| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Pattern Recognit.
|
| 2024 | J | jnl |
IEEE Trans. Engineering Management
|
| 2024 | J | jnl |
Ann. Oper. Res.
|
| 2024 | J | jnl |
Ann. Oper. Res.
|
| 2024 | J | jnl |
Expert Syst. Appl.
|
| 2024 | J | jnl |
Ann. Oper. Res.
|
| 2024 | J | jnl |
Ann. Oper. Res.
|
| 2024 | J | jnl |
Int. J. Prod. Res.
|
| 2024 | J | jnl |
Int. J. Prod. Res.
|
| 2024 | J | jnl |
Ann. Oper. Res.
|
| 2024 | J | jnl |
Ann. Oper. Res.
|
| 2024 | J | jnl |
Int. J. Prod. Res.
|
| 2023 | J | jnl |
Expert Syst. Appl.
|
| 2023 | J | jnl |
Int. J. Prod. Res.
|
| 2023 | J | jnl |
Int. J. Prod. Res.
|
| 2022 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2022 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2021 | J | jnl |
Ann. Oper. Res.
|
| 2021 | J | jnl |
IEEE Trans. Syst. Man Cybern. Syst.
|
| 2021 | J | jnl |
IEEE Trans. Ind. Informatics
|
| 2021 | J | jnl |
Ann. Oper. Res.
|
| 2021 | J | jnl |
Int. J. Prod. Res.
|
| 2021 | J | jnl |
Ann. Oper. Res.
|
| 2021 | J | jnl |
Ann. Oper. Res.
|
| 2020 | J | jnl |
Int. J. Prod. Res.
|
| 2020 | J | jnl |
Pattern Recognit.
|
| 2020 | J | jnl |
Int. J. Prod. Res.
|
| 2020 | J | jnl |
Ann. Oper. Res.
|
| 2019 | J | jnl |
Pattern Recognit. Lett.
|
| 2018 | J | jnl |
Pattern Recognit. Lett.
|
| 2018 | J | jnl |
Ann. Oper. Res.
|
| 2017 | J | jnl |
Int. J. Prod. Res.
|
| 2017 | J | jnl |
Scientometrics
|
| 2017 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2016 | J | jnl |
J. Oper. Res. Soc.
|
| 2016 | J | jnl |
IEEE Trans. Engineering Management
|
| 2016 | J | jnl |
J. Oper. Res. Soc.
|
| 2016 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2015 | J | jnl |
Expert Syst. Appl.
|
| 2015 | J | jnl |
J. Oper. Res. Soc.
|
| 2014 | — | conf |
WWW (Companion Volume)
|
| 2014 | J | jnl |
Intell. Data Anal.
|
| 2014 | J | jnl |
Scientometrics
|
| 2014 | J | jnl |
Ann. Oper. Res.
|
| 2012 | J | jnl |
Expert Syst. Appl.
|
| 2012 | J | jnl |
Appl. Intell.
|
| 2012 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2012 | J | jnl |
Expert Syst. Appl.
|
| 2012 | J | jnl |
Appl. Intell.
|
| 2011 | J | jnl |
Expert Syst. Appl.
|
| 2011 | J | jnl |
Ann. Oper. Res.
|
| 2011 | J | jnl |
Expert Syst. Appl.
|
| 2011 | J | jnl |
Appl. Intell.
|
| 2010 | J | jnl |
Expert Syst. Appl.
|
| 2009 | J | jnl |
J. Oper. Res. Soc.
|
| 2009 | J | jnl |
Pattern Recognit. Lett.
|
| 2009 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part C
|
| 2008 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2008 | J | jnl |
Technometrics
|
| 2007 | J | jnl |
IEEE Trans Autom. Sci. Eng.
|
| 2006 | J | jnl |
IEEE Trans. Syst. Man Cybern. Part B
|
| 2006 | J | jnl |
Technometrics
|