| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Dynamic Privacy-preserving Identity Generation from Fingerprint Sensor Data for Secure Applications.
ACM Trans. Priv. Secur.
|
| 2026 | J | jnl |
CoRR
|
| 2025 | J | jnl |
Comput. Electr. Eng.
|
| 2025 | J | jnl |
Clinically Calibrated Machine Learning Benchmarks for Large-Scale Multi-Disorder EEG Classification.
CoRR
|
| 2025 | J | jnl |
Biomed. Signal Process. Control.
|
| 2025 | J | jnl |
Comput. Electr. Eng.
|
| 2025 | J | jnl |
Expert Syst. Appl.
|
| 2025 | J | jnl |
Comput. Secur.
|
| 2025 | J | jnl |
CoRR
|
| 2024 | — | conf |
ICCCNT
|
| 2024 | — | conf |
ICCCNT
|
| 2024 | J | jnl |
Secur. Priv.
|
| 2024 | J | jnl |
SN Comput. Sci.
|
| 2024 | — | conf |
ICCCNT
|
| 2024 | — | conf |
BMVC Workshops
|
| 2023 | — | conf |
PReMI
|
| 2023 | — | conf |
CVIP (1)
|
| 2023 | — | conf |
EMBC
|
| 2023 | — | conf |
ICVGIP
|
| 2023 | — | conf |
OCIT
|
| 2023 | J | jnl |
Biomed. Signal Process. Control.
|
| 2023 | J | jnl |
J. Inf. Secur. Appl.
|
| 2023 | — | conf |
CVIP (1)
|
| 2023 | J | jnl |
IEEE Consumer Electron. Mag.
|
| 2023 | — | conf |
CVIP (1)
|
| 2023 | — | conf |
ICVGIP
|
| 2022 | J | jnl |
Comput. Electr. Eng.
|
| 2022 | J | jnl |
J. Reliab. Intell. Environ.
|
| 2022 | J | jnl |
Inf. Sci.
|
| 2021 | J | jnl |
Comput. Electr. Eng.
|
| 2021 | J | jnl |
Multim. Tools Appl.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
Int. J. Digit. Libr.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
CoRR
|
| 2021 | J | jnl |
Expert Syst. Appl.
|
| 2020 | — | conf |
ICCCNT
|
| 2020 | J | jnl |
Int. J. Inf. Manag.
|
| 2019 | Misc | conf |
ICASSP
|
| 2019 | C | conf |
TENCON
|
| 2019 | C | conf |
TENCON
|
| 2019 | — | conf |
EMBC
|
| 2019 | J | jnl |
Int. J. Inf. Manag.
|
| 2019 | J | jnl |
Cogn. Technol. Work.
|
| 2019 | J | jnl |
Expert Syst. Appl.
|
| 2019 | — | conf |
EMBC
|
| 2018 | J | jnl |
Comput. Networks
|
| 2018 | J | jnl |
Multim. Tools Appl.
|
| 2018 | — | conf |
IEEE CLOUD
|
| 2018 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IET Image Process.
|
| 2018 | — | conf |
HCI (6)
|
| 2017 | — | conf |
IHCI
|
| 2017 | — | conf |
EMBC
|
| 2017 | — | conf |
IHCI
|
| 2017 | C | conf |
SIN
|
| 2015 | J | jnl |
J. Syst. Softw.
|
| 2015 | J | jnl |
Int. J. Commun. Networks Distributed Syst.
|
| 2014 | J | jnl |
Adv. Softw. Eng.
|
| 2012 | — | conf |
IHCI
|
| 2011 | — | conf |
ACC (2)
|
| 2010 | — | conf |
AST@ICSE
|
| 2009 | J | jnl |
Inf. Softw. Technol.
|
| 2009 | J | jnl |
Softw. Test. Verification Reliab.
|
| 2008 | — | conf |
ISEC
|
| 2008 | J | jnl |
Int. J. Inf. Commun. Technol.
|
| 2007 | Misc | conf |
VLSI Design
|
| 2007 | — | conf |
ICIT
|
| 2007 | J | jnl |
ACM SIGPLAN Notices
|
| 2007 | — | conf |
ATS
|