Mitsuhiko Igarashi

12 papers Journal 2Unranked 10
YearRankTypeTitle / Venue / Authors
2025 — conf
Leakage Current Fluctuation of On/Off-State Stress in 3 nm Process and its Guard-band Compensation.
IRPS
Mitsuhiko Igarashi, Yuuki Uchida, Keiichiro Iwamoto, Yoshio Takazawa, Yasumasa Tsukamoto
2023 — conf
Ultra Long-term Measurement Results of BTI-induced Aging Degradation on 7-nm Ring Oscillators.
IRPS
Kazutoshi Kobayashi, Tomoharu Kishita, Hiroki Nakano, Jun Furuta, Mitsuhiko Igarashi, Shigetaka Kumashiro, Michitarou Yabuuchi, Hironori Sakamoto
2021 J jnl
An Analysis of Local BTI Variation with Ring-Oscillator in Advanced Processes and Its Impact on Logic Circuit and SRAM.
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Makoto Yabuuchi, Yasumasa Tsukamoto, Koji Shibutani, Kazutoshi Kobayashi
2019 — conf
Study of Local BTI Variation and its Impact on Logic Circuit and SRAM in 7 nm Fin-FET Process.
IRPS
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Makoto Yabuuchi, Yasumasa Tsukamoto, Koji Shibutani
2018 — conf
A Fully Standard-Cell Based On-Chip BTI and HCI Monitor with 6.2x BTI sensitivity and 3.6x HCI sensitivity at 7 nm Fin-FET Process.
A-SSCC
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii
2018 — conf
Study of impact of BTI's local layout effect including recovery effect on various standard-cells in 10nm FinFET.
IRPS
Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii
2017 — conf
NBTI/PBTI separated BTI monitor with 4.2x sensitivity by standard cell based unbalanced ring oscillator.
A-SSCC
Mitsuhiko Igarashi, Yoshio Takazawa, Yasumasa Tsukamoto, Kan Takeuchi, Koji Shibutani
2015 J jnl
A 28 nm High-k/MG Heterogeneous Multi-Core Mobile Application Processor With 2 GHz Cores and Low-Power 1 GHz Cores.
IEEE J. Solid State Circuits
Mitsuhiko Igarashi, Toshifumi Uemura, Ryo Mori, Hiroshi Kishibe, Midori Nagayama, Masaaki Taniguchi, Kohei Wakahara, Toshiharu Saito, Masaki Fujigaya, Kazuki Fukuoka, Koji Nii, Takeshi Kataoka, Toshihiro Hattori
2015 — conf
An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology.
ESSCIRC
Mitsuhiko Igarashi, Kan Takeuchi, Takeshi Okagaki, Koji Shibutani, Hiroaki Matsushita, Koji Nii
2014 — conf
10.2 A 28nm HPM heterogeneous multi-core mobile application processor with 2GHz cores and low-power 1GHz cores.
ISSCC
Mitsuhiko Igarashi, Toshifumi Uemura, Ryo Mori, Noriaki Maeda, Hiroshi Kishibe, Midori Nagayama, Masaaki Taniguchi, Kohei Wakahara, Toshiharu Saito, Masaki Fujigaya, Kazuki Fukuoka, Koji Nii, Takeshi Kataoka, Toshihiro Hattori
2014 — conf
Assessment of reliability impact on GHz processors with moderate overdrive.
ISQED
Mitsuhiko Igarashi, Hideki Aono, Hideaki Abe, Koji Shibutani, Kan Takeuchi
2012 — conf
28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization.
CICC
Mitsuhiko Igarashi, Kan Takeuchi, Yoshio Takazawa, Yasuto Igarashi, Hiroaki Matsushita