Ming Yan

11 papers A* 1Journal 7Unranked 3
YearRankTypeTitle / Venue / Authors
2025 J jnl
Evaluating Spectrum-Based Fault Localization on Deep Learning Libraries.
IEEE Trans. Software Eng.
Ming Yan, Junjie Chen, Tianjie Jiang, Jiajun Jiang, Zan Wang
2025 J jnl
Robustness evaluation of code generation systems via concretizing instructions.
Inf. Softw. Technol.
Ming Yan, Junjie Chen, Jie M. Zhang, Xuejie Cao, Chen Yang, Mark Harman
2024 J jnl
Revisiting deep neural network test coverage from the test effectiveness perspective.
J. Softw. Evol. Process.
Ming Yan, Junjie Chen, Xuejie Cao, Zhuo Wu, Yuning Kang, Zan Wang
2024 J jnl
Stratified random sampling for neural network test input selection.
Inf. Softw. Technol.
Zhuo Wu, Zan Wang, Junjie Chen, Hanmo You, Ming Yan, Lanjun Wang
2023 — conf
Achieving Last-Mile Functional Coverage in Testing Chip Design Software Implementations.
ICSE-SEIP
Ming Yan, Junjie Chen, Hangyu Mao, Jiajun Jiang, Jianye Hao, Xingjian Li, Zhao Tian, Zhichao Chen, Dong Li, Zhangkong Xian, Yanwei Guo, Wulong Liu, Bin Wang, Yuefeng Sun, Yongshun Cui
2023 J jnl
COCO: Testing Code Generation Systems via Concretized Instructions.
CoRR
Ming Yan, Junjie Chen, Jie M. Zhang, Xuejie Cao, Chen Yang, Mark Harman
2022 A* conf
An Empirical Study on Numerical Bugs in Deep Learning Programs.
ASE
Gan Wang, Zan Wang, Junjie Chen, Xiang Chen, Ming Yan
2021 — conf
Exposing numerical bugs in deep learning via gradient back-propagation.
ESEC/SIGSOFT FSE
Ming Yan, Junjie Chen, Xiangyu Zhang, Lin Tan, Gan Wang, Zan Wang
2020 J jnl
Deep Neural Network Test Coverage: How Far Are We?
CoRR
Junjie Chen, Ming Yan, Zan Wang, Yuning Kang, Zhuo Wu
2020 — conf
Deep learning library testing via effective model generation.
ESEC/SIGSOFT FSE
Zan Wang, Ming Yan, Junjie Chen, Shuang Liu, Dongdi Zhang
2020 J jnl
Practical Accuracy Estimation for Efficient Deep Neural Network Testing.
ACM Trans. Softw. Eng. Methodol.
Junjie Chen, Zhuo Wu, Zan Wang, Hanmo You, Lingming Zhang, Ming Yan