Montserrat Nafría

76 papers A* 1A 3C 4Journal 39Unranked 29
YearRankTypeTitle / Venue / Authors
2025 J jnl
Reliability Assessment of Optical Physical Unclonable Functions Based on the Spatial Distribution of Catastrophic Failure Sites in MIM Structures.
IEEE Access
Marc Porti, Alvaro Solis, Alex Calatayud, Montserrat Nafría, Enrique Miranda
2025 — conf
Towards a Reliable PUF Using Organic Thin-Film Transistors.
SMACD
F. de Los Santos-Prieto, Deborah Eric, Marc Porti, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Montserrat Nafría
2023 — conf
Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability.
IRPS
Javier Martín-Martínez, Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Montserrat Nafría
2023 — conf
Strategies for parameter extraction of the time constant distribution of time-dependent variability models for nanometer-scale devices.
SMACD
Francisco V. Fernández, Elisenda Roca, Pablo Saraza-Canflanca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López
2022 — conf
A systematic approach to RTN parameter fitting based on the Maximum Current Fluctuation.
SMACD
Pablo Saraza-Canflanca, Javier Martín-Martínez, Elisenda Roca, Rafael Castro-López, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2022 C conf
Beneficial Role of Noise in Hf-based Memristors.
ISCAS
Rosana Rodríguez, Javier Martín-Martínez, Emili Salvador Aguilera, Albert Crespo-Yepes, Enrique Miranda, Montserrat Nafría, Antonio Rubio, Vasileios G. Ntinas, Georgios Ch. Sirakoulis
2022 J jnl
On the Impact of the Biasing History on the Characterization of Random Telegraph Noise.
IEEE Trans. Instrum. Meas.
Pablo Saraza-Canflanca, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2021 J jnl
Methodology for the Simulation of the Variability of MOSFETs With Polycrystalline High-k Dielectrics Using CAFM Input Data.
IEEE Access
Ana Ruiz, Carlos Couso, Natalia Seoane, Marc Porti, Antonio J. García-Loureiro, Montserrat Nafría
2021 J jnl
Power-Efficient Noise-Induced Reduction of ReRAM Cell's Temporal Variability Effects.
IEEE Trans. Circuits Syst. II Express Briefs
Vasileios G. Ntinas, Antonio Rubio, Georgios Ch. Sirakoulis, Emili Salvador Aguilera, Marta Pedro, Albert Crespo-Yepes, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría
2020 J jnl
A robust and automated methodology for the analysis of Time-Dependent Variability at transistor level.
Integr.
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2020 — conf
Experimental Monitoring of Aging in CMOS RF Linear Power Amplifiers: Correlation Between Device and Circuit Degradation.
IRPS
Rosana Rodríguez, Albert Crespo-Yepes, Javier Martín-Martínez, Montserrat Nafría, Xavier Aragonès, Diego Mateo, Enrique Barajas
2020 J jnl
Flexible Setup for the Measurement of CMOS Time-Dependent Variability With Array-Based Integrated Circuits.
IEEE Trans. Instrum. Meas.
Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Francisco V. Fernández, Montserrat Nafría
2019 — conf
A New Time Efficient Methodology for the Massive Characterization of RTN in CMOS Devices.
IRPS
G. Pedreira, Javier Martín-Martínez, Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Montserrat Nafría
2019 J jnl
A Versatile CMOS Transistor Array IC for the Statistical Characterization of Time-Zero Variability, RTN, BTI, and HCI.
IEEE J. Solid State Circuits
Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Xavier Aragonès, Enrique Barajas, Diego Mateo, Francisco V. Fernández, Montserrat Nafría
2019 C conf
Aging in CMOS RF Linear Power Amplifiers: Experimental Comparison and Modeling.
ISCAS
Xavier Aragonès, Diego Mateo, Enrique Barajas, Albert Crespo-Yepes, Rosana Rodríguez, Javier Martín-Martínez, Montserrat Nafría
2019 — conf
An IC Array for the Statistical Characterization of Time-Dependent Variability of Basic Circuit Blocks.
SMACD
Pablo Martín-Lloret, Juan Núñez, Elisenda Roca, Rafael Castro-López, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2019 — conf
Experimental Characterization of Time-Dependent Variability in Ring Oscillators.
SMACD
Juan Núñez, Elisenda Roca, Rafael Castro-López, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2019 — conf
Experimental Investigation of Memristance Enhancement.
NANOARCH
Vasileios G. Ntinas, Antonio Rubio, Georgios Ch. Sirakoulis, Rosana Rodríguez, Montserrat Nafría
2019 J jnl
Experimental Verification of Memristor-Based Material Implication NAND Operation.
IEEE Trans. Emerg. Top. Comput.
Marcos Maestro-Izquierdo, Javier Martín-Martínez, Albert Crespo-Yepes, Manel Escudero, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Antonio Rubio
2019 A conf
Generation of Lifetime-Aware Pareto-Optimal Fronts Using a Stochastic Reliability Simulator.
DATE
Antonio Toro-Frías, Pablo Saraza-Canflanca, Fábio Passos, Pablo Martín-Lloret, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2019 A conf
New method for the automated massive characterization of Bias Temperature Instability in CMOS transistors.
DATE
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca Moreno, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2019 — conf
Noise-induced Performance Enhancement of Variability-aware Memristor Networks.
ICECS
Vasileios G. Ntinas, Iosif-Angelos Fyrigos, Georgios Ch. Sirakoulis, Antonio Rubio, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría
2019 — conf
TiDeVa: A Toolbox for the Automated and Robust Analysis of Time-Dependent Variability at Transistor Level.
SMACD
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2018 — conf
A Model Parameter Extraction Methodology Including Time-Dependent Variability for Circuit Reliability Simulation.
SMACD
Javier Diaz-Fortuny, Pablo Saraza-Canflanca, Antonio Toro-Frías, Rafael Castro-López, Javier Martín-Martínez, Elisenda Roca, Rosana Rodríguez, Francisco V. Fernández, Montserrat Nafría
2018 — conf
Analysis of Body Bias and RTN-Induced Frequency Shift of Low Voltage Ring Oscillators in FDSOI Technology.
PATMOS
Enrique Barajas, Xavier Aragonès, Diego Mateo, Francesc Moll, Antonio Rubio, Javier Martín-Martínez, Rosana Rodríguez, Marc Porti, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
2018 — conf
Automated Massive RTN Characterization Using a Transistor Array Chip.
SMACD
Pablo Saraza-Canflanca, Javier Diaz-Fortuny, Antonio Toro-Frías, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2018 C conf
CMOS Characterization and Compact Modelling for Circuit Reliability Simulation.
IOLTS
Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
2018 — conf
Design Considerations of an SRAM Array for the Statistical Validation of Time-Dependent Variability Models.
SMACD
Pablo Saraza-Canflanca, D. Malagon, Fábio Passos, A. Toro, Juan Núñez, Javier Diaz-Fortuny, Rafael Castro-López, Elisenda Roca, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2018 — conf
Device variability tolerance of a RRAM-based self-organizing neuromorphic system.
IRPS
Marta Pedro, Javier Martín-Martínez, Enrique Miranda, Rosana Rodríguez, Montserrat Nafría, M. B. González, Francesca Campabadal
2018 — conf
Investigation of Conductivity Changes in Memristors under Massive Pulsed Characterization.
DCIS
Marta Pedro, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich
2018 — conf
Lifetime Calculation Using a Stochastic Reliability Simulator for Analog ICs.
SMACD
Antonio Toro-Frías, Pablo Martín-Lloret, Javier Martín-Martínez, Rafael Castro-López, Elisenda Roca, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2018 J jnl
Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI, and PV.
IEEE Trans. Circuits Syst. I Regul. Pap.
Victor M. van Santen, Javier Martín-Martínez, Hussam Amrouch, Montserrat Nafría, Jörg Henkel
2018 — conf
Weighted time lag plot defect parameter extraction and GPU-based BTI modeling for BTI variability.
IRPS
Victor M. van Santen, Javier Diaz-Fortuny, Hussam Amrouch, Javier Martín-Martínez, Rosana Rodríguez, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Jörg Henkel, Montserrat Nafría
2017 C conf
A size-adaptive time-step algorithm for accurate simulation of aging in analog ICs.
ISCAS
Pablo Martín-Lloret, Antonio Toro-Frías, Javier Martín-Martínez, Rafael Castro-López, Elisenda Roca, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2017 — conf
A transistor array chip for the statistical characterization of process variability, RTN and BTI/CHC aging.
SMACD
Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Enrique Barajas, Xavier Aragonès, Diego Mateo
2017 — conf
CASE: A reliability simulation tool for analog ICs.
SMACD
Pablo Martín-Lloret, Antonio Toro-Frías, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría
2017 — conf
Including a stochastic model of aging in a reliability simulation flow.
SMACD
Antonio Toro-Frías, Pablo Martín-Lloret, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría
2017 J jnl
Protective nanometer films for reliable Cu-Cu connections.
Microelectron. Reliab.
Tobias Berthold, Guenther Benstetter, Werner Frammelsberger, Manuel Bogner, Rosana Rodríguez, Montserrat Nafría
2017 — conf
Statistical characterization and modeling of random telegraph noise effects in 65nm SRAMs cells.
SMACD
Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Gabriel Torrens, Sebastià A. Bota, Jaume Segura, Francesc Moll, Antonio Rubio
2017 — conf
TARS: A toolbox for statistical reliability modeling of CMOS devices.
SMACD
Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández
2016 A* conf
Designing guardbands for instantaneous aging effects.
DAC
Victor M. van Santen, Hussam Amrouch, Javier Martín-Martínez, Montserrat Nafría, Jörg Henkel
2016 J jnl
Reliability simulation for analog ICs: Goals, solutions, and challenges.
Integr.
Antonio Toro-Frías, Pablo Martín-Lloret, Javier Martín-Martínez, Rafael Castro-López, Elisenda Roca, Rosana Rodríguez, Montserrat Nafría, Francisco V. Fernández
2015 — conf
Connecting the physical and application level towards grasping aging effects.
IRPS
Hussam Amrouch, Javier Martín-Martínez, Victor M. van Santen, Miquel Moras, Rosana Rodríguez, Montserrat Nafría, Jörg Henkel
2015 — conf
Threading dislocations in III-V semiconductors: Analysis of electrical conduction.
IRPS
Violaine Iglesias, Marc Porti, Carlos Couso, Q. Wu, S. Claramunt, Montserrat Nafría, Enrique Miranda, Neus Domingo, Gennadi Bersuker, Aaron Cordes
2015 — conf
Threshold voltage and on-current Variability related to interface traps spatial distribution.
ESSDERC
V. Velayudhan, Javier Martín-Martínez, Marc Porti, Carlos Couso, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Carlos Marquez, Francisco Gámiz
2014 J jnl
A shapeshifting evolvable hardware mechanism based on reconfigurable memFETs crossbar architecture.
Microelectron. Reliab.
Javier Martín-Martínez, Carmen G. Almudéver, Albert Crespo-Yepes, Rosana Rodríguez, Montserrat Nafría, Antonio Rubio
2013 J jnl
Influence of the interface trap location on the performance and variability of ultra-scaled MOSFETs.
Microelectron. Reliab.
V. Velayudhan, Francisco Gámiz, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich
2013 J jnl
Nanoscale and device level electrical behavior of annealed ALD Hf-based gate oxide stacks grown with different precursors.
Microelectron. Reliab.
Albin Bayerl, Mario Lanza, Lidia Aguilera, Marc Porti, Montserrat Nafría, Xavier Aymerich, Stefan De Gendt
2013 J jnl
Resistive switching like-behavior in MOSFETs with ultra-thin HfSiON dielectric gate stack: pMOS and nMOS comparison and reliability implications.
Microelectron. Reliab.
Albert Crespo-Yepes, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich
2012 J jnl
Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs.
Microelectron. Reliab.
Nuria Ayala, Javier Martín-Martínez, Rosana Rodríguez, M. B. González, Montserrat Nafría, Xavier Aymerich, Eddy Simoen
2012 J jnl
Nanoscale observations of resistive switching high and low conductivity states on TiN/HfO
Microelectron. Reliab.
Violaine Iglesias, Mario Lanza, Albin Bayerl, Marc Porti, Montserrat Nafría, Xavier Aymerich, Lifeng Liu, Jinfeng Kang, Gennadi Bersuker, Kai Zhang, Ziyong Shen
2012 — conf
Shape-shifting digital hardware concept: Towards a new adaptive computing system.
AHS
Carmen G. Almudéver, Antonio Rubio, Javier Martín-Martínez, Albert Crespo-Yepes, Rosana Rodríguez, Montserrat Nafría
2012 — conf
Unified characterization of RTN and BTI for circuit performance and variability simulation.
ESSDERC
Nuria Ayala, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich
2010 J jnl
SPICE modelling of hot-carrier degradation in Si
Microelectron. Reliab.
Javier Martín-Martínez, Esteve Amat, M. B. González, P. Verheyen, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Eddy Simoen
2010 J jnl
UHV CAFM characterization of high-k dielectrics: Effect of the technique resolution on the pre- and post-breakdown electrical measurements.
Microelectron. Reliab.
Mario Lanza, Marc Porti, Montserrat Nafría, Xavier Aymerich, E. Whittaker, B. Hamilton
2009 J jnl
Reversible dielectric breakdown in ultrathin Hf based high-k stacks under current-limited stresses.
Microelectron. Reliab.
Albert Crespo-Yepes, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich
2009 J jnl
Trapped charge and stress induced leakage current (SILC) in tunnel SiO
Microelectron. Reliab.
Mario Lanza, Marc Porti, Montserrat Nafría, Xavier Aymerich, G. Ghidini, A. Sebastiani
2008 A conf
Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies.
DATE
Georges G. E. Gielen, Pieter De Wit, Elie Maricau, Johan Loeckx, Javier Martín-Martínez, Ben Kaczer, Guido Groeseneken, Rosana Rodríguez, Montserrat Nafría
2008 J jnl
Nanometer-scale leakage measurements in high vacuum on de-processed high-k capacitors.
Microelectron. Reliab.
W. Polspoel, Wilfried Vandervorst, Lidia Aguilera, Marc Porti, Montserrat Nafría, Xavier Aymerich
2007 J jnl
Effect of oxide breakdown on RS latches.
Microelectron. Reliab.
Raul Fernández, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich
2007 J jnl
Influence of the SiO
Microelectron. Reliab.
Esteve Amat, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, James H. Stathis
2007 J jnl
Influence of the manufacturing process on the electrical properties of thin (k stacks observed with CAFM.
Microelectron. Reliab.
Mario Lanza, Marc Porti, Montserrat Nafría, Guenther Benstetter, Werner Frammelsberger, Heiko Ranzinger, E. Lodermeier, G. Jaschke
2007 J jnl
Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs.
Microelectron. Reliab.
Javier Martín-Martínez, Simone Gerardin, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Andrea Cester, Alessandro Paccagnella, G. Ghidini
2007 J jnl
Worn-out oxide MOSFET characteristics: Role of gate current and device parameters on a current mirror.
Microelectron. Reliab.
Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, James H. Stathis
2006 J jnl
FinFET and MOSFET preliminary comparison of gate oxide reliability.
Microelectron. Reliab.
Raul Fernández, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich, Ben Kaczer, Guido Groeseneken
2005 J jnl
Breakdown spots of ultra-thin (EOT<1.5nm) HfO
Microelectron. Reliab.
X. Blasco, Montserrat Nafría, Xavier Aymerich, J. Pétry, Wilfried Vandervorst
2005 J jnl
Influence of oxide breakdown position and device aspect ratio on MOSFET's output characteristics.
Microelectron. Reliab.
Raul Fernández, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich
2005 J jnl
Pre- and post-BD electrical conduction of stressed HfO
Microelectron. Reliab.
Lidia Aguilera, Marc Porti, Montserrat Nafría, Xavier Aymerich
2004 J jnl
A new approach to the modeling of oxide breakdown on CMOS circuits.
Microelectron. Reliab.
Raul Fernández, Rosana Rodríguez, Montserrat Nafría, Xavier Aymerich
2004 J jnl
Standard and C-AFM tests to study the post-BD gate oxide conduction of MOS devices after current limited stresses.
Microelectron. Reliab.
Marc Porti, S. Meli, Montserrat Nafría, Xavier Aymerich
2003 J jnl
Oxide conductivity increase during the progressive-breakdown of SiO2 gate oxides observed with C-AFM.
Microelectron. Reliab.
Marc Porti, Montserrat Nafría, Xavier Aymerich
2003 J jnl
Pre-breakdown noise in electrically stressed thin SiO
Microelectron. Reliab.
Marc Porti, S. Meli, Montserrat Nafría, Xavier Aymerich
2002 J jnl
Conduction and Breakdown Behaviour of Atomic Force Microscopy Grown SiO
Microelectron. Reliab.
X. Blasco, Montserrat Nafría, Xavier Aymerich
2001 J jnl
Characterising the surface roughness of AFM grown SiO
Microelectron. Reliab.
Daniel Hill, X. Blasco, Marc Porti, Montserrat Nafría, Xavier Aymerich
2001 J jnl
Influence of a low field with opposite polarity to the stress on the degradation of 4.5 nm thick SiO
Microelectron. Reliab.
Rosana Rodríguez, Marc Porti, Montserrat Nafría, Xavier Aymerich
2001 J jnl
Local current fluctuations before and after breakdown of thin SiO
Microelectron. Reliab.
Marc Porti, X. Blasco, Montserrat Nafría, Xavier Aymerich, Alexander Olbrich, Bernd Ebersberger