Miron Abramovici

88 papers A* 14A 25B 2C 2Misc 10Journal 24Unranked 10

Year	Rank	Type	Title / Venue / Authors
2017	Misc	`conf`	Keynote address tribute to Professor Mel Breuer: Contributions to CAD and Test. VTS Sandeep Gupta, Miron Abramovici, Magdy Abadir, Sridhar Narayanan
2013	J	`jnl`	Protection Against Hardware Trojan Attacks: Towards a Comprehensive Solution. IEEE Des. Test Swarup Bhunia, Miron Abramovici, Dakshi Agrawal, Paul Bradley, Michael S. Hsiao, Jim Plusquellic, Mohammad Tehranipoor
2010	A*	`conf`	Bridging pre-silicon verification and post-silicon validation. DAC Amir Nahir, Avi Ziv, Rajesh Galivanche, Alan J. Hu, Miron Abramovici, Albert Camilleri, Bob Bentley, Harry Foster, Valeria Bertacco, Shakti Kapoor
2009	—	`conf`	Integrated circuit security: new threats and solutions. CSIIRW Miron Abramovici, Paul Bradley
2009	J	`jnl`	We need more standards like IEEE 1500. IEEE Des. Test Comput. Miron Abramovici, Al Crouch
2008	J	`jnl`	In-System Silicon Validation and Debug. IEEE Des. Test Comput. Miron Abramovici
2008	—	`conf`	In-system silicon validation using a reconfigurable platform. HLDVT Miron Abramovici
2008	Misc	`conf`	You can catch more bugs with transaction level honey. CODES+ISSS Miron Abramovici, Kees Goossens, Bart Vermeulen, Jack Greenbaum, Neal Stollon, Adam Donlin
2007	J	`jnl`	Online Fault Tolerance for FPGA Logic Blocks. IEEE Trans. Very Large Scale Integr. Syst. John Marty Emmert, Charles E. Stroud, Miron Abramovici
2006	A*	`conf`	A reconfigurable design-for-debug infrastructure for SoCs. DAC Miron Abramovici, Paul Bradley, Kumar N. Dwarakanath, Peter Levin, Gérard Memmi, Dave Miller
2005	J	`jnl`	Sequential circuit ATPG using combinational algorithms. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Xiaoming Yu, Miron Abramovici
2004	J	`jnl`	Online BIST and BIST-based diagnosis of FPGA logic blocks. IEEE Trans. Very Large Scale Integr. Syst. Miron Abramovici, Charles E. Stroud, John Marty Emmert
2003	J	`jnl`	BIST-Based Delay-Fault Testing in FPGAs. J. Electron. Test. Miron Abramovici, Charles E. Stroud
2002	—	`conf`	BIST-Based Delay-Fault Testing in FPGAs. IOLTW Miron Abramovici, Charles E. Stroud
2002	A	`conf`	BIST-Based Diagnosis of FPGA Interconnect. ITC Charles E. Stroud, Jeremy Nall, Matthew Lashinsky, Miron Abramovici
2002	A*	`conf`	Low-cost sequential ATPG with clock-control DFT. DAC Miron Abramovici, Xiaoming Yu, Elizabeth M. Rudnick
2002	A*	`conf`	Using embedded FPGAs for SoC yield improvement. DAC Miron Abramovici, Charles E. Stroud, John Marty Emmert
2001	Misc	`conf`	A Configurable Hardware/Software Approach to SAT Solving. FCCM José T. de Sousa, J. M. da Silva, Miron Abramovici
2001	A	`conf`	At-speed logic BIST using a frozen clock testing strategy. ITC Jongshin Shin, Xiaoming Yu, Elizabeth M. Rudnick, Miron Abramovici
2001	J	`jnl`	BIST-based test and diagnosis of FPGA logic blocks. IEEE Trans. Very Large Scale Integr. Syst. Miron Abramovici, Charles E. Stroud
2001	—	`conf`	Design for Testability Techniques: A Comparative Analysis. LATW Miron Abramovici
2001	—	`conf`	On-Line BIST and Diagnosis of FPGA Interconnect Using Roving STARs. IOLTW Miron Abramovici, Charles E. Stroud, Matthew Lashinsky, Jeremy Nall, John Marty Emmert
2001	—	`conf`	On-Line Fault Tolerance for FPGA Interconnect with Roving STARs. DFT John Marty Emmert, Stanley Baumgart, Pankaj Kataria, Andrew M. Taylor, Charles E. Stroud, Miron Abramovici
2001	—	`conf`	Roving Stars: An Integrated Approach To On-Line Testing, Diagnosis, And Fault Tolerance For Fpgas In Adaptive Computing Systems. Evolvable Hardware Miron Abramovici, John Marty Emmert, Charles E. Stroud
2001	—	`conf`	Sequential ATPG Using Combinational Algorithms. LATW Miron Abramovici, Xiaoming Yu, Elizabeth M. Rudnick
2000	J	`jnl`	A SAT Solver Using Reconfigurable Hardware and Virtual Logic. J. Autom. Reason. Miron Abramovici, José T. de Sousa
2000	J	`jnl`	Compact Test Generation Using a Frozen Clock Testing Strategy. J. Inf. Sci. Eng. Elizabeth M. Rudnick, Miron Abramovici
2000	A	`conf`	DIST-based detection and diagnosis of multiple faults in FPGAs. ITC Miron Abramovici, Charles E. Stroud
2000	Misc	`conf`	Dynamic Fault Tolerance in FPGAs via Partial Reconfiguration. FCCM John Marty Emmert, Charles E. Stroud, Brandon Skaggs, Miron Abramovici
2000	J	`jnl`	FILL and FUNI: algorithms to identify illegal states and sequentially untestable faults. ACM Trans. Design Autom. Electr. Syst. David E. Long, Mahesh A. Iyer, Miron Abramovici
2000	—	`conf`	Improving On-Line BIST-Based Diagnosis for Roving STARs. IOLTW Miron Abramovici, Charles E. Stroud, Brandon Skaggs, John Marty Emmert
2000	A	`conf`	MUST: multiple-stem analysis for identifying sequentially untestable faults. ITC Qiang Peng, Miron Abramovici, Jacob Savir
2000	B	`conf`	Performance Penalty for Fault Tolerance in Roving STARs. FPL John Marty Emmert, Charles E. Stroud, Jason A. Cheatham, Andrew M. Taylor, Pankaj Kataria, Miron Abramovici
1999	A*	`conf`	A Massively-Parallel Easily-Scalable Satisfiability Solver Using Reconfigurable Hardware. DAC Miron Abramovici, José T. de Sousa, Daniel G. Saab
1999	Misc	`conf`	A Virtual Logic Algorithm for Solving Satisfiability Problems Using Reconfigurable Hardware. FCCM Miron Abramovici, José T. de Sousa
1999	A	`conf`	FreezeFrame: Compact Test Generation Using a Frozen Clock Strategy. DATE Yanti Santoso, Matthew C. Merten, Elizabeth M. Rudnick, Miron Abramovici
1999	A	`conf`	Using roving STARs for on-line testing and diagnosis of FPGAs in fault-tolerant applications. ITC Miron Abramovici, Charles E. Stroud, Carter Hamilton, Sajitha Wijesuriya, Vinay Verma
1998	A	`conf`	Built-in self-test of FPGA interconnect. ITC Charles E. Stroud, Sajitha Wijesuriya, Carter Hamilton, Miron Abramovici
1997	A	`conf`	BIST-Based Diagnostics of FPGA Logic Blocks. ITC Charles E. Stroud, Eric Lee, Miron Abramovici
1997	Misc	`conf`	Fault simulation on reconfigurable hardware. FCCM Miron Abramovici, Prem R. Menon
1997	B	`conf`	Satisfiability on reconfigurable hardware. FPL Miron Abramovici, Daniel G. Saab
1996	Misc	`conf`	Built-in self-test of logic blocks in FPGAs (Finally, a free lunch: BIST without overhead!). VTS Charles E. Stroud, Srinivasa Konala, Ping Chen, Miron Abramovici
1996	A	`conf`	Evaluation of FPGA Resources for Built-In Self-Test of Programmable Logic Blocks. FPGA Charles E. Stroud, Ping Chen, Srinivasa Konala, Miron Abramovici
1996	J	`jnl`	FIRE: a fault-independent combinational redundancy identification algorithm. IEEE Trans. Very Large Scale Integr. Syst. Mahesh A. Iyer, Miron Abramovici
1996	A*	`conf`	Identifying Sequential Redundancies Without Search. DAC Mahesh A. Iyer, David E. Long, Miron Abramovici
1996	Misc	`conf`	Increasing testability by clock transformation (getting rid of those darn states). VTS Krishna B. Rajan, David E. Long, Miron Abramovici
1996	—	`conf`	Surprises in Sequential Redundancy Identification. ED&TC Mahesh A. Iyer, David E. Long, Miron Abramovici
1996	A	`conf`	Using ILA Testing for BIST in FPGAs. ITC Charles E. Stroud, Eric Lee, Srinivasa Konala, Miron Abramovici
1995	Misc	`conf`	Identifying sequentially untestable faults using illegal states. VTS David E. Long, Mahesh A. Iyer, Miron Abramovici
1995	A	`conf`	On Combining Design for Testability Techniques. ITC Prashant S. Parikh, Miron Abramovici
1995	J	`jnl`	Testability-based partial scan analysis. J. Electron. Test. Prashant S. Parikh, Miron Abramovici
1994	Misc	`conf`	Low-Cost Redundancy Identification for Combinatorial Circuits. VLSI Design Mahesh A. Iyer, Miron Abramovici
1994	A	`conf`	Sequentially Untestable Faults Identified Without Search ("Simple Implications Beat Exhaustive Search!"). ITC Mahesh A. Iyer, Miron Abramovici
1993	A*	`conf`	A Cost-Based Approach to Partial Scan. DAC Prashant S. Parikh, Miron Abramovici
1993	A	`conf`	DOs and DON'Ts in Computing Fault Coverage. ITC Miron Abramovici
1993	A	`conf`	On Selecting Flip-Flops for Partial Reset. ITC Miron Abramovici, Prashant S. Parikh, Ben Mathew, Daniel G. Saab
1992	J	`jnl`	Dynamic redundancy identification in automatic test generation. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Miron Abramovici, David T. Miller, Rabindra K. Roy
1992	A*	`conf`	Freeze!: A New Approach for Testing Sequential Circuits. DAC Miron Abramovici, Krishna B. Rajan, David T. Miller
1992	A	`conf`	One-Pass Redundancy Identification and Removal. ITC Miron Abramovici, Mahesh A. Iyer
1992	A	`conf`	Warning: 100% Fault Coverage May Be Misleading!! ITC Miron Abramovici, Prashant S. Parikh
1991	J	`jnl`	SCRIPT: a critical path tracing algorithm for synchronous sequential circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Premachandran R. Menon, Ytzhak H. Levendel, Miron Abramovici
1991	A	`conf`	The Best Flip-Flops to Scan. ITC Miron Abramovici, James J. Kulikowski, Rabindra K. Roy
1990	—	`book`	Digital systems testing and testable design. Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman
1990	A	`conf`	Global cost functions for test generation. ITC Miron Abramovici, David T. Miller, R. Henning
1989	A	`conf`	Dynamic redundancy identification in automatic test generation. ICCAD Miron Abramovici, David T. Miller, Rabindra K. Roy
1989	C	`conf`	System-level design verification in the AT&T Computer Division: tools. ICCD Miron Abramovici, James J. Kulikowski, David T. Miller, Prem R. Menon
1989	C	`conf`	System-level design verification in the AT&T computer division: overview and strategy. ICCD Miron Abramovici, J. W. Bierbauer, R. H. Hellman, C. L. Hong, David T. Miller, R. G. Taylor
1988	A	`conf`	Critical path tracing in sequential circuits. ICCAD Prem R. Menon, Ytzhak H. Levendel, Miron Abramovici
1988	A	`conf`	What is the Path to Fast Fault Simulation? ITC Miron Abramovici, Balaji Krishnamurthy, Rob Mathews, Bill Rogers, Michael Schulz, Sharad Seth, John A. Waicukauski
1986	J	`jnl`	Checkpoint Faults are not Sufficient Target Faults for Test Generation. IEEE Trans. Computers Miron Abramovici, Prem R. Menon, David T. Miller
1986	J	`jnl`	SMART and FAST: Test Generation for VLSI Scan-Design Circuits. IEEE Des. Test Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller
1985	J	`jnl`	A Practical Approach to Fault Simulation and Test Generation for Bridging Faults. IEEE Trans. Computers Miron Abramovici, Prem R. Menon
1985	A	`conf`	Low-Cost Fault Simulation: Why, When and How. ITC Miron Abramovici
1985	A	`conf`	Test Generation In Lamp2: Concepts and Algorithms. ITC Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller
1985	A	`conf`	Test Generation In Lamp2: System Overview. ITC Miron Abramovici, James J. Kulikowski, Premachandran R. Menon, David T. Miller
1984	J	`jnl`	Critical Path Tracing: An Alternative to Fault Simulation. IEEE Des. Test Miron Abramovici, Prem R. Menon, David T. Miller
1983	J	`jnl`	A Logic Simulation Machine. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Miron Abramovici, Ytzhak H. Levendel, Premachandran R. Menon
1983	A	`conf`	A Practical Approach to Fault Simulation and Test Generation for Bridging Faults. ITC Miron Abramovici, Premachandran R. Menon
1983	A*	`conf`	Critical path tracing - an alternative to fault simulation. DAC Miron Abramovici, Prem R. Menon, David T. Miller
1982	J	`jnl`	A Hierarchical, Path-Oriented Approach to Fault Diagnosis in Modular Combinational Circuits. IEEE Trans. Computers Miron Abramovici
1982	A*	`conf`	A logic simulation machine. DAC Miron Abramovici, Ytzhak H. Levendel, Prem R. Menon
1982	A*	`conf`	A logic simulation machine. ISCA Miron Abramovici, Ytzhak H. Levendel, Prem R. Menon
1982	J	`jnl`	Fault Diagnosis in Synchronous Sequential Circuits Based on an Effect-Cause Analysis. IEEE Trans. Computers Miron Abramovici, Melvin A. Breuer
1981	A*	`conf`	A maximal resolution guided-probe testing algorithm. DAC Miron Abramovici
1980	A*	`conf`	Fault diagnosis based on effect-cause analysis: An introduction. DAC Miron Abramovici, Melvin A. Breuer
1980	J	`jnl`	Multiple Fault Diagnosis in Combinational Circuits Based on an Effect-Cause Analysis. IEEE Trans. Computers Miron Abramovici, Melvin A. Breuer
1979	J	`jnl`	On Redundancy and Fault Detection in Sequential Circuits. IEEE Trans. Computers Miron Abramovici, Melvin A. Breuer
1977	A*	`conf`	Concurrent fault simulation and functional level modeling. DAC Miron Abramovici, Melvin A. Breuer, K. Kumar