| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
Multi-source AdaBoost with cross-weight method for virtual metrology in semiconductor manufacturing.
Int. J. Prod. Res.
|
| 2022 | J | jnl |
IEEE Trans. Engineering Management
|
| 2022 | J | jnl |
Pattern Recognit.
|
| 2021 | J | jnl |
Expert Syst. Appl.
|
| 2019 | J | jnl |
Pattern Recognit.
|
| 2017 | J | jnl |
Expert Syst. Appl.
|
| 2017 | J | jnl |
Neurocomputing
|
| 2015 | J | jnl |
INFORMS J. Comput.
|
| 2015 | J | jnl |
J. Oper. Res. Soc.
|
| 2015 | J | jnl |
J. Oper. Res. Soc.
|
| 2015 | J | jnl |
Scientometrics
|
| 2015 | J | jnl |
IEEE Intell. Syst.
|
| 2014 | J | jnl |
IEEE Intell. Syst.
|
| 2013 | J | jnl |
IEEE Trans. Intell. Transp. Syst.
|
| 2013 | J | jnl |
IEEE Trans. Ind. Electron.
|
| 2012 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part C
|
| 2012 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part C
|
| 2011 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part A
|
| 2011 | J | jnl |
IEEE Intell. Syst.
|
| 2011 | J | jnl |
Pattern Recognit.
|
| 2010 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part C
|
| 2009 | J | jnl |
Expert Syst. Appl.
|
| 2009 | J | jnl |
Expert Syst. Appl.
|
| 2008 | J | jnl |
Expert Syst. Appl.
|
| 2008 | J | jnl |
Int. J. Data Min. Bioinform.
|
| 2008 | J | jnl |
Expert Syst. Appl.
|
| 2008 | J | jnl |
Expert Syst. Appl.
|
| 2007 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part C
|
| 2006 | A | conf |
SDM
|
| 2005 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|