| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2012 | J | jnl |
Expert Syst. Appl.
|
| 2011 | J | jnl |
IET Comput. Digit. Tech.
|
| 2010 | — | conf |
IDT
|
| 2010 | J | jnl |
Comput. Oper. Res.
|
| 2010 | — | conf |
SBCCI
|
| 2010 | J | jnl |
IET Circuits Devices Syst.
|
| 2010 | B | conf |
ETS
|
| 2008 | J | jnl |
Microelectron. Reliab.
|
| 2008 | Misc | conf |
VLSI Design
|
| 2007 | J | jnl |
J. Electron. Test.
|
| 2006 | — | conf |
ICECS
|
| 2005 | B | conf |
ETS
|
| 2005 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2003 | Misc | conf |
VLSI Design
|
| 2003 | — | conf |
Asian Test Symposium
|
| 2001 | J | jnl |
J. Electron. Test.
|
| 2001 | Misc | conf |
VTS
|
| 2000 | Misc | conf |
VLSI Design
|