Miquel Vellvehí

28 papers A 1Journal 22Unranked 5
YearRankTypeTitle / Venue / Authors
2023 J jnl
Die-Level Transient Thermal Imaging Based on Fourier Series Reconstruction for Power Industrial Electronics.
IEEE Trans. Instrum. Meas.
Conrad Ferrer, Oriol Avino-Salvado, Miquel Vellvehí, Xavier Jordà, Xavier Perpiñà
2021 J jnl
Local Thermal Resistance Extraction in Monolithic Microwave Integrated Circuits.
IEEE Trans. Ind. Electron.
Miquel Vellvehí, Xavier Perpiñà, Javier Leon, Oriol Avino-Salvado, Conrad Ferrer, Xavier Jordà
2019 J jnl
Output Power and Gain Monitoring in RF CMOS Class A Power Amplifiers by Thermal Imaging.
IEEE Trans. Instrum. Meas.
Xavier Perpiñà, Ferran Reverter, Javier Leon, Enrique Barajas, Miquel Vellvehí, Xavier Jordà, Josep Altet
2019 J jnl
Solid-State Relay Solutions for Induction Cooking Applications Based on Advanced Power Semiconductor Devices.
IEEE Trans. Ind. Electron.
Manuel Fernandez, Xavier Perpiñà, José Rebollo, Miquel Vellvehí, David Sanchez, Tomás Cabeza, Sergio Llorente, Xavier Jordà
2017 J jnl
Short-Circuit Study in Medium-Voltage GaN Cascodes, p-GaN HEMTs, and GaN MISHEMTs.
IEEE Trans. Ind. Electron.
Manuel Fernandez, Xavier Perpiñà, Jaume Roig-Guitart, Miquel Vellvehí, Filip Bauwens, Marnix Tack, Xavier Jordà
2015 J jnl
Characterization of phase change material systems using a thermal test device.
Microelectron. J.
Xavier Jordà, Jesús Esarte, Xavier Perpiñà, Miquel Vellvehí, Gorka Argandoña, Maite Aresti
2015 J jnl
Functional and Consumption Analysis of Integrated Circuits Supplied by Inductive Power Transfer by Powering Modulation and Lock-In Infrared Imaging.
IEEE Trans. Ind. Electron.
Javier Leon, Xavier Perpiñà, Jordi Sacristán, Miquel Vellvehí, Antoni Baldi, Xavier Jordà
2015 J jnl
SiC Integrated Circuit Control Electronics for High-Temperature Operation.
IEEE Trans. Ind. Electron.
Mihaela Alexandru, Viorel Banu, Xavier Jordà, Josep Montserrat, Miquel Vellvehí, Dominique Tournier, José Millán, Philippe Godignon
2014 J jnl
Comparison of temperature limits for Trench silicon IGBT technologies for medium power applications.
Microelectron. Reliab.
Xavier Perpiñà, Xavier Jordà, Javier Leon, Miquel Vellvehí, Daniel Antón, Sergio Llorente
2014 J jnl
Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers.
Microelectron. J.
Josep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà
2014 — conf
Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes.
MWSCAS
Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo
2014 — conf
Study of surface weak spots on SiC Schottky Diodes under specific operating regimes by Infrared Lock-in sensing.
ESSDERC
Javier Leon, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà, Philippe Godignon
2014 J jnl
Temperature effects on the ruggedness of SiC Schottky diodes under surge current.
Microelectron. Reliab.
Javier Leon, Xavier Perpiñà, Viorel Banu, Josep Montserrat, Maxime Berthou, Miquel Vellvehí, Philippe Godignon, Xavier Jordà
2013 — conf
4H-SiC MESFET specially designed and fabricated for high temperature integrated circuits.
ESSDERC
Mihaela Alexandru, Viorel Banu, Philippe Godignon, Miquel Vellvehí, José Millán
2013 J jnl
Design methodologies for reliability of SSL LED boards.
Microelectron. Reliab.
Jiri Jakovenko, J. Formánek, X. Perpiñà, Xavier Jordà, Miquel Vellvehí, Robert J. Werkhoven, Miroslav Husák, J. M. G. Kunen, P. Bancken, P. J. Bolt, A. Gasse
2013 — conf
High temperature-low temperature coefficient analog voltage reference integrated circuit implemented with SiC MESFETs.
ESSCIRC
Viorel Banu, Philippe Godignon, Mihaela Alexandru, Miquel Vellvehí, Xavier Jordà, José Millán
2013 J jnl
Thermal resistance investigations on new leadframe-based LED packages and boards.
Microelectron. Reliab.
B. Pardo, A. Gasse, A. Fargeix, Jiri Jakovenko, Robert J. Werkhoven, Xavier Perpiñà, Xavier Jordà, Miquel Vellvehí, T. Van Weelden, P. Bancken
2012 A conf
DC temperature measurements for power gain monitoring in RF power amplifiers.
ITC
Josep Altet, Diego Mateo, Didac Gómez, Xavier Perpiñà, Miquel Vellvehí, Xavier Jordà
2012 J jnl
Design for reliability of solid state lighting systems.
Microelectron. Reliab.
Xavier Perpiñà, Robert J. Werkhoven, Jiri Jakovenko, J. Formánek, Miquel Vellvehí, Xavier Jordà, Jos M. G. Kunen, Peter Bancken, Pieter Jan Bolt
2012 J jnl
Thermal cycling analysis of high temperature die-attach materials.
Microelectron. Reliab.
Luis A. Navarro, Xavier Perpiñà, Miquel Vellvehí, Viorel Banu, Xavier Jordà
2011 J jnl
Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based Systems.
IEEE Trans. Ind. Electron.
Xavier Perpiñà, Xavier Jordà, Miquel Vellvehí, José Rebollo, Michel Mermet-Guyennet
2011 J jnl
SiC Schottky Diodes for Harsh Environment Space Applications.
IEEE Trans. Ind. Electron.
Philippe Godignon, Xavier Jordà, Miquel Vellvehí, Xavier Perpiñà, Viorel Banu, Demetrio López, Juan Barbero, Pierre Brosselard, Silvia Massetti
2007 J jnl
Coupled electro-thermal simulation of a DC/DC converter.
Microelectron. Reliab.
Miquel Vellvehí, Xavier Jordà, Philippe Godignon, Carles Ferrer, José Millán
2004 J jnl
Design considerations for 6.5 kV IGBT devices.
Microelectron. J.
Miquel Vellvehí, David Flores, Xavier Jordà, Salvador Hidalgo, José Rebollo, L. Coulbeck, P. Waind
2004 J jnl
IGBT gate driver IC with full-bridge output stage using a modified standard CMOS process.
Microelectron. J.
Amador Pérez-Tomás, Xavier Jordà, Philippe Godignon, Jose Luis Gálvez, Miquel Vellvehí, José Millán
2004 J jnl
Self-heating experimental study of 600V PT-IGBTs under low dissipation energies.
Microelectron. J.
Xavier Perpiñà, Xavier Jordà, N. Mestres, Miquel Vellvehí, Philippe Godignon, José Millán
2002 J jnl
Reduction of self-heating effect on SOIM devices.
Microelectron. Reliab.
Jaume Roig, David Flores, Miquel Vellvehí, José Rebollo, José Millán
2001 — conf
Smart Temperature Sensor for On-Line Monitoring in Automotive Applications.
IOLTW
José Luis Merino, Sebastià A. Bota, A. Herms, Josep Samitier, Enric Cabruja, Xavier Jordà, Miquel Vellvehí, J. Bausells, A. Ferré, J. Bigorra