| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2020 | J | jnl |
J. Electron. Test.
|
| 2017 | — | conf |
PKIA
|
| 2016 | — | conf |
HiPC Workshops
|
| 2016 | — | conf |
ICACCI
|
| 2013 | — | conf |
T4E
|
| 2013 | A | conf |
DSN
|
| 2012 | — | conf |
WorldCIS
|
| 2012 | — | conf |
T4E
|
| 2011 | — | conf |
T4E
|
| 2011 | — | conf |
T4E
|
| 2010 | — | conf |
T4E
|
| 2009 | — | conf |
AINA Workshops
|
| 2008 | J | jnl |
J. Circuits Syst. Comput.
|
| 2005 | Misc | conf |
ICISS
|
| 2000 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 1997 | J | jnl |
J. Circuits Syst. Comput.
|
| 1995 | J | jnl |
J. Electron. Test.
|