Nabil Badereddine

23 papers A* 1A 4B 4C 3Misc 2Journal 3Unranked 6
YearRankTypeTitle / Venue / Authors
2014 J jnl
On the Test and Mitigation of Malfunctions in Low-Power SRAMs.
J. Electron. Test.
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Nabil Badereddine
2013 Misc conf
A built-in scheme for testing and repairing voltage regulators of low-power srams.
VTS
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 — conf
Adaptive Source Bias for Improved Resistive-Open Defect Coverage during SRAM Testing.
Asian Test Symposium
Elena I. Vatajelu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 B conf
Analyzing resistive-open defects in SRAM core-cell under the effect of process variability.
ETS
Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 — conf
Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures.
DTIS
Elena I. Vatajelu, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 A conf
On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs.
ITC
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2013 A conf
Test solution for data retention faults in low-power SRAMs.
DATE
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2012 B conf
Defect analysis in power mode control logic of low-power SRAMs.
ETS
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2012 J jnl
Impact of Resistive-Bridging Defects in SRAM at Different Technology Nodes.
J. Electron. Test.
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
2012 A conf
Low-power SRAMs power mode control logic: Failure analysis and test solutions.
ITC
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine
2011 — conf
Failure Analysis and Test Solutions for Low-Power SRAMs.
Asian Test Symposium
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine
2011 A conf
On using address scrambling to implement defect tolerance in SRAMs.
ITC
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
2011 C conf
Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling.
DDECS
Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
2010 A* conf
A statistical simulation method for reliability analysis of SRAM core-cells.
DAC
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
2010 B conf
Analysis of resistive-bridging defects in SRAM core-cells: A comparative study from 90nm down to 40nm technology nodes.
ETS
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
2010 Misc conf
Detecting NBTI induced failures in SRAM core-cells.
VTS
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
2010 — conf
Impact of Resistive-Bridging Defects in SRAM Core-Cell.
DELTA
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
2010 B conf
Setting test conditions for improving SRAM reliability.
ETS
Renan Alves Fonseca, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine
2008 J jnl
A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction.
J. Electron. Test.
Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault
2006 — conf
Power-Aware Test Data Compression for Embedded IP Cores.
ATS
Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty, Serge Pravossoudovitch, Christian Landrault
2006 C conf
Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing.
VLSI-SoC
Nabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Christian Landrault, Arnaud Virazel, Hans-Joachim Wunderlich
2005 — conf
Controlling Peak Power Consumption During Scan Testing: Power-Aware DfT and Test Set Perspectives.
PATMOS
Nabil Badereddine, Patrick Girard, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault
2005 C conf
Scan Cell Reordering for Peak Power Reduction during Scan Test Cycles.
VLSI-SoC
Nabil Badereddine, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Christian Landrault