Mick Tegethoff

16 papers A 11Journal 3Unranked 2
YearRankTypeTitle / Venue / Authors
2006 — conf
Not all Delay Tests Are the Same - SDQL Model Shows True-Time.
ATS
Anis Uzzaman, Mick Tegethoff, Bibo Li, Kevin McCauley, Shuji Hamada, Yasuo Sato
2006 A conf
OCI: Open Compression Interface.
ITC
Bruce Cory, Rohit Kapur, Mick Tegethoff, Mark Kassab, Brion L. Keller, Kee Sup Kim, Dwayne Burek, Steven F. Oakland, Benoit Nadeau-Dostie
2004 A conf
An Economic Analysis and ROI Model for Nanometer Test.
ITC
Brion L. Keller, Mick Tegethoff, Thomas Bartenstein, Vivek Chickermane
2001 A conf
A new methodology for improved tester utilization.
ITC
Ajay Khoche, Rohit Kapur, David Armstrong, Thomas W. Williams, Mick Tegethoff, Jochen Rivoir
1999 — conf
Fault Coverage Estimation for Early Stage of VLSI Design.
Great Lakes Symposium on VLSI
Von-Kyoung Kim, Tom Chen, Mick Tegethoff
1997 A conf
ASIC Manufacturing Test Cost Prediction at Early Design Stage.
ITC
Von-Kyoung Kim, Tom Chen, Mick Tegethoff
1997 J jnl
Simulation Techniques for the Manufacturing Test of MCMs.
J. Electron. Test.
Mick Tegethoff, Tom Chen
1996 A conf
ASIC Yield Estimation at Early Design Cycle.
ITC
Von-Kyoung Kim, Mick Tegethoff, Tom Chen
1996 A conf
Issues in Optimizing the Test Process - A Telecom Case Study.
ITC
Felix Frayman, Mick Tegethoff, Brenton White
1996 A conf
Opens Board Test Coverage: When is 99% Really 40%?
ITC
Mick Tegethoff, Kenneth P. Parker, Ken Lee
1996 J jnl
Sensitivity Analysis of Critical Parameters in Board Test.
IEEE Des. Test Comput.
Mick Tegethoff, Tom Chen
1995 J jnl
IEEE Std 1149.1: Where Are We? Where From Here?
IEEE Des. Test Comput.
Mick Tegethoff, Kenneth P. Parker
1994 A conf
Defects, Fault Coverage, Yield and Cost in Board Manufacturing.
ITC
Mick Tegethoff, Tom Chen
1994 A conf
Manufacturing-Test Simulator: A Concurrent-Engineering Tool for Boards and MCMs.
ITC
Mick Tegethoff, Tom Chen
1993 A conf
IEEE 1149.1: How to Justify Implementation.
ITC
Mick Tegethoff
1992 A conf
Board Test DFT Model for Computer Products.
ITC
Mick Tegethoff, T. E. Figal, S. W. Hird