| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2026 | J | jnl |
IEEE J. Biomed. Health Informatics
|
| 2026 | J | jnl |
Neural Networks
|
| 2025 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2025 | J | jnl |
Integr.
|
| 2025 | J | jnl |
Microelectron. J.
|
| 2025 | A | conf |
DATE
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | J | jnl |
Microelectron. J.
|
| 2023 | — | conf |
Enhancing Defect Diagnosis and Localization in Wafer Map Testing Through Weakly Supervised Learning.
ATS
|
| 2023 | J | jnl |
Eng. Appl. Artif. Intell.
|
| 2023 | J | jnl |
Int. J. Mach. Learn. Cybern.
|
| 2022 | J | jnl |
IEEE Des. Test
|
| 2021 | A* | conf |
ICCV
|
| 2020 | J | jnl |
CoRR
|
| 2017 | J | jnl |
IEICE Trans. Electron.
|
| 2017 | J | jnl |
IEICE Electron. Express
|