Nagarajan Raghavan

72 papers Journal 53Unranked 19

Year	Rank	Type	Title / Venue / Authors
2026	J	`jnl`	PINEAPPLE: Physics-Informed Neuro-Evolution Algorithm for Prognostic Parameter Inference in Lithium-Ion Battery Electrodes. CoRR Karkulali Pugalenthi, Jian Cheng Wong, Qizheng Yang, Pao-Hsiung Chiu, My Ha Dao, Nagarajan Raghavan, Chinchun Ooi
2026	J	`jnl`	Physics-Informed Uncertainty Enables Reliable AI-driven Design. CoRR Tingkai Xue, Chin Chun Ooi, Yang Jiang, Pham Luu Trung Duong, Pao-Hsiung Chiu, Weijiang Zhao, Nagarajan Raghavan, My Ha Dao
2025	—	`conf`	Compound Fault Diagnosis for Train Transmission Systems Using Deep Learning with Fourier-enhanced Representation. ICPHM Jonathan Adam Rico, Nagarajan Raghavan, Senthilnath Jayavelu
2025	J	`jnl`	Compound Fault Diagnosis for Train Transmission Systems Using Deep Learning with Fourier-enhanced Representation. CoRR Jonathan Adam Rico, Nagarajan Raghavan, Senthilnath Jayavelu
2025	J	`jnl`	Incremental Multistep Forecasting of Battery Degradation Using Pseudo Targets. CoRR Jonathan Adam Rico, Nagarajan Raghavan, Senthilnath Jayavelu
2025	—	`conf`	Lithium-ion Battery Capacity Loss Predictions using Domain-Knowledge-Incorporated Capacity Loss Model through Bayesian Inference. ICPHM Rahul Sahay, Hyunseok Park, Nagarajan Raghavan
2025	—	`conf`	Second Life Prognostic for Li-Ion Battery: Cases of Missing Data with Polynomial Chaos and Time VAE. ICPHM Pham Luu Trung Duong, Nagarajan Raghavan
2025	J	`jnl`	TS-HINT: Enhancing Semiconductor Time Series Regression Using Attention Hints From Large Language Model Reasoning. CoRR Jonathan Adam Rico, Nagarajan Raghavan, Senthilnath Jayavelu
2024	J	`jnl`	Feature-Driven Density Prediction of Maraging Steel Additively Manufactured Samples Using Pyrometer Sensor and Supervised Machine Learning. IEEE Access Rajesh Kumar Balaraman, Shaista Hussain, John Kgee Ong, Qing Yang Tan, Nagarajan Raghavan
2024	J	`jnl`	Memristive Nanowire Network for Energy Efficient Audio Classification: Pre-Processing-Free Reservoir Computing with Reduced Latency. CoRR Akshaya Rajesh, Pavithra Ananthasubramanian, Nagarajan Raghavan, Ankush Kumar
2024	J	`jnl`	Successive Multi-Stage Compliance-Ramp Voltage Sweep Methodology (MSC-RVS) for Understanding the Evolution of Gate Breakdown Mechanisms in p-GaN HEMTs. IEEE Access Jerry Joseph James, Nagarajan Raghavan
2023	—	`conf`	A New Methodology to Precisely Induce Wake-Up for Reliability Assessment of Ferroelectric Devices. IRPS Tiang Teck Tan, Yu-Yun Wang, Joel Tan, Tian-Li Wu, Nagarajan Raghavan, Kin Leong Pey
2023	—	`conf`	Backhopping-based STT-MRAM Poisson Spiking Neuron for Neuromorphic Computation. IRPS J. Tan, J. H. Lim, Jae Hyun Kwon, Vinayak Bharat Naik, Nagarajan Raghavan, Kin Leong Pey
2023	J	`jnl`	Development of a surrogate model for high-fidelity laser powder-bed fusion using tensor train and gaussian process regression. J. Intell. Manuf. Umesh Kizhakkinan, Pham Luu Trung Duong, Robert Laskowski, Guglielmo Vastola, David W. Rosen, Nagarajan Raghavan
2023	J	`jnl`	Investigating Knowledge Structure and Future Directions in IT-Based Business Methods Using Hierarchical Main Path Approach. IEEE Access Sejun Yoon, Nagarajan Raghavan, Nguyen-Truong Le, Hyunseok Park
2022	J	`jnl`	Global Optimization of Surface Warpage for Inverse Design of Ultra-Thin Electronic Packages Using Tensor Train Decomposition. IEEE Access Cheryl Selvanayagam, Pham Luu Trung Duong, Brett Wilkerson, Nagarajan Raghavan
2022	J	`jnl`	Neuromorphic In-Memory RRAM NAND/NOR Circuit Performance Analysis in a CNN Training Framework on the Edge for Low Power IoT. IEEE Access Nagaraj Lakshmana Prabhu, Nagarajan Raghavan
2022	J	`jnl`	Remaining Useful Life Prediction of Lithium-Ion Batteries Using Neural Networks with Adaptive Bayesian Learning. Sensors Karkulali Pugalenthi, Hyunseok Park, Shaista Hussain, Nagarajan Raghavan
2021	J	`jnl`	A Gaussian Mixture Model Clustering Ensemble Regressor for Semiconductor Manufacturing Final Test Yield Prediction. IEEE Access Dan Jiang, Weihua Lin, Nagarajan Raghavan
2021	J	`jnl`	Bias Suppression Framework for Detrending Mean of Multi-Output Gaussian Process Regression in LED Remaining Storage Life Prognosis. IEEE Access Lim Sze Li Harry, Pham Luu Trung Duong, Hyunseok Park, Nagarajan Raghavan
2021	J	`jnl`	Computational Failure Analysis of In-Memory RRAM Architecture for Pattern Classification CNN Circuits. IEEE Access Nagaraj Lakshmana Prabhu, Nagarajan Raghavan
2021	—	`conf`	Condition Based Maintenance Policy for Crankcase Lubricating Oil in Diesel Locomotives. IEEM Monika Tanwar, Nagarajan Raghavan, Sidra Khanam
2021	J	`jnl`	Developmental Trajectories in Blockchain Technology Using Patent-Based Knowledge Network Analysis. IEEE Access Sohee Kim, Sejun Yoon, Nagarajan Raghavan, Nguyen-Truong Le, Hyunseok Park
2021	J	`jnl`	Hierarchical main path analysis to identify decompositional multi-knowledge trajectories. J. Knowl. Manag. Sejun Yoon, Changbae Mun, Nagarajan Raghavan, Dongwook Hwang, Sohee Kim, Hyunseok Park
2021	J	`jnl`	Hybrid Particle Filter Trained Neural Network for Prognosis of Lithium-Ion Batteries. IEEE Access Karkulali Pugalenthi, Hyunseok Park, Shaista Hussain, Nagarajan Raghavan
2021	J	`jnl`	Inverse Design for Low Warpage Ultra-Thin Packages Using Constrained Particle Swarm Optimization. IEEE Access Cheryl Selvanayagam, Pham Luu Trung Duong, Brett Wilkerson, Nagarajan Raghavan
2021	J	`jnl`	Predicting Lumen Degradation of Light Emitting Diodes Using Hybrid Particle Filter Trained Neural Networks. IEEE Access Karkulali Pugalenthi, Hyunseok Park, Shaista Hussain, Nagarajan Raghavan
2021	J	`jnl`	Semiconductor Manufacturing Final Test Yield Optimization and Wafer Acceptance Test Parameter Inverse Design Using Multi-Objective Optimization Algorithms. IEEE Access Dan Jiang, Weihua Lin, Nagarajan Raghavan
2020	J	`jnl`	A Novel Framework for Semiconductor Manufacturing Final Test Yield Classification Using Machine Learning Techniques. IEEE Access Dan Jiang, Weihua Lin, Nagarajan Raghavan
2020	—	`conf`	Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films. IRPS Alok Ranjan, Sean J. O'Shea, Michel Bosman, Joel Molina Reyes, Nagarajan Raghavan, Kin Leong Pey
2020	J	`jnl`	Data Driven Prognosis of Fracture Dynamics Using Tensor Train and Gaussian Process Regression. IEEE Access Pham Luu Trung Duong, Shaista Hussain, Mark Hyunpong Jhon, Nagarajan Raghavan
2020	J	`jnl`	Learning Localized Spatial Material Properties of Substrates in Ultra-Thin Packages Using Markov Chain Monte Carlo and Finite Element Analysis. IEEE Access Cheryl Selvanayagam, Pham Luu Trung Duong, Nagarajan Raghavan
2020	J	`jnl`	Lubricating Oil Remaining Useful Life Prediction Using Multi-Output Gaussian Process Regression. IEEE Access Monika Tanwar, Nagarajan Raghavan
2020	—	`conf`	Origins and Signatures of Tail Bit Failures in Ultrathin MgO Based STT-MRAM. IRPS Jia Hao Lim, Nagarajan Raghavan, Jae Hyun Kwon, Tae Young Lee, Robin Chao, Nyuk Leong Chung, Kazutaka Yamane, Naganivetha Thiyagarajah, Vinayak Bharat Naik, Kin Leong Pey
2020	J	`jnl`	Piecewise Model-Based Online Prognosis of Lithium-Ion Batteries Using Particle Filters. IEEE Access Karkulali Pugalenthi, Hyunseok Park, Nagarajan Raghavan
2020	—	`conf`	Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device. IRPS Laiqiang Luo, Kalya Shubhakar, Sen Mei, Nagarajan Raghavan, Fan Zhang, Danny Shum, Kin Leong Pey
2019	—	`conf`	Correct Extrapolation Model for TDDB of STT-MRAM MgO Magnetic Tunnel Junctions. IRPS Jia Hao Lim, Nagarajan Raghavan, Vinayak Bharat Naik, Jae Hyun Kwon, Kazutaka Yamane, H. Yang, K. H. Lee, Kin Leong Pey
2019	—	`conf`	Dielectric Breakdown in 2D Layered Hexagonal Boron Nitride - The Knowns and the Unknowns. IRPS Kin Leong Pey, Alok Ranjan, Nagarajan Raghavan, Kalya Shubhakar, Sean J. O'Shea
2019	—	`conf`	Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms. IRPS Fernando Leonel Aguirre, Andrea Padovani, Alok Ranjan, Nagarajan Raghavan, Nahuel Vega, Nahuel Muller, Sebastián Matías Pazos, Mario Debray, Joel Molina Reyes, Kin Leong Pey, Felix Palumbo
2018	J	`jnl`	A holistic comparison of the different resampling algorithms for particle filter based prognosis using lithium ion batteries as a case study. Microelectron. Reliab. Karkulali Pugalenthi, Nagarajan Raghavan
2018	J	`jnl`	Application of expectation maximization and Kalman smoothing for prognosis of lumen maintenance life for light emitting diodes. Microelectron. Reliab. Pham Luu Trung Duong, Hyunseok Park, Nagarajan Raghavan
2018	J	`jnl`	Application of multi-output Gaussian process regression for remaining useful life prediction of light emitting diodes. Microelectron. Reliab. Pham Luu Trung Duong, Hyunseok Park, Nagarajan Raghavan
2018	—	`conf`	Area and pulsewidth dependence of bipolar TDDB in MgO magnetic tunnel junction. IRPS Jia Hao Lim, Nagarajan Raghavan, Sen Mei, Vinayak Bharat Naik, Jae Hyun Kwon, S. M. Noh, B. Liu, E. H. Toh, Nyuk Leong Chung, Robin Chao, K. H. Lee, Kin Leong Pey
2018	J	`jnl`	Comparison of experimental, analytical and simulation methods to estimate substrate material properties for warpage reliability analysis. Microelectron. Reliab. Cheryl Selvanayagam, Rathin Mandal, Nagarajan Raghavan
2018	J	`jnl`	Gaussian process regression approach for robust design and yield enhancement of self-assembled nanostructures. Microelectron. Reliab. Pham Luu Trung Duong, Xuechu Xu, Qing Yang, Nagarajan Raghavan
2018	J	`jnl`	Heuristic Kalman optimized particle filter for remaining useful life prediction of lithium-ion battery. Microelectron. Reliab. Pham Luu Trung Duong, Nagarajan Raghavan
2018	—	`conf`	Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics. IRPS Alok Ranjan, Nagarajan Raghavan, Sean J. O'Shea, Sen Mei, Michel Bosman, Kalya Shubhakar, Kin Leong Pey
2018	J	`jnl`	Statistical nature of hard breakdown recovery in high-κ dielectric stacks studied using ramped voltage stress. Microelectron. Reliab. Xuan Feng, Nagarajan Raghavan, Sen Mei, Shurong Dong, Kin Leong Pey, Hei Wong
2017	—	`conf`	A metaheuristic approach to remaining useful life estimation of systems subject to multiple degradation mechanisms. ICPHM Pham Luu Trung Duong, Nagarajan Raghavan
2017	J	`jnl`	Application of multiplicative dimensional reduction method for uncertainty quantification and sensitivity analysis of MEMS electrostatic actuators. Microelectron. Reliab. Pham Luu Trung Duong, Trong Toan Tran, Nagarajan Raghavan
2017	J	`jnl`	Uncertainty quantification in nanowire growth modeling - A precursor to quality semiconductor nanomanufacturing. Microelectron. Reliab. Chinedu I. Ossai, Xuechu Xu, Qing Yang, Nagarajan Raghavan
2017	—	`conf`	Uncertainty quantification in prognostics: A data driven polynomial chaos approach. ICPHM Pham Luu Trung Duong, Nagarajan Raghavan
2016	J	`jnl`	Analysis of quantum conductance, read disturb and switching statistics in HfO Microelectron. Reliab. Alok Ranjan, Nagarajan Raghavan, Joel Molina Reyes, Sean J. O'Shea, Kalya Shubhakar, Kin Leong Pey
2016	J	`jnl`	Application of the defect clustering model for forming, SET and RESET statistics in RRAM devices. Microelectron. Reliab. Nagarajan Raghavan
2016	J	`jnl`	Compliance current dominates evolution of NiSi Microelectron. Reliab. Sen Mei, Michel Bosman, Nagarajan Raghavan, Xing Wu, Kin Leong Pey
2016	J	`jnl`	Conductive filament formation at grain boundary locations in polycrystalline HfO Microelectron. Reliab. Kalya Shubhakar, Sen Mei, Michel Bosman, Nagarajan Raghavan, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey
2015	J	`jnl`	An SEM/STM based nanoprobing and TEM study of breakdown locations in HfO Microelectron. Reliab. Kalya Shubhakar, Michel Bosman, O. A. Neucheva, Y. C. Loke, Nagarajan Raghavan, R. Thamankar, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey
2015	—	`conf`	Monte Carlo model of reset stochastics and failure rate estimation of read disturb mechanism in HfOx RRAM. IRPS Nagarajan Raghavan, Daniel D. Frey, Michel Bosman, Kin Leong Pey
2015	J	`jnl`	Particle filter approach to lifetime prediction for microelectronic devices and systems with multiple failure mechanisms. Microelectron. Reliab. Nagarajan Raghavan, Daniel D. Frey
2015	J	`jnl`	Probabilistic insight to possibility of new metal filament nucleation during repeated cycling of conducting bridge memory. Microelectron. Reliab. Nagarajan Raghavan, Michel Bosman, Kin Leong Pey
2015	—	`conf`	Remaining useful life estimation for systems subject to multiple degradation mechanisms. ICPHM Nagarajan Raghavan, Daniel D. Frey
2015	—	`conf`	Spectroscopy of SILC trap locations and spatial correlation study of percolation path in the high-κ and interfacial layer. IRPS Nagarajan Raghavan, Michel Bosman, Kin Leong Pey
2015	J	`jnl`	Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approach. Microelectron. Reliab. Nagarajan Raghavan, Daniel D. Frey, Michel Bosman, Kin Leong Pey
2014	J	`jnl`	Assessment of read disturb immunity in conducting bridge memory devices - A thermodynamic perspective. Microelectron. Reliab. Nagarajan Raghavan, Michel Bosman, Kin Leong Pey
2014	J	`jnl`	High-κ dielectric breakdown in nanoscale logic devices - Scientific insight and technology impact. Microelectron. Reliab. Nagarajan Raghavan, Kin Leong Pey, Kalya Shubhakar
2014	J	`jnl`	Impact of local structural and electrical properties of grain boundaries in polycrystalline HfO Microelectron. Reliab. Kalya Shubhakar, Nagarajan Raghavan, Sunil Singh Kushvaha, Michel Bosman, Zhongrui Wang, Sean J. O'Shea, Kin Leong Pey
2014	J	`jnl`	Performance and reliability trade-offs for high-κ RRAM. Microelectron. Reliab. Nagarajan Raghavan
2014	J	`jnl`	Prognostic methodology for remaining useful life estimation of retention loss in nanoscale resistive switching memory. Microelectron. Reliab. Nagarajan Raghavan, Daniel D. Frey, Kin Leong Pey
2014	J	`jnl`	Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devices. Microelectron. Reliab. Nagarajan Raghavan, Michel Bosman, Daniel D. Frey, Kin Leong Pey
2009	J	`jnl`	Reply to comments on "A framework to practical predictive maintenance modeling for multi-state systems". Reliab. Eng. Syst. Saf. Cher Ming Tan, Nagarajan Raghavan
2008	J	`jnl`	A framework to practical predictive maintenance modeling for multi-state systems. Reliab. Eng. Syst. Saf. Cher Ming Tan, Nagarajan Raghavan
2007	J	`jnl`	An approach to statistical analysis of gate oxide breakdown mechanisms. Microelectron. Reliab. Cher Ming Tan, Nagarajan Raghavan