| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
J. Syst. Archit.
|
| 2026 | J | jnl |
IEEE Access
|
| 2026 | J | jnl |
J. Syst. Softw.
|
| 2025 | J | jnl |
Concurr. Comput. Pract. Exp.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Access
|
| 2025 | J | jnl |
CoRR
|
| 2025 | Misc | conf |
CSICC
|
| 2025 | J | jnl |
CoRR
|
| 2024 | J | jnl |
CoRR
|
| 2023 | Misc | conf |
CSICC
|
| 2022 | C | conf |
DSD
|
| 2022 | J | jnl |
J. Supercomput.
|
| 2021 | J | jnl |
IEEE Trans. Emerg. Top. Comput.
|
| 2021 | J | jnl |
Microelectron. J.
|
| 2021 | Misc | conf |
CSICC
|
| 2021 | J | jnl |
IEEE Access
|
| 2021 | J | jnl |
Int. J. Embed. Syst.
|
| 2021 | J | jnl |
CoRR
|
| 2020 | J | jnl |
Int. J. Embed. Syst.
|
| 2020 | J | jnl |
Integr.
|
| 2020 | A | conf |
ICCAD
|
| 2020 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2020 | J | jnl |
IEEE Trans. Circuits Syst.
|
| 2019 | J | jnl |
IET Circuits Devices Syst.
|
| 2019 | J | jnl |
Comput. Electr. Eng.
|
| 2019 | J | jnl |
IEEE Access
|
| 2018 | J | jnl |
IEEE Des. Test
|
| 2018 | J | jnl |
J. Supercomput.
|
| 2017 | J | jnl |
IEEE Trans. Reliab.
|
| 2017 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2017 | J | jnl |
Microelectron. J.
|
| 2016 | J | jnl |
J. Electron. Test.
|
| 2015 | J | jnl |
Microelectron. Reliab.
|
| 2015 | C | conf |
DSD
|
| 2015 | J | jnl |
IET Comput. Digit. Tech.
|
| 2014 | C | conf |
DSD
|
| 2013 | J | jnl |
ACM J. Emerg. Technol. Comput. Syst.
|
| 2013 | J | jnl |
IEEE Trans. Very Large Scale Integr. Syst.
|
| 2011 | — | conf |
DFT
|
| 2011 | J | jnl |
Des. Autom. Embed. Syst.
|
| 2011 | — | conf |
ISVLSI
|
| 2011 | — | conf |
ISQED
|
| 2010 | — | conf |
ISVLSI
|
| 2010 | J | jnl |
Microelectron. J.
|
| 2010 | — | conf |
PATMOS
|
| 2009 | — | conf |
PATMOS
|
| 2009 | — | conf |
ISQED
|