| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2026 | J | jnl |
Multim. Tools Appl.
|
| 2025 | J | jnl |
Comput. Stat. Data Anal.
|
| 2025 | J | jnl |
CoRR
|
| 2025 | J | jnl |
IEEE Trans. Artif. Intell.
|
| 2025 | J | jnl |
IEEE Trans. Reliab.
|
| 2025 | J | jnl |
CoRR
|
| 2024 | — | conf |
PEAI
|
| 2024 | J | jnl |
IEEE Trans. Pattern Anal. Mach. Intell.
|
| 2024 | J | jnl |
Signal Image Video Process.
|
| 2024 | A* | conf |
ICML
|
| 2024 | C | conf |
IGARSS
|
| 2023 | J | jnl |
Ars Math. Contemp.
|
| 2023 | J | jnl |
Discret. Math.
|
| 2023 | — | conf |
AICS
|
| 2023 | J | jnl |
Int. J. Approx. Reason.
|
| 2023 | J | jnl |
Memetic Comput.
|
| 2023 | A | conf |
SDM
|
| 2023 | J | jnl |
ACM Trans. Knowl. Discov. Data
|
| 2022 | J | jnl |
J. Comput. Appl. Math.
|
| 2022 | J | jnl |
Pattern Recognit.
|
| 2021 | J | jnl |
CoRR
|
| 2021 | A* | conf |
ICDM
|
| 2020 | J | jnl |
Reliab. Eng. Syst. Saf.
|
| 2020 | J | jnl |
CoRR
|
| 2019 | J | jnl |
Int. J. Arts Technol.
|
| 2019 | J | jnl |
Pattern Recognit. Lett.
|
| 2019 | J | jnl |
CoRR
|
| 2018 | J | jnl |
Stat. Comput.
|
| 2017 | J | jnl |
Technometrics
|
| 2017 | J | jnl |
IEEE Trans. Reliab.
|
| 2015 | J | jnl |
Eur. J. Oper. Res.
|
| 2014 | J | jnl |
Qual. Reliab. Eng. Int.
|
| 2014 | J | jnl |
Comput. Ind. Eng.
|
| 2014 | J | jnl |
Comput. Stat. Data Anal.
|
| 2013 | J | jnl |
IEEE Trans. Reliab.
|
| 2011 | J | jnl |
Multim. Tools Appl.
|
| 2011 | J | jnl |
Electron. Mark.
|
| 2011 | J | jnl |
Int. J. Electron. Commer.
|
| 2009 | J | jnl |
J. Assoc. Inf. Sci. Technol.
|
| 2009 | — | conf |
CHI Extended Abstracts
|
| 2009 | — | conf |
CHI Extended Abstracts
|
| 2009 | — | conf |
ASIST
|
| 2009 | J | jnl |
J. Assoc. Inf. Sci. Technol.
|
| 2007 | A* | conf |
WWW
|
| 2007 | Misc | conf |
FLAIRS
|
| 2007 | J | jnl |
Int. J. Web Inf. Syst.
|
| 2007 | — | conf |
CHI Extended Abstracts
|
| 2006 | — | conf |
ASIST
|