| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | — | conf |
I2MTC
|
| 2025 | J | jnl |
Impact of Open-Ended Rectangular Waveguide Flange Properties on Measurements of Dielectric Coatings.
IEEE Trans. Instrum. Meas.
|
| 2025 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2024 | — | conf |
I2MTC
|
| 2024 | — | conf |
I2MTC
|
| 2024 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | — | conf |
I2MTC
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | — | conf |
I2MTC
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | — | conf |
I2MTC
|
| 2022 | — | conf |
I2MTC
|
| 2022 | — | conf |
I2MTC
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2022 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Image Process.
|
| 2021 | — | conf |
I2MTC
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2021 | — | conf |
I2MTC
|
| 2021 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | — | conf |
I2MTC
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2020 | J | jnl |
IEEE Trans. Instrum. Meas.
|