| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
J. Circuits Syst. Comput.
|
| 2025 | J | jnl |
Bus. Process. Manag. J.
|
| 2025 | J | jnl |
IEEE Trans. Engineering Management
|
| 2025 | J | jnl |
J. Appl. Probab.
|
| 2024 | J | jnl |
IEEE Access
|
| 2024 | J | jnl |
CoRR
|
| 2024 | J | jnl |
Circuits Syst. Signal Process.
|
| 2024 | J | jnl |
Remote. Sens.
|
| 2024 | — | conf |
ICAI (2)
|
| 2023 | J | jnl |
CoRR
|
| 2023 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2023 | A* | conf |
CHI
|
| 2023 | J | jnl |
CoRR
|
| 2022 | J | jnl |
Microelectron. J.
|
| 2022 | J | jnl |
CoRR
|
| 2022 | J | jnl |
J. Sensors
|
| 2021 | — | conf |
ASICON
|
| 2021 | — | conf |
Semi-superjunction IGBT with floating p-pillar and p-ring for low losses and high breakdown voltage.
ASICON
|
| 2021 | — | conf |
ASICON
|
| 2020 | J | jnl |
IEICE Electron. Express
|
| 2020 | J | jnl |
Optimal Product Substitution and Dual Sourcing Strategy considering Reliability of Production Lines.
Reliab. Eng. Syst. Saf.
|
| 2019 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2018 | J | jnl |
Microelectron. J.
|
| 2018 | J | jnl |
IEICE Electron. Express
|
| 2017 | J | jnl |
Microelectron. Reliab.
|
| 2017 | J | jnl |
Environ. Model. Softw.
|
| 2015 | A* | conf |
AAAI
|
| 2015 | B | conf |
IM
|
| 2015 | J | jnl |
CoRR
|
| 2014 | J | jnl |
Inf. Sci.
|
| 2014 | J | jnl |
IEICE Trans. Fundam. Electron. Commun. Comput. Sci.
|
| 2013 | A | conf |
ICWS
|
| 2011 | J | jnl |
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
|
| 2010 | B | conf |
IWCMC
|
| 2010 | — | conf |
CCNC
|
| 2009 | A | conf |
ICCAD
|
| 2008 | — | conf |
ICC
|
| 2008 | — | conf |
PACIS
|
| 2008 | — | conf |
ICT
|
| 2004 | J | jnl |
J. Inf. Syst. Educ.
|
| 2004 | C | conf |
IGARSS
|
| 2004 | — | conf |
PACIS
|
| 2004 | J | jnl |
Microelectron. J.
|