Mounir Benabdenbi

35 papers A 3B 1C 6Misc 2Journal 6Unranked 17
YearRankTypeTitle / Venue / Authors
2026 — conf
M-EL2N: Data-Efficient Fault Injection Through Sample Difficulty Analysis.
LATS
Nicolò Bellarmino, Alberto Bosio, Ahmed Al Kaf, Mounir Benabdenbi, Régis Leveugle, Riccardo Cantoro
2025 — conf
Edge AI Dependability: Is Bit-flip Direction the Right Concern in Trustworthiness Reinforcement?
SBCCI
Régis Leveugle, Ahmed Al Kaf, Mounir Benabdenbi
2024 — conf
Combining Acceleration and Approximation in Dependable Edge AI: Optimization Methodology and Tools Applied to a Case Study.
DTTIS
Régis Leveugle, Mounir Benabdenbi, Ahmed Al Kaf, Luc Noizette
2021 — conf
FPU Reduced Variable Precision in Time: Application to the Jacobi Iterative Method.
ISVLSI
Noureddine Ait Said, Mounir Benabdenbi, Katell Morin-Allory
2020 — conf
FPU Bit-Width Optimization for Approximate Computing: A Non-Intrusive Approach.
DTIS
Noureddine Ait Said, Mounir Benabdenbi, Katell Morin-Allory
2019 — conf
On-Line Adjustable Precision Computing.
DTIS
Ali Skaf, Mona Ezzadeen, Mounir Benabdenbi, Laurent Fesquet
2018 J jnl
Test and Reliability in Approximate Computing.
J. Electron. Test.
Lorena Anghel, Mounir Benabdenbi, Alberto Bosio, Marcello Traiola, Elena-Ioana Vatajelu
2015 — conf
Application-independent testing of multilevel interconnect in mesh-based FPGAs.
DTIS
Saif-Ur Rehman, Mounir Benabdenbi, Lorena Anghel
2014 C conf
Cost-efficient of a cluster in a mesh SRAM-based FPGA.
IOLTS
Saif-Ur Rehman, Mounir Benabdenbi, Lorena Anghel
2014 J jnl
Fault-tolerant adaptive routing under an unconstrained set of node and link failures for many-core systems-on-chip.
Microprocess. Microsystems
Michael G. Dimopoulos, Yi Gang, Lorena Anghel, Mounir Benabdenbi, Nacer-Eddine Zergainoh, Michael Nicolaidis
2014 — conf
Impact of Cluster Size on Routability, Testability and Robustness of a Cluster in a Mesh FPGA.
ISVLSI
Saif-Ur Rehman, Adrien Blanchardon, Arwa Ben Dhia, Mounir Benabdenbi, Roselyne Chotin-Avot, Lirida A. B. Naviner, Lorena Anghel, Habib Mehrez, Emna Amouri, Zied Marrakchi
2014 J jnl
On-the-Field Test and Configuration Infrastructure for 2-D-Mesh NoCs in Shared-Memory Many-Core Architectures.
IEEE Trans. Very Large Scale Integr. Syst.
Zhen Zhang, Dimitri Refauvelet, Alain Greiner, Mounir Benabdenbi, François Pêcheux
2014 — conf
System on chip project: Integration of a Motion-JPEG video decoder.
EWME
Lorena Anghel, Mounir Benabdenbi, Frédéric Pétrot
2013 — conf
A defect-tolerant cluster in a mesh SRAM-based FPGA.
FPT
Arwa Ben Dhia, Saif-Ur Rehman, Adrien Blanchardon, Lirida A. B. Naviner, Mounir Benabdenbi, Roselyne Chotin-Avot, Emna Amouri, Habib Mehrez, Zied Marrakchi
2013 — conf
BIST for logic and local interconnect resources in a novel mesh of cluster FPGA.
DFTS
Saif-Ur Rehman, Mounir Benabdenbi, Lorena Anghel
2013 C conf
Fault-tolerant adaptive routing under permanent and temporary failures for many-core systems-on-chip.
IOLTS
Michael G. Dimopoulos, Yi Gang, Mounir Benabdenbi, Lorena Anghel, Nacer-Eddine Zergainoh, Michael Nicolaidis
2012 J jnl
CSL: Configurable Fault Tolerant Serial Links for Inter-die Communication in 3D Systems.
J. Electron. Test.
Vladimir Pasca, Lorena Anghel, Michael Nicolaidis, Mounir Benabdenbi
2012 C conf
Efficient link-level error resilience in 3D NoCs.
DDECS
Vladimir Pasca, Saif-Ur Rehman, Lorena Anghel, Mounir Benabdenbi
2012 J jnl
Kth-Aggressor Fault (KAF)-based Thru-Silicon-Via Interconnect Built-In Self-Test and Diagnosis.
J. Electron. Test.
Vladimir Pasca, Lorena Anghel, Mounir Benabdenbi
2011 — conf
Configurable Thru-Silicon-Via interconnect Built-In Self-Test and diagnosis.
LATW
Vladimir Pasca, Lorena Anghel, Mounir Benabdenbi
2011 Misc conf
Localization of damaged resources in NoC based shared-memory MP2SOC, using a Distributed Cooperative Configuration Infrastructure.
VTS
Zhen Zhang, Dimitri Refauvelet, Alain Greiner, Mounir Benabdenbi, François Pêcheux
2010 — conf
An in-memory monitoring database for self adaptive MP
DASIP
Etienne Faure, Gabriel Marchesan Almeida, Mounir Benabdenbi, Pascal Benoit, Fabien Clermidy, François Pêcheux, Gilles Sassatelli, Lionel Torres
2010 B conf
Configurable fault-tolerant link for inter-die communication in 3D on-chip networks.
ETS
Vladimir Pasca, Lorena Anghel, Claudia Rusu, Mounir Benabdenbi
2010 C conf
Configurable serial fault-tolerant link for communication in 3D integrated systems.
IOLTS
Vladimir Pasca, Lorena Anghel, Claudia Rusu, Mounir Benabdenbi
2010 C conf
Distributed online software monitoring of manycore architectures.
IOLTS
Etienne Faure, Mounir Benabdenbi, François Pêcheux
2010 — conf
Fault tolerant communication in 3D integrated systems.
DSN Workshops
Vladimir Pasca, Lorena Anghel, Mounir Benabdenbi
2010 C conf
Fully distributed initialization procedure for a 2D-Mesh NoC, including off-line BIST and partial deactivation of faulty components.
IOLTS
Zhen Zhang, Alain Greiner, Mounir Benabdenbi
2009 — conf
On-line test and monitoring of multi-processor SoCs: A software-based approach.
LATW
Mounir Benabdenbi, François Pêcheux, Etienne Faure
2007 Misc conf
At-Speed Testing of Core-Based System-on-Chip Using an Embedded Micro-Tester.
VTS
Matthieu Tuna, Mounir Benabdenbi, Alain Greiner
2006 — conf
MP-SoC Architecture for an Obstacle Detection Application in Pre-Crash Situation.
ReCoSoC
Alain Greiner, Frédéric Pétrot, M. Carrier, Mounir Benabdenbi, Roselyne Chotin-Avot, Raphaël Labayrade
2004 A conf
STEPS: Experimenting a New Software-Based Strategy for Testing SoCs Containing P1500-Compliant IP Cores.
DATE
Mounir Benabdenbi, Alain Greiner, François Pêcheux, Emmanuel Viaud, Matthieu Tuna
2002 J jnl
CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing.
J. Electron. Test.
Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki
2001 A conf
Testing TAPed cores and wrapped cores with the same test access mechanism.
DATE
Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki
2000 A conf
CAS-BUS: A Scalable and Reconfigurable Test Access Mechanism for Systems on a Chip.
DATE
Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki
2000 — conf
Solving the I/O Bandwidth Problem in System on a Chip Testing.
SBCCI
Walid Maroufi, Mounir Benabdenbi, Meryem Marzouki