Mohamed M. Hafed

11 papers A 4C 1Journal 2Unranked 4
YearRankTypeTitle / Venue / Authors
2004 A conf
A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing.
ITC
Mohamed M. Hafed, Antonio H. Chan, Geoffrey D. Duerden, Bardia Pishdad, Clarence Tam, Sébastien Laberge, Gordon W. Roberts
2003 — conf
A 5-channel, variable resolution, 10-GHz sampling rate coherent tester/oscilloscope IC and associated test vehicles.
CICC
Mohamed M. Hafed, Gordon W. Roberts
2003 — conf
An 8-channel, 12-bit, 20 MHz fully differential tester IC for analog and mixed-signal circuits.
ESSCIRC
Mohamed M. Hafed, Gordon W. Roberts
2003 J jnl
Techniques for high-frequency integrated test and measurement.
IEEE Trans. Instrum. Meas.
Mohamed M. Hafed, Gordon W. Roberts
2002 J jnl
A 4-GHz effective sample rate integrated test core for analog and mixed-signal circuits.
IEEE J. Solid State Circuits
Mohamed M. Hafed, Nazmy Abaskharoun, Gordon W. Roberts
2002 A conf
Test and Evaluation of Multiple Embedded Mixed-Signal Test Cores.
ITC
Mohamed M. Hafed, Gordon W. Roberts
2001 A conf
A stand-alone integrated test core for time and frequency domain measurements.
ITC
Mohamed M. Hafed, Nazmy Abaskharoun, Gordon W. Roberts
2001 — conf
Strategies for on-chip sub-nanosecond signal capture and timing measurements.
ISCAS (4)
Nazmy Abaskharoun, Mohamed M. Hafed, Gordon W. Roberts
2000 C conf
A robust deep submicron programmable DC voltage generator.
ISCAS
Mohamed M. Hafed, Sébastien Laberge, Gordon W. Roberts
2000 — conf
A stand-alone integrated excitation/extraction system for analog BIST applications.
CICC
Mohamed M. Hafed, Gordon W. Roberts
2000 A conf
A stand-alone integrated test core for time and frequency domain measurements.
ITC
Mohamed M. Hafed, Nazmy Abaskharoun, Gordon W. Roberts