| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2024 | J | jnl |
IEEE Trans. Computers
|
| 2024 | J | jnl |
J. Electron. Test.
|
| 2023 | — | conf |
ICM
|
| 2023 | C | conf |
VLSI-SoC
|
| 2023 | J | jnl |
Des. Autom. Embed. Syst.
|
| 2023 | J | jnl |
ACM Trans. Design Autom. Electr. Syst.
|
| 2022 | J | jnl |
IEEE Access
|
| 2022 | — | conf |
ICM
|
| 2022 | — | conf |
An Evaluation Method for Embedded Software Dependability Using QEMU-Based Fault Injection Framework.
ICSRS
|
| 2022 | — | conf |
ICM
|
| 2020 | — | conf |
DTIS
|
| 2020 | — | conf |
DTIS
|
| 2020 | — | conf |
DTIS
|
| 2020 | — | conf |
ICM
|
| 2019 | Misc | conf |
VTS
|
| 2019 | J | jnl |
J. Circuits Syst. Comput.
|
| 2019 | — | conf |
DTIS
|
| 2019 | J | jnl |
J. Circuits Syst. Comput.
|
| 2018 | — | conf |
ICM
|
| 2018 | C | conf |
ISCAS
|
| 2017 | — | conf |
PACRIM
|
| 2017 | C | conf |
FDL
|
| 2017 | — | conf |
CCECE
|
| 2016 | A | conf |
DATE
|
| 2016 | — | conf |
HPCS
|
| 2015 | — | conf |
IDT
|
| 2015 | — | conf |
ICECS
|
| 2015 | — | conf |
PACRIM
|
| 2015 | — | conf |
IDT
|
| 2014 | — | conf |
MWSCAS
|
| 2014 | — | conf |
IDT
|
| 2014 | — | conf |
MTV
|
| 2013 | — | conf |
MTV
|
| 2011 | C | conf |
AICCSA
|
| 2011 | A | conf |
DATE
|
| 2011 | — | conf |
MTV
|
| 2010 | — | conf |
IDT
|
| 2009 | — | conf |
MTV
|
| 2008 | C | conf |
AICCSA
|
| 2007 | A | conf |
DATE
|
| 2006 | — | conf |
CCECE
|
| 2005 | — | conf |
IWSOC
|
| 2005 | — | conf |
CHARME
|