Mohab H. Anis

21 papers C 2Journal 5Unranked 14
YearRankTypeTitle / Venue / Authors
2017 — conf
1T2R: A novel memory cell design to resolve single-event upset in RRAM arrays.
ASICON
Amr M. S. Tosson, Shimeng Yu, Mohab H. Anis, Lan Wei
2017 J jnl
A Study of the Effect of RRAM Reliability Soft Errors on the Performance of RRAM-Based Neuromorphic Systems.
IEEE Trans. Very Large Scale Integr. Syst.
Amr M. S. Tosson, Shimeng Yu, Mohab H. Anis, Lan Wei
2017 — conf
Analysis of RRAM Reliability Soft-Errors on the Performance of RRAM-Based Neuromorphic Systems.
ISVLSI
Amr M. S. Tosson, Shimeng Yu, Mohab H. Anis, Lan Wei
2017 — conf
Mitigating the Effect of Reliability Soft-errors of RRAM Devices on the Performance of RRAM-based Neuromorphic Systems.
ACM Great Lakes Symposium on VLSI
Amr M. S. Tosson, Shimeng Yu, Mohab H. Anis, Lan Wei
2016 — conf
8T1R: A Novel Low-power High-speed RRAM-based Non-volatile SRAM Design.
ACM Great Lakes Symposium on VLSI
Amr M. S. Tosson Abdelwahed, Adam Neale, Mohab H. Anis, Lan Wei
2016 — conf
RRAM Refresh Circuit: A Proposed Solution To Resolve The Soft-Error Failures For HfO
ACM Great Lakes Symposium on VLSI
Amr M. S. Tosson, Mohab H. Anis, Lan Wei
2014 J jnl
Litho-Friendly Decomposition Method for Self-Aligned Triple Patterning.
IEEE Trans. Very Large Scale Integr. Syst.
Minoo Mirsaeedi, Andres J. Torres, Mohab H. Anis
2013 J jnl
Litho-Friendly Decomposition Method for Self-Aligned Double Patterning.
IEEE Trans. Very Large Scale Integr. Syst.
Minoo Mirsaeedi, Andres J. Torres, Mohab H. Anis
2013 J jnl
Parametric DFM Solution for Analog Circuits: Electrical-Driven Hotspot Detection, Analysis, and Correction Flow.
IEEE Trans. Very Large Scale Integr. Syst.
Haitham Eissa, Rami Fathy Salem, Ahmed Arafa, Sherif Hany, Abdelrahman ElMously, Mohamed Dessouky, David Nairn, Mohab H. Anis
2013 C conf
Tagged probabilistic simulation based error probability estimation for better-than-worst case circuit design.
VLSI-SoC
Amr M. S. Tosson, Siddharth Garg, Mohab H. Anis
2012 — conf
High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique.
ISQED
Rami F. Salem, Mohamed Al-Imam, Abdelrahman ElMously, Haitham Eissa, Ahmed Arafa, Mohab H. Anis
2012 — conf
Schematic-driven physical verification: Fully automated solution for analog IC design.
SoCC
Ahmed Arafa, Hend Wagieh, Rami Fathy Salem, John Ferguson, Doug Morgan, Mohab H. Anis, Mohamed Dessouky
2011 — conf
A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow.
SoCC
Rami F. Salem, Ahmed Arafa, Sherif Hany, Abdelrahman ElMously, Haitham Eissa, Mohamed Dessouky, David Nairn, Mohab H. Anis
2011 J jnl
A statistical yield optimization framework for interconnect in double patterning lithography.
Microelectron. J.
Minoo Mirsaeedi, Mohab H. Anis
2011 — conf
An electrical-aware parametric DFM solution for analog circuits.
IDT
Rami Fathy Salem, Ahmed Arafa, Sherif Hany, Abdelrahman ElMously, Haitham Eissa, Mohamed Dessouky, David Nairn, Mohab H. Anis
2011 — conf
Self-aligned double patterning (SADP) layout decomposition.
ISQED
Minoo Mirsaeedi, J. Andres Torres, Mohab H. Anis
2010 — conf
A DFM tool for analyzing lithography and stress effects on standard cells and critical path performance in 45nm digital designs.
IDT
Rami F. Salem, Abdelrahman ElMously, Haitham Eissa, Mohamed Dessouky, Mohab H. Anis
2009 — conf
Framework for statistical design of a flip-flop.
ICECS
Sayed Alireza Sadrossadat, Minoo Mirsaeedi, Kumaraswamy Ponnambalam, Mohab H. Anis
2007 — conf
Managing Power Consumption and Variability in Nanometer Circuits.
ICECS
Mohab H. Anis
2000 C conf
A contention-free domino logic for scaled-down CMOS technologies with ultra low threshold voltages.
ISCAS
Muhammad E. S. Elrabaa, Mohab H. Anis, Mohamed I. Elmasry
2000 — conf
Effect of technology scaling on digital CMOS logic styles.
CICC
Mohamed W. Allam, Mohab H. Anis, Mohamed I. Elmasry