Muhammad Bashir

12 papers A 1Journal 11
YearRankTypeTitle / Venue / Authors
2021 J jnl
Optimal Supervisory Control for Flexible Manufacturing Systems Model With Petri Nets: A Place-Transition Control.
IEEE Access
Muhammad Bashir, Jian Zhou, Bashir Bala Muhammad
2020 J jnl
An Improved Method of Particle Swarm Optimization for Path Planning of Mobile Robot.
J. Control. Sci. Eng.
Xun Li, Dandan Wu, Jingjing He, Muhammad Bashir, Liping Ma
2020 J jnl
Optimal enforcement of liveness for decentralized systems of flexible manufacturing systems using Petri nets.
Trans. Inst. Meas. Control
Muhammad Bashir
2018 J jnl
On structural reduction of liveness-enforcing Petri net supervisors for flexible manufacturing systems: an algebraic approach.
IMA J. Math. Control. Inf.
Muhammad Bashir, ZhiWu Li, Murat Uzam, Naiqi Wu, Abdulrahman Al-Ahmari
2017 J jnl
A Minimal Supervisory Structure to Optimally Enforce Liveness on Petri Net Models for Flexible Manufacturing Systems.
IEEE Access
Muhammad Bashir, ZhiWu Li, Murat Uzam, Abdulrahman Al-Ahmari, Naiqi Wu, Ding Liu, Ting Qu
2015 J jnl
Hydrophilic Surface Modification of PDMS Microchannel for O/W and W/O/W Emulsions.
Micromachines
Shazia Bashir, Muhammad Bashir, Xavier Casadevall i Solvas, Julia M. Rees, William B. Zimmerman
2014 J jnl
Simulation of system backend dielectric reliability.
Microelectron. J.
Chang-Chih Chen, Muhammad Bashir, Linda S. Milor, Daehyun Kim, Sung Kyu Lim
2011 J jnl
Impact of irregular geometries on low-k dielectric breakdown.
Microelectron. Reliab.
Muhammad Bashir, Linda Milor, Dae Hyun Kim, Sung Kyu Lim
2010 J jnl
Methodology to determine the impact of linewidth variation on chip scale copper/low-k backend dielectric breakdown.
Microelectron. Reliab.
Muhammad Bashir, Linda S. Milor, Dae Hyun Kim, Sung Kyu Lim
2010 A conf
Towards a chip level reliability simulator for copper/low-k backend processes.
DATE
Muhammad Bashir, Linda S. Milor
2009 J jnl
A methodology to extract failure rates for low-k dielectric breakdown with multiple geometries and in the presence of die-to-die linewidth variation.
Microelectron. Reliab.
Muhammad Bashir, Linda S. Milor
2009 J jnl
Modeling Low-k Dielectric Breakdown to Determine Lifetime Requirements.
IEEE Des. Test Comput.
Muhammad Bashir, Linda Milor