	A	`conf`	Impact of Multiple-Detect Test Patterns on Product Quality. ITC Brady Benware, Chris Schuermyer, Sreenevasan Ranganathan, Robert Madge, Prabhu Krishnamurthy, Nagesh Tamarapalli, Kun-Han Tsai, Janusz Rajski
2003	A	`conf`	Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions. ITC Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski
2002	A	`conf`	Embedded Deterministic Test for Low-Cost Manufacturing Test. ITC Janusz Rajski, Jerzy Tyszer, Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski, Geir Eide, Jun Qian
2000	J	`jnl`	Automated synthesis of phase shifters for built-in self-testapplications. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Janusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer
1999	A	`conf`	Logic BIST for large industrial designs: real issues and case studies. ITC Graham Hetherington, Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan, Janusz Rajski
1998	A	`conf`	Automated synthesis of large phase shifters for built-in self-test. ITC Janusz Rajski, Nagesh Tamarapalli, Jerzy Tyszer
1996	A	`conf`	Constructive Multi-Phase Test Point Insertion for Scan-Based BIST. ITC Nagesh Tamarapalli, Janusz Rajski