Mohammad H. Tehranipour

14 papers A 3C 1Misc 1Journal 3Unranked 6
YearRankTypeTitle / Venue / Authors
2005 J jnl
RL-huffman encoding for test compression and power reduction in scan applications.
ACM Trans. Design Autom. Electr. Syst.
Mehrdad Nourani, Mohammad H. Tehranipour
2004 J jnl
A Low-Cost At-Speed BIST Architecture for Embedded Processor and SRAM Cores.
J. Electron. Test.
Mohammad H. Tehranipour, Seid Mehdi Fakhraie, Zainalabedin Navabi, M. R. Movahedin
2004 — conf
Frequency driven repeater insertion for deep submicron.
ISCAS (5)
Nisar Ahmed, Mohammad H. Tehranipour, Dian Zhou, Mehrdad Nourani
2004 — conf
Low power pattern generation for BIST architecture.
ISCAS (2)
Nisar Ahmed, Mohammad H. Tehranipour, Mehrdad Nourani
2004 — conf
Mixed RL-Huffman encoding for power reduction and data compression in scan test.
ISCAS (2)
Mohammad H. Tehranipour, Mehrdad Nourani, Karim Arabi, Ali Afzali-Kusha
2004 A conf
Nine-Coded Compression Technique with Application to Reduced Pin-Count Testing and Flexible On-Chip Decompression.
DATE
Mohammad H. Tehranipour, Mehrdad Nourani, Krishnendu Chakrabarty
2004 J jnl
Testing SoC interconnects for signal integrity using extended JTAG architecture.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nourani
2003 A conf
Extending JTAG for Testing Signal Integrity in SoCs.
DATE
Nisar Ahmed, Mohammad H. Tehranipour, Mehrdad Nourani
2003 C conf
Multiple Transition Model and Enhanced Boundary Scan Architecture to Test Interconnects for Signal Integrity.
ICCD
Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nourani
2003 — conf
Systematic test program generation for SoC testing using embedded processor.
ISCAS (5)
Mohammad H. Tehranipour, Mehrdad Nourani, Seid Mehdi Fakhraie, Ali Afzali-Kusha
2003 Misc conf
Testing SoC Interconnects for Signal Integrity Using Boundary Scan.
VTS
Mohammad H. Tehranipour, Nisar Ahmed, Mehrdad Nourani
2003 — conf
eUTDSP: a design study of a new VLIW-based DSP architecture.
ISCAS (4)
G. R. Chaji, R. M. Pourrad, Seid Mehdi Fakhraie, Mohammad H. Tehranipour
2002 A conf
Signal Integrity Loss in SoC's Interconnects: A Diagnosis Approach Using Embedded Microprocessor.
ITC
Mohammad H. Tehranipour, Mehrdad Nourani
2001 — conf
An efficient BIST method for testing of embedded SRAMs.
ISCAS (5)
Mohammad H. Tehranipour, Zainalabedin Navabi, Seid Mehdi Fakhraie