Mohamed Ali Belaïd

21 papers Journal 19Unranked 2
YearRankTypeTitle / Venue / Authors
2024 J jnl
A Comprehensive Approach to Flexible LVRT Strategies for Inverter-Based PPMs Enhancing Voltage-Support, Overcurrent Protection, and DC-Link Voltage Quality.
IEEE Access
Fathia Letaief, Mahmoud Hamouda, Mohamed Ali Belaïd, Kamal Al-Haddad
2020 J jnl
RF performance reliability of power N-LDMOS under pulsed-RF aging life test in radar application S-band.
IET Circuits Devices Syst.
Mohamed Ali Belaïd, Ahmed Almusallam, Mohamed Masmoudi
2018 J jnl
Performance analysis of S-parameter in N-MOSFET devices after thermal accelerated tests.
Microelectron. Reliab.
Mohamed Ali Belaïd
2018 J jnl
Symptom reliability: S-parameters evaluation of power laterally diffused-metal-oxide-semiconductor field-effect transistor after pulsed-RF life tests for a radar application.
IET Circuits Devices Syst.
Mohamed Ali Belaïd
2016 J jnl
Evolution study of the ElectroMagnetic Interference for RF LDMOS in series chopper application after thermal accelerated tests.
Microelectron. Reliab.
Mohamed Ali Belaïd, H. Kaouach, Jaleleddine Ben Hadj Slama
2015 J jnl
Impact of hot carrier injection on switching time evolution for power RF LDMOS after accelerated tests.
Microelectron. Reliab.
Mohamed Ali Belaïd
2014 J jnl
Leakage current effects on N-MOSFETs after thermal ageing in pulsed life tests.
Microelectron. J.
Mohamed Ali Belaïd, Ahmed M. Nahhas, M. Gares, K. Daoud, Olivier Latry
2014 J jnl
Performance drifts of N-MOSFETs under pulsed RF life test.
Microelectron. Reliab.
Mohamed Ali Belaïd, M. Gares, K. Daoud, Olivier Latry
2013 J jnl
Conducted and radiated EMI evolution of power RF N-LDMOS after accelerated ageing tests.
Microelectron. Reliab.
Mohamed Tlig, Jaleleddine Ben Hadj Slama, Mohamed Ali Belaïd
2012 — conf
Failure analysis of hot-electron effect on power RF N-LDMOS transistors.
DTIS
Mohamed Ali Belaïd, M. Gares, K. Daoud, Philippe Eudeline
2011 J jnl
S-parameter performance degradation in power RF N-LDMOS devices due to hot carrier effects.
Microelectron. Reliab.
Mohamed Ali Belaïd, M. Gares, K. Daoud, Philippe Eudeline
2010 J jnl
Evaluation of hot-electron effects on critical parameter drifts in power RF LDMOS transistors.
Microelectron. Reliab.
Mohamed Ali Belaïd, K. Daoud
2007 J jnl
Comparative analysis of RF LDMOS capacitance reliability under accelerated ageing tests.
Microelectron. Reliab.
Mohamed Ali Belaïd, K. Ketata, M. Gares, Karine Mourgues, Mohamed Masmoudi, Jérôme Marcon
2007 J jnl
Reliability study of power RF LDMOS device under thermal stress.
Microelectron. J.
Mohamed Ali Belaïd, K. Ketata, Karine Mourgues, M. Gares, Mohamed Masmoudi, Jérôme Marcon
2007 J jnl
Study of hot-carrier effects on power RF LDMOS device reliability.
Microelectron. Reliab.
M. Gares, Mohamed Ali Belaïd, Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon, Karine Mourgues, Philippe Eudeline
2006 J jnl
Electrical parameters degradation of power RF LDMOS device after accelerated ageing tests.
Microelectron. Reliab.
Mohamed Ali Belaïd, K. Ketata, Mohamed Masmoudi, M. Gares, Hichame Maanane, Jérôme Marcon
2006 J jnl
Hot carrier reliability of RF N- LDMOS for S Band radar application.
Microelectron. Reliab.
M. Gares, Hichame Maanane, Mohamed Masmoudi, Pierre Bertram, Jérôme Marcon, Mohamed Ali Belaïd, Karine Mourgues, C. Tolant, Philippe Eudeline
2006 — conf
Impact de la Temperature sur la Fiabilite des Composants rf Ldmos de Puissance.
CCECE
M. Gares, Hichame Maanane, Mohamed Ali Belaïd, Mohamed Masmoudi, Jérôme Marcon, Karine Mourgues, Pierre Bertram, Philippe Eudeline
2006 J jnl
Study of RF N
Microelectron. Reliab.
Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon, Mohamed Ali Belaïd, Karine Mourgues, C. Tolant, K. Ketata, Philippe Eudeline
2005 J jnl
Comparative analysis of accelerated ageing effects on power RF LDMOS reliability.
Microelectron. Reliab.
Mohamed Ali Belaïd, K. Ketata, Karine Mourgues, Hichame Maanane, Mohamed Masmoudi, Jérôme Marcon
2004 J jnl
Reliability study of Power RF LDMOS for Radar Application.
Microelectron. Reliab.
Hichame Maanane, Pierre Bertram, Jérôme Marcon, Mohamed Masmoudi, Mohamed Ali Belaïd, Karine Mourgues, Philippe Eudeline, K. Ketata