Mohammad Tehranipoor

156 papers A* 7A 21B 2C 4Misc 21Journal 52Unranked 41
YearRankTypeTitle / Venue / Authors
2015 J jnl
Detecting Hardware Trojans using On-chip Sensors in an ASIC Design.
J. Electron. Test.
Shane Kelly, Xuehui Zhang, Mohammad Tehranipoor, Andrew Ferraiuolo
2015 — conf
LBIST pattern reduction by learning ATPG test cube properties.
ISQED
Gustavo K. Contreras, Yang Zhao, Nisar Ahmed, LeRoy Winemberg, Mohammad Tehranipoor
2014 J jnl
A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment.
J. Electron. Test.
Ujjwal Guin, Daniel DiMase, Mohammad Tehranipoor
2014 J jnl
A Novel Built-In Self-Authentication Technique to Prevent Inserting Hardware Trojans.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Kan Xiao, Domenic Forte, Mohammad Tehranipoor
2014 A conf
ARO-PUF: An aging-resistant ring oscillator PUF design.
DATE
Md. Tauhidur Rahman, Domenic Forte, Jim Fahrny, Mohammad Tehranipoor
2014 — conf
Advanced Analysis of Cell Stability for Reliable SRAM PUFs.
ATS
Alison Hosey, Md. Tauhidur Rahman, Kan Xiao, Domenic Forte, Mohammad Tehranipoor
2014 — conf
Bit selection algorithm suitable for high-volume production of SRAM-PUF.
HOST
Kan Xiao, Md. Tauhidur Rahman, Domenic Forte, Yu Huang, Mei Su, Mohammad Tehranipoor
2014 — conf
CSST: An Efficient Secure Split-Test for Preventing IC Piracy.
NATW
Md. Tauhidur Rahman, Domenic Forte, Quihang Shi, Gustavo K. Contreras, Mohammad Tehranipoor
2014 — ch.
Circuit Path Grading Considering Layout, Process Variations, and Cross Talk.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor
2014 J jnl
Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain.
Proc. IEEE
Ujjwal Guin, Ke Huang, Daniel DiMase, John M. Carulli, Mohammad Tehranipoor, Yiorgos Makris
2014 J jnl
Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead.
J. Electron. Test.
Ujjwal Guin, Daniel DiMase, Mohammad Tehranipoor
2014 J jnl
Critical-reliability path identification and delay analysis.
ACM J. Emerg. Technol. Comput. Syst.
Jifeng Chen, Shuo Wang, Mohammad Tehranipoor
2014 J jnl
Design of On-Chip Lightweight Sensors for Effective Detection of Recycled ICs.
IEEE Trans. Very Large Scale Integr. Syst.
Xuehui Zhang, Mohammad Tehranipoor
2014 — ch.
Faster-than-at-Speed Test for Screening Small-Delay Defects.
Testing for Small-Delay Defects in Nanoscale CMOS Integrated Circuits
Nisar Ahmed, Mohammad Tehranipoor
2014 J jnl
Guest Editorial.
IET Comput. Digit. Tech.
Ilia Polian, Mohammad Tehranipoor
2014 Misc conf
Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests.
VTS
Jifeng Chen, LeRoy Winemberg, Mohammad Tehranipoor
2014 J jnl
Light-Weight On-Chip Structure for Measuring Timing Uncertainty Induced by Noise in Integrated Circuits.
IEEE Trans. Very Large Scale Integr. Syst.
Shuo Wang, Mohammad Tehranipoor
2014 A* conf
Low-cost On-Chip Structures for Combating Die and IC Recycling.
DAC
Ujjwal Guin, Xuehui Zhang, Domenic Forte, Mohammad Tehranipoor
2014 J jnl
On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST.
IEICE Trans. Inf. Syst.
Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Kohei Miyase, Stefan Holst, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang
2014 — conf
On-chip sensor selection for effective speed-binning.
MWSCAS
Qihang Shi, Mohammad Tehranipoor, Xiaoxiao Wang, LeRoy Winemberg
2014 — conf
SAM: A comprehensive mechanism for accessing embedded sensors in modern SoCs.
DFT
Miao Tony He, Mohammad Tehranipoor
2014 — conf
T1A: Opportunities and challenges for secure hardware and verifying trust in integrated circuits.
SoCC
Mohammad Tehranipoor, Charles Knapp
2014 A* conf
TI-TRNG: Technology Independent True Random Number Generator.
DAC
Md. Tauhidur Rahman, Kan Xiao, Domenic Forte, Xuhei Zhang, Zhijie Jerry Shi, Mohammad Tehranipoor
2014 Misc conf
Tutorial T4: All You Need to Know about Hardware Trojans and Counterfeit ICs.
VLSID
Mohammad Tehranipoor, Domenic Forte
2013 J jnl
A Clock Sweeping Technique for Detecting Hardware Trojans Impacting Circuits Delay.
IEEE Des. Test
Kan Xiao, Xuehui Zhang, Mohammad Tehranipoor
2013 J jnl
A Sensor-Assisted Self-Authentication Framework for Hardware Trojan Detection.
IEEE Des. Test
Azadeh Davoodi, Min Li, Mohammad Tehranipoor
2013 — conf
A novel flow for reducing clock skew considering NBTI effect and process variations.
ISQED
Jifeng Chen, Mohammad Tehranipoor
2013 Misc conf
A study on the effectiveness of Trojan detection techniques using a red team blue team approach.
VTS
Xuehui Zhang, Kan Xiao, Mohammad Tehranipoor, Jeyavijayan Rajendran, Ramesh Karri
2013 — conf
Analyzing circuit vulnerability to hardware Trojan insertion at the behavioral level.
DFTS
Hassan Salmani, Mohammad Tehranipoor
2013 — conf
Anti-counterfeit Techniques: From Design to Resign.
MTV
Ujjwal Guin, Domenic Forte, Mohammad Tehranipoor
2013 — conf
BISA: Built-in self-authentication for preventing hardware Trojan insertion.
HOST
Kan Xiao, Mohammad Tehranipoor
2013 — conf
Critical Paths Selection and Test Cost Reduction Considering Process Variations.
Asian Test Symposium
Jifeng Chen, Mohammad Tehranipoor
2013 J jnl
Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects.
IEEE Trans. Very Large Scale Integr. Syst.
Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor
2013 J jnl
Detection of trojans using a combined ring oscillator network and off-chip transient power analysis.
ACM J. Emerg. Technol. Comput. Syst.
Xuehui Zhang, Andrew Ferraiuolo, Mohammad Tehranipoor
2013 J jnl
Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults.
J. Electron. Test.
Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor
2013 C conf
Functional Fmax test-time reduction using novel DFTs for circuit initialization.
ICCD
Ujjwal Guin, Tapan J. Chakraborty, Mohammad Tehranipoor
2013 J jnl
Generation of Effective 1-Detect TDF Patterns for Detecting Small-Delay Defects.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Fang Bao, Ke Peng, Mohammad Tehranipoor, Krishnendu Chakrabarty
2013 — conf
On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST.
Asian Test Symposium
Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang
2013 C conf
On design vulnerability analysis and trust benchmarks development.
ICCD
Hassan Salmani, Mohammad Tehranipoor, Ramesh Karri
2013 J jnl
Power-safe application of tdf patterns to flip-chip designs during wafer test.
ACM Trans. Design Autom. Electr. Syst.
Wei Zhao, Junxia Ma, Mohammad Tehranipoor, Sreejit Chakravarty
2013 J jnl
Protection Against Hardware Trojan Attacks: Towards a Comprehensive Solution.
IEEE Des. Test
Swarup Bhunia, Miron Abramovici, Dakshi Agrawal, Paul Bradley, Michael S. Hsiao, Jim Plusquellic, Mohammad Tehranipoor
2013 — conf
Secure Split-Test for preventing IC piracy by untrusted foundry and assembly.
DFTS
Gustavo K. Contreras, Md. Tauhidur Rahman, Mohammad Tehranipoor
2013 Misc conf
Special session 12A: Hot topic counterfeit IC identification: How can test help?
VTS
Ilia Polian, Mohammad Tehranipoor
2013 — conf
Worst-Case Critical-Path Delay Analysis Considering Power-Supply Noise.
Asian Test Symposium
Fang Bao, Mohammad Tehranipoor, Harry H. Chen
2012 J jnl
A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk.
J. Electron. Test.
Junxia Ma, Mohammad Tehranipoor, Patrick Girard
2012 J jnl
A Novel Technique for Improving Hardware Trojan Detection and Reducing Trojan Activation Time.
IEEE Trans. Very Large Scale Integr. Syst.
Hassan Salmani, Mohammad Tehranipoor, Jim Plusquellic
2012 Misc conf
A novel method for fast identification of peak current during test.
VTS
Wei Zhao, Sreejit Chakravarty, Junxia Ma, Narendra Devta-Prasanna, Fan Yang, Mohammad Tehranipoor
2012 A conf
A sensor-assisted self-authentication framework for hardware trojan detection.
DATE
Min Li, Azadeh Davoodi, Mohammad Tehranipoor
2012 — conf
A zero-overhead IC identification technique using clock sweeping and path delay analysis.
ACM Great Lakes Symposium on VLSI
Nicholas Tuzzio, Kan Xiao, Xuehui Zhang, Mohammad Tehranipoor
2012 J jnl
Design and Analysis of a Delay Sensor Applicable to Process/Environmental Variations and Aging Measurements.
IEEE Trans. Very Large Scale Integr. Syst.
Xiaoxiao Wang, Mohammad Tehranipoor, Saji George, Dat Tran, LeRoy Winemberg
2012 — conf
Efficient selection and analysis of critical-reliability paths and gates.
ACM Great Lakes Symposium on VLSI
Jifeng Chen, Shuo Wang, Mohammad Tehranipoor
2012 J jnl
Ensuring Power-Safe Application of Test Patterns Using an Effective Gating Approach Considering Current Limits.
J. Low Power Electron.
Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty
2012 A conf
Experimental analysis of a ring oscillator network for hardware Trojan detection in a 90nm ASIC.
ICCAD
Andrew Ferraiuolo, Xuehui Zhang, Mohammad Tehranipoor
2012 A* conf
Identification of recovered ICs using fingerprints from a light-weight on-chip sensor.
DAC
Xuehui Zhang, Nicholas Tuzzio, Mohammad Tehranipoor
2012 J jnl
Layout-Aware Pattern Evaluation and Analysis for Power-Safe Application of Transition Delay Fault Patterns.
J. Low Power Electron.
Hassan Salmani, Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty, Patrick Girard, Xiaoqing Wen
2012 J jnl
Layout-Aware Switching Activity Localization to Enhance Hardware Trojan Detection.
IEEE Trans. Inf. Forensics Secur.
Hassan Salmani, Mohammad Tehranipoor
2012 A conf
On pinpoint capture power management in at-speed scan test generation.
ITC
Xiaoqing Wen, Y. Nishida, Kohei Miyase, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang
2012 — conf
Path-delay fingerprinting for identification of recovered ICs.
DFT
Xuehui Zhang, Kan Xiao, Mohammad Tehranipoor
2012 — conf
PowerMAX: Fast Power Analysis during Test.
Asian Test Symposium
Wei Zhao, Mohammad Tehranipoor
2012 A conf
Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements.
ITC
Xiaoxiao Wang, Dat Tran, Saji George, LeRoy Winemberg, Nisar Ahmed, Steve Palosh, Allan Dobin, Mohammad Tehranipoor
2012 A conf
Representative Critical Reliability Paths for low-cost and accurate on-chip aging evaluation.
ICCAD
Shuo Wang, Jifeng Chen, Mohammad Tehranipoor
2012 — conf
TSUNAMI: a light-weight on-chip structure for measuring timing uncertainty induced by noise during functional and test operations.
ACM Great Lakes Symposium on VLSI
Shuo Wang, Mohammad Tehranipoor
2011 J jnl
A Metric to Target Small-Delay Defects in Industrial Circuits.
IEEE Des. Test Comput.
Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty
2011 J jnl
An Experimental Analysis of Power and Delay Signal-to-Noise Requirements for Detecting Trojans and Methods for Achieving the Required Detection Sensitivities.
IEEE Trans. Inf. Forensics Secur.
Charles Lamech, Reza M. Rad, Mohammad Tehranipoor, Jim Plusquellic
2011 Misc conf
Case Study: Efficient SDD test generation for very large integrated circuits.
VTS
Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor
2011 — conf
Case study: Detecting hardware Trojans in third-party digital IP cores.
HOST
Xuehui Zhang, Mohammad Tehranipoor
2011 B conf
Critical Fault-Based Pattern Generation for Screening SDDs.
ETS
Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor
2011 A* conf
In-field aging measurement and calibration for power-performance optimization.
DAC
Shuo Wang, Mohammad Tehranipoor, LeRoy Winemberg
2011 J jnl
Layout-Aware Critical Path Delay Test Under Maximum Power Supply Noise Effects.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Junxia Ma, Mohammad Tehranipoor
2011 Misc conf
Low-cost diagnostic pattern generation and evaluation procedures for noise-related failures.
VTS
Junxia Ma, Nisar Ahmed, Mohammad Tehranipoor
2011 — conf
On Generation of 1-Detect TDF Pattern Set with Significantly Increased SDD Coverage.
Asian Test Symposium
Fang Bao, Ke Peng, Krishnendu Chakrabarty, Mohammad Tehranipoor
2011 — conf
Peak power identification on power bumps during test application.
IGCC
Wei Zhao, Mohammad Tehranipoor
2011 Misc conf
Power-aware test generation with guaranteed launch safety for at-speed scan testing.
VTS
Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor
2011 Misc conf
Power-safe test application using an effective gating approach considering current limits.
VTS
Wei Zhao, Mohammad Tehranipoor, Sreejit Chakravarty
2011 A conf
RON: An on-chip ring oscillator network for hardware Trojan detection.
DATE
Xuehui Zhang, Mohammad Tehranipoor
2011 C conf
Red team: Design of intelligent hardware trojans with known defense schemes.
ICCD
Xuehui Zhang, Nicholas Tuzzio, Mohammad Tehranipoor
2011 Misc conf
Special session 5B: Panel How much toggle activity should we be testing with?
VTS
Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg
2011 Misc conf
Special session: Hot topic: Smart silicon.
VTS
LeRoy Winemberg, Mohammad Tehranipoor
2011 — book
Test and Diagnosis for Small-Delay Defects.
Mohammad Tehranipoor, Ke Peng, Krishnendu Chakrabarty
2011 J jnl
Trustworthy Hardware: Trojan Detection and Design-for-Trust Challenges.
Computer
Mohammad Tehranipoor, Hassan Salmani, Xuehui Zhang, Michel Wang, Ramesh Karri, Jeyavijayan Rajendran, Kurt Rosenfeld
2010 J jnl
A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for Launch-Off-Shift and Launch-Off-Capture Schemes.
J. Low Power Electron.
Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Xiaoqing Wen, Nisar Ahmed
2010 — conf
A Noise-Aware Hybrid Method for SDD Pattern Grading and Selection.
Asian Test Symposium
Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor
2010 J jnl
A Novel IR-Drop Tolerant Transition Delay Fault Test Pattern Generation Procedure.
J. Low Power Electron.
Nisar Ahmed, Mohammad Tehranipoor
2010 J jnl
A Sensitivity Analysis of Power Signal Methods for Detecting Hardware Trojans Under Real Process and Environmental Conditions.
IEEE Trans. Very Large Scale Integr. Syst.
Reza M. Rad, James F. Plusquellic, Mohammad Tehranipoor
2010 J jnl
A Survey of Hardware Trojan Taxonomy and Detection.
IEEE Des. Test Comput.
Mohammad Tehranipoor, Farinaz Koushanfar
2010 — conf
A layout-aware approach for improving localized switching to detect hardware Trojans in integrated circuits.
WIFS
Hassan Salmani, Mohammad Tehranipoor, Jim Plusquellic
2010 Misc conf
A novel hybrid method for SDD pattern grading and selection.
VTS
Ke Peng, Jason Thibodeau, Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor
2010 C conf
Analysis of power consumption and transition fault coverage for LOS and LOC testing schemes.
DDECS
Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Junxia Ma, Wei Zhao, Mohammad Tehranipoor, Xiaoqing Wen
2010 — conf
Circuit Topology-Based Test Pattern Generation for Small-Delay Defects.
Asian Test Symposium
Sandeep Kumar Goel, Krishnendu Chakrabarty, Mahmut Yilmaz, Ke Peng, Mohammad Tehranipoor
2010 — conf
Emulating and diagnosing IR-drop by using dynamic SDF.
ASP-DAC
Ke Peng, Yu Huang, Ruifeng Guo, Wu-Tung Cheng, Mohammad Tehranipoor
2010 B conf
Full-circuit SPICE simulation based validation of dynamic delay estimation.
ETS
Ke Peng, Yu Huang, Pinki Mallick, Wu-Tung Cheng, Mohammad Tehranipoor
2010 J jnl
Guest Editors' Introduction: Confronting the Hardware Trustworthiness Problem.
IEEE Des. Test Comput.
Mohammad Tehranipoor, Farinaz Koushanfar
2010 — ch.
Hardware Trojan Horses.
Towards Hardware-Intrinsic Security
Mohammad Tehranipoor, Berk Sunar
2010 J jnl
High Launch Switching Activity Reduction in At-Speed Scan Testing Using CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme.
IEICE Trans. Inf. Syst.
Kohei Miyase, Xiaoqing Wen, Hiroshi Furukawa, Yuta Yamato, Seiji Kajihara, Patrick Girard, Laung-Terng Wang, Mohammad Tehranipoor
2010 A conf
High-quality pattern selection for screening small-delay defects considering process variations and crosstalk.
DATE
Ke Peng, Mahmut Yilmaz, Mohammad Tehranipoor, Krishnendu Chakrabarty
2010 — conf
Identification of IR-drop hot-spots in defective power distribution network using TDF ATPG.
IDT
Junxia Ma, Mohammad Tehranipoor, Ozgur Sinanoglu, Sobeeh Almukhaizim
2010 A conf
Is test power reduction through X-filling good enough?
ITC
Fangmei Wu, Luigi Dilillo, Alberto Bosio, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Mohammad Tehranipoor, Kohei Miyase, Xiaoqing Wen, Nisar Ahmed
2010 A conf
Novel Physical Unclonable Function with process and environmental variations.
DATE
Xiaoxiao Wang, Mohammad Tehranipoor
2010 — conf
Pattern grading for testing critical paths considering power supply noise and crosstalk using a layout-aware quality metric.
ACM Great Lakes Symposium on VLSI
Junxia Ma, Jeremy Lee, Mohammad Tehranipoor, Nisar Ahmed, Patrick Girard
2010 J jnl
Power Supply Noise: A Survey on Effects and Research.
IEEE Des. Test Comput.
Mohammad Tehranipoor, Kenneth M. Butler
2010 — conf
Power-Safe Application of Transition Delay Fault Patterns Considering Current Limit during Wafer Test.
Asian Test Symposium
Wei Zhao, Junxia Ma, Mohammad Tehranipoor, Sreejit Chakravarty
2010 J jnl
Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor
2010 J jnl
Trustworthy Hardware: Identifying and Classifying Hardware Trojans.
Computer
Ramesh Karri, Jeyavijayan Rajendran, Kurt Rosenfeld, Mohammad Tehranipoor
2009 — ed.
24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2009, Chicago, Illinois, USA, October 7-9, 2009
DFT
Dimitris Gizopoulos, Susumu Horiguchi, Spyros Tragoudas, Mohammad Tehranipoor
2009 J jnl
A Novel Faster-Than-at-Speed Transition-Delay Test Method Considering IR-Drop Effects.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Nisar Ahmed, Mohammad Tehranipoor
2009 A conf
A novel architecture for on-chip path delay measurement.
ITC
Xiaoxiao Wang, Mohammad Tehranipoor, Ramyanshu Datta
2009 — ed.
IEEE International Workshop on Hardware-Oriented Security and Trust, HOST 2009, San Francisco, CA, USA, July 27, 2009. Proceedings
HOST
Mohammad Tehranipoor, Jim Plusquellic
2009 Misc conf
Layout-Aware Pattern Generation for Maximizing Supply Noise Effects on Critical Paths.
VTS
Junxia Ma, Jeremy Lee, Mohammad Tehranipoor
2009 — conf
New Design Strategy for Improving Hardware Trojan Detection and Reducing Trojan Activation Time.
HOST
Hassan Salmani, Mohammad Tehranipoor, Jim Plusquellic
2008 — ed.
23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA
DFT
Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor
2008 A conf
A Novel Pattern Generation Framework for Inducing Maximum Crosstalk Effects on Delay-Sensitive Paths.
ITC
Jeremy Lee, Mohammad Tehranipoor
2008 — conf
CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing.
ATS
Hiroshi Furukawa, Xiaoqing Wen, Kohei Miyase, Yuta Yamato, Seiji Kajihara, Patrick Girard, Laung-Terng Wang, Mohammad Tehranipoor
2008 J jnl
Defect Tolerance for Nanoscale Crossbar-Based Devices.
IEEE Des. Test Comput.
Mohammad Tehranipoor, Reza M. Rad
2008 — conf
Detecting Malicious Inclusions in Secure Hardware: Challenges and Solutions.
HOST
Xiaoxiao Wang, Mohammad Tehranipoor, Jim Plusquellic
2008 — conf
Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis.
DFT
Xiaoxiao Wang, Hassan Salmani, Mohammad Tehranipoor, James F. Plusquellic
2008 — ed.
IEEE International Workshop on Hardware-Oriented Security and Trust, HOST 2008, Anaheim, CA, USA, June 9, 2008. Proceedings
HOST
Mohammad Tehranipoor, Jim Plusquellic
2008 A conf
Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects.
ITC
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor
2008 Misc conf
LS-TDF: Low-Switching Transition Delay Fault Pattern Generation.
VTS
Jeremy Lee, Mohammad Tehranipoor
2008 J jnl
Layout-Aware Transition-Delay Fault Pattern Generation with Evenly Distributed Switching Activity.
J. Low Power Electron.
Jeremy Lee, Mohammad Tehranipoor
2008 A conf
Layout-Aware, IR-Drop Tolerant Transition Fault Pattern Generation.
DATE
Jeremy Lee, Sumit Narayan, Mike Kapralos, Mohammad Tehranipoor
2008 J jnl
Low-Transition Test Pattern Generation for BIST-Based Applications.
IEEE Trans. Computers
Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed
2008 A conf
Path-RO: a novel on-chip critical path delay measurement under process variations.
ICCAD
Xiaoxiao Wang, Mohammad Tehranipoor, Ramyanshu Datta
2008 A conf
Power Distribution Failure Analysis Using Transition-Delay Fault Patterns.
ITC
Junxia Ma, Jeremy Lee, Mohammad Tehranipoor
2008 A conf
Power supply signal calibration techniques for improving detection resolution to hardware Trojans.
ICCAD
Reza M. Rad, Xiaoxiao Wang, Mohammad Tehranipoor, Jim Plusquellic
2008 J jnl
SCT: A novel approach for testing and configuring nanoscale devices.
ACM J. Emerg. Technol. Comput. Syst.
Reza M. Rad, Mohammad Tehranipoor
2008 — conf
Sensitivity Analysis to Hardware Trojans using Power Supply Transient Signals.
HOST
Reza M. Rad, Jim Plusquellic, Mohammad Tehranipoor
2008 Misc conf
Test-Pattern Grading and Pattern Selection for Small-Delay Defects.
VTS
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Tehranipoor
2007 J jnl
A critical-path-aware partial gating approach for test power reduction.
ACM Trans. Design Autom. Electr. Syst.
Mohammed ElShoukry, Mohammad Tehranipoor, C. P. Ravikumar
2007 J jnl
Built-In Self-Test and Recovery Procedures for Molecular Electronics-Based Nanofabrics.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Mohammad Tehranipoor, Reza M. Rad
2007 J jnl
Evaluating area and performance of hybrid FPGAs with nanoscale clusters and CMOS routing.
ACM J. Emerg. Technol. Comput. Syst.
Reza M. Rad, Mohammad Tehranipoor
2007 J jnl
Guest Editorial.
J. Electron. Test.
Mohammad Tehranipoor
2007 J jnl
Guest Editors' Introduction: IR Drop in Very Deep-Submicron Designs.
IEEE Des. Test Comput.
Mohammad Tehranipoor, Kenneth M. Butler
2007 J jnl
Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar, Kenneth M. Butler
2007 J jnl
Securing Designs against Scan-Based Side-Channel Attacks.
IEEE Trans. Dependable Secur. Comput.
Jeremy Lee, Mohammad Tehranipoor, Chintan Patel, Jim Plusquellic
2007 Misc conf
Supply Voltage Noise Aware ATPG for Transition Delay Faults.
VTS
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
2007 A* conf
Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design.
DAC
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
2006 Misc conf
A Low-Cost Solution for Protecting IPs Against Scan-Based Side-Channel Attacks.
VTS
Jeremy Lee, Mohammad Tehranipoor, Jim Plusquellic
2006 — conf
A Reconfiguration-based Defect Tolerance Method for Nanoscale Devices.
DFT
Reza M. Rad, Mohammad Tehranipoor
2006 A* conf
A new hybrid FPGA with nanoscale clusters and CMOS routing.
DAC
Reza M. Rad, Mohammad Tehranipoor
2006 A conf
A novel framework for faster-than-at-speed delay test considering IR-drop effects.
ICCAD
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
2006 A conf
Fine-grained island style architecture for molecular electronic devices.
FPGA
Mohammad Tehranipoor, Reza M. Rad
2006 J jnl
Improving Transition Delay Test Using a Hybrid Method.
IEEE Des. Test Comput.
Nisar Ahmed, Mohammad Tehranipoor
2006 J jnl
Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method.
IEEE Des. Test Comput.
Jim Plusquellic, Dhruva Acharyya, Abhishek Singh, Mohammad Tehranipoor, Chintan Patel
2006 Misc conf
SCT: An Approach For Testing and Configuring Nanoscale Devices.
VTS
Reza M. Rad, Mohammad Tehranipoor
2006 Misc conf
Session Abstract.
VTS
Kee Sup Kim, Mohammad Tehranipoor
2006 A conf
Test and recovery for fine-grained nanoscale architectures.
FPGA
Mohammad Tehranipoor, Reza M. Rad
2006 A* conf
Timing-based delay test for screening small delay defects.
DAC
Nisar Ahmed, Mohammad Tehranipoor, Vinay Jayaram
2005 Misc conf
At-Speed Transition Fault Testing With Low Speed Scan Enable.
VTS
Nisar Ahmed, C. P. Ravikumar, Mohammad Tehranipoor, Jim Plusquellic
2005 — conf
Defect Tolerance for Molecular Electronics-Based NanoFabrics Using Built-In Self-Test Procedure.
DFT
Mohammad Tehranipoor
2005 A conf
Enhanced launch-off-capture transition fault testing.
ITC
Nisar Ahmed, Mohammad Tehranipoor, C. P. Ravikumar
2005 — conf
Improving Transition Delay Fault Coverage Using Hybrid Scan-Based Technique.
DFT
Nisar Ahmed, Mohammad Tehranipoor
2005 — conf
Low Transition LFSR for BIST-Based Applications.
Asian Test Symposium
Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed
2005 J jnl
Nine-coded compression technique for testing embedded cores in SoCs.
IEEE Trans. Very Large Scale Integr. Syst.
Mohammad Tehranipoor, Mehrdad Nourani, Krishnendu Chakrabarty
2005 — conf
Partial Gating Optimization for Power Reduction During Test Application.
Asian Test Symposium
Mohammed ElShoukry, Mohammad Tehranipoor, C. P. Ravikumar
2005 Misc conf
Pattern Generation and Estimation for Power Supply Noise Analysis.
VTS
Mehrdad Nourani, Mohammad Tehranipoor, Nisar Ahmed
2005 — conf
Securing Scan Design Using Lock and Key Technique.
DFT
Jeremy Lee, Mohammad Tehranipoor, Chintan Patel, Jim Plusquellic