Mike W. T. Wong

17 papers Journal 3Unranked 14
YearRankTypeTitle / Venue / Authors
2004 — conf
Design and Implementation of Self-Testable Full Range Window Comparator.
Asian Test Symposium
Mike W. T. Wong, Yubin Zhang
2003 — conf
Issues Related to the Formulation of DFT Solution for Analog Circuit Test Using Equivalent Fault Analysis.
Asian Test Symposium
Mike W. T. Wong
2002 — conf
Analog and Mixed-Signal IP Cores Testing.
DELTA
Mike W. T. Wong, K. Y. Ko, Yim-Shu Lee
2002 — conf
Enhancing The Static D. C. Fault Diagnosis Of A Resistance Temperature Detector Sensor Circuit Using Equivalent Fault Analysis.
DELTA
Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee
2002 — conf
Testing System-On-Chip by Summations of Cores? Test Output Voltages.
Asian Test Symposium
K. Y. Ko, Mike W. T. Wong, Yim-Shu Lee
2001 — conf
The use of equivalent fault analysis to improve static D.C. fault diagnosis - a potentiometric DAC case study.
ETW
Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee
2000 — conf
A Pre-Simulation Measure of D.C. Design-for-Testability Fault Diagnosis Quality.
ISQED
Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee
2000 — conf
Analog circuit equivalent faults in the D.C. domain.
Asian Test Symposium
Matthew Worsman, Mike W. T. Wong, Yim-Shu Lee
2000 — conf
New built-in self-test technique based on addition/subtraction of selected node voltages.
Asian Test Symposium
K. Y. Ko, Mike W. T. Wong
2000 J jnl
Non‐linear analog circuit fault diagnosis with large change sensitivity.
Int. J. Circuit Theory Appl.
Matthew Worsman, Mike W. T. Wong
1998 — conf
DC Nonlinear Circuit Fault Simulation With Large Change Sensitivity.
Asian Test Symposium
Mike W. T. Wong, Matthew Worsman
1998 — conf
Nonlinear circuit fault diagnosis with large change sensitivity.
ICECS
Matthew Worsman, Mike W. T. Wong
1998 J jnl
On concurrent multiple error diagnosability in linear analog circuits using continuous checksum.
Int. J. Circuit Theory Appl.
Yingquan Zhou, Mike W. T. Wong, Yinghua Min
1997 — conf
Design and Implementation of Strongly Code-Disjoint CMOS Built-in Intermediate Voltage Sensor for Totally Self-Checking Circuits.
Asian Test Symposium
Joseph C. W. Pang, Mike W. T. Wong, Yim-Shu Lee
1996 — conf
Efficient Multifrequency Analysis of Fault Diagnosis in Analog Circuits Based on Large Change Sensitivity Computation.
Asian Test Symposium
Tao Wei, Mike W. T. Wong, Yim-Shu Lee
1996 J jnl
Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis.
J. Electron. Test.
Yingquan Zhou, Mike W. T. Wong, Yinghua Min
1995 — conf
Feasibility and Effectiveness of the Algorithm for Overhead Reduction in Analog Checkers.
FTCS
Yingquan Zhou, Mike W. T. Wong, Yinghua Min