Mike Rodgers

16 papers A* 1A 2Misc 4Journal 4Unranked 5
YearRankTypeTitle / Venue / Authors
2006 Misc conf
Session Abstract.
VTS
Ajay Khoche, Mike Rodgers, Pete O'Neil
2004 J jnl
2003 Technology Roadmap for Semiconductors.
Computer
Don Edenfeld, Andrew B. Kahng, Mike Rodgers, Yervant Zorian
2004 J jnl
Linked faults in random access memories: concept, fault models, test algorithms, and industrial results.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers
2003 Misc conf
Detecting Intra-Word Faults in Word-Oriented Memories.
VTS
Said Hamdioui, Ad J. van de Goor, Mike Rodgers
2003 J jnl
Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests.
J. Electron. Test.
Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers
2003 — conf
March SL: A Test For All Static Linked Memory Faults.
Asian Test Symposium
Said Hamdioui, Zaid Al-Ars, Ad J. van de Goor, Mike Rodgers
2002 J jnl
2001 Technology Roadmap for Semiconductors.
Computer
Alan Allan, Don Edenfeld, William H. Joyner Jr., Andrew B. Kahng, Mike Rodgers, Yervant Zorian
2002 Misc conf
Debating the Future of Burn-In.
VTS
Edward J. McCluskey, Subhasish Mitra, Bob Madge, Peter C. Maxwell, Phil Nigh, Mike Rodgers
2002 — conf
March SS: A Test for All Static Simple RAM Faults.
MTDT
Said Hamdioui, Ad J. van de Goor, Mike Rodgers
2001 — conf
Detecting Unique Faults in Multi-port SRAMs.
Asian Test Symposium
Said Hamdioui, Ad J. van de Goor, David Eastwick, Mike Rodgers
2001 Misc conf
ITRS Test Chapter 2001: We'll Tell You What We're Doing, You Tell Us What We Should Be Doing.
VTS
Mike Rodgers
2001 — conf
Realistic Fault Models and Test Procedures for Multi-Port SRAMs.
MTDT
Said Hamdioui, Ad J. van de Goor, David Eastwick, Mike Rodgers
2000 A conf
Defect screening challenges in the Gigahertz/Nanometer age: keeping up with the tails of defect behaviors.
ITC
Mike Rodgers
2000 — conf
March Tests for Realistic Faults in Two-Port Memories.
MTDT
Said Hamdioui, Ad J. van de Goor, Mike Rodgers, David Eastwick
2000 A* conf
Test challenges for deep sub-micron technologies.
DAC
Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik Roy
2000 A conf
Test of Future System-on-Chips.
ICCAD
Yervant Zorian, Sujit Dey, Mike Rodgers