Mu-Chun Wang

15 papers A* 2Journal 7Unranked 6
YearRankTypeTitle / Venue / Authors
2022 A* conf
Analyzing and Simulating User Utterance Reformulation in Conversational Recommender Systems.
SIGIR
Shuo Zhang, Mu-Chun Wang, Krisztian Balog
2022 J jnl
Analyzing and Simulating User Utterance Reformulation in Conversational Recommender Systems.
CoRR
Shuo Zhang, Mu-Chun Wang, Krisztian Balog
2022 — conf
Textomics: A Dataset for Genomics Data Summary Generation.
ACL (1)
Mu-Chun Wang, Zixuan Liu, Sheng Wang
2021 A* conf
RCD: Relation Map Driven Cognitive Diagnosis for Intelligent Education Systems.
SIGIR
Weibo Gao, Qi Liu, Zhenya Huang, Yu Yin, Haoyang Bi, Mu-Chun Wang, Jianhui Ma, Shijin Wang, Yu Su
2020 — conf
Fringe Gate Leakage of 28nm HK/MG nMOSFETs with Nitridation Treatments.
ICKII
De-Cheng Zhang, Ching-Chuan Chou, Ho-Hsiang Chen, Shang-Ze Chen, Jian-Ming Chen, Hui-Yun Bor, Wen-How Lan, Mu-Chun Wang
2020 — conf
Junction Integrity for 28nm High-k nMOSFETs with Thermal Stress.
ICKII
Yu-Chen Lin, Kai-Chun Zhan, Ji-Min Zhang, Jian-Ming Chen, Cheng-Hsun-Tony Chang, Shea-Jue Wang, Mu-Chun Wang
2020 — conf
Patterns of Exposing Integrity of 28nm-node High-k Gate Dielectric on p-substrate with Nitridation Treatments.
ICKII
Si-Ping Li, Jia-Wei Xu, Wei-Hao Li, Jian-Ming Chen, Chao-Nan Wei, Wen-How Lan, Mu-Chun Wang
2020 — conf
Q-factor Integrity of 28nm-node High-k Gate Dielectric.
ICKII
Ying-Jun Deng, Hao-Lun Hu, Yu-Han Liang, Jian-Ming Chen, Ching-Chuan Chou, Shea-Jue Wang, Mu-Chun Wang
2018 J jnl
Electrical and Physical Characteristics of WO
Sensors
Shea-Jue Wang, Mu-Chun Wang, Shih-Fan Chen, Yu-Hsiang Li, Tien-Szu Shen, Hui-Yun Bor, Chao-Nan Wei
2018 J jnl
Thermal stress probing the channel-length modulation effect of nano n-type FinFETs.
Microelectron. Reliab.
Fu-Yuan Tuan, Chii-Wen Chen, Mu-Chun Wang, Wen-Shiang Liao, Shea-Jue Wang, Shou-Kong Fan, Wen-How Lan
2015 J jnl
Heat stress exposing performance of deep-nano HK/MG nMOSFETs using DPN or PDA treatment.
Microelectron. Reliab.
Shea-Jue Wang, Mu-Chun Wang, Shuang-Yuan Chen, Wen-How Lan, Bor-Wen Yang, L. S. Huang, Chuan-Hsi Liu
2015 J jnl
Leakage current mechanism and effect of Y
Microelectron. Reliab.
K. C. Lin, P. C. Juan, C. H. Liu, Mu-Chun Wang, C. H. Chou
2010 J jnl
Promoting of charged-device model/electrostatic discharge immunity in the dicing saw process.
Microelectron. Reliab.
Mu-Chun Wang, Chuan-Hsi Liu, Kuo-Shu Huang, Zhen-Ying Hsieh, Shuang-Yuan Chen, Hsin-Chia Yang, Chii-Ruey Lin
2009 J jnl
Trend transformation of drain-current degradation under drain-avalanche hot-carrier stress for CLC n-TFTs.
Microelectron. Reliab.
Zhen-Ying Hsieh, Mu-Chun Wang, Chih Chen, Jia-Min Shieh, Yu-Ting Lin, Shuang-Yuan Chen, Heng-Sheng Huang
2001 — conf
Compact Layout Rule Extraction for Latchup Prevention in a 0.25-?m Shallow-Trench-Isolation Silicided Bulk CMOS Process.
ISQED
Ming-Dou Ker, Wen-Yu Lo, Tung-Yang Chen, Howard Tang, S.-S. Chen, Mu-Chun Wang