Michél Simon-Najasek

12 papers Journal 8Unranked 4
YearRankTypeTitle / Venue / Authors
2021 — conf
Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under DC and RF Stress.
IRPS
Maximilian Dammann, Martina Baeumler, Tobias Kemmer, Helmer Konstanzer, Peter Brückner, Sebastian Krause, Andreas Graff, Michél Simon-Najasek
2020 — conf
Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling.
IRPS
Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Fabiana Rampazzo, Daniele Marcon, Veronica Gao Zhan, Francesca Chiocchetta, Andreas Graff, Frank Altmann, Michél Simon-Najasek, David Poppitz
2019 — conf
New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis.
IRPS
Norbert Herfurth, Anne Beyreuther, Elham Amini, Christian Boit, Michél Simon-Najasek, Susanne Hübner, Frank Altmann, R. Herfurth, Chen Wu, Ingrid De Wolf, Kris Croes
2018 J jnl
Comparison of reliability of 100 nm AlGaN/GaN HEMTs with T-gate and SAG-gate technology.
Microelectron. Reliab.
Maximilian Dammann, Martina Baeumler, Peter Brückner, Tobias Kemmer, Helmer Konstanzer, Andreas Graff, Michél Simon-Najasek, Rüdiger Quay
2018 — conf
Physical failure analysis methods for wide band gap semiconductor devices.
IRPS
Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann
2017 J jnl
High resolution physical analysis of ohmic contact formation at GaN-HEMT devices.
Microelectron. Reliab.
Andreas Graff, Michél Simon-Najasek, Frank Altmann, Ján Kuzmík, Dagmar Gregusová, S. Hascik, Helmut Jung, T. Baur, Jan Grünenpütt, Hervé Blanck
2017 J jnl
Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications.
Microelectron. Reliab.
Maximilian Dammann, Martina Baeumler, Vladimir Polyakov, Peter Brückner, Helmer Konstanzer, Rüdiger Quay, Michael Mikulla, Andreas Graff, Michél Simon-Najasek
2016 J jnl
Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures.
Microelectron. Reliab.
Mikael Broas, Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann, Helmut Jung, Hervé Blanck
2016 J jnl
Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy.
Microelectron. Reliab.
Sebastian Brand, Michél Simon-Najasek, Michael Kögel, Joerg Jatzkowski, R. Portius, Frank Altmann
2016 J jnl
Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions.
Microelectron. Reliab.
Michél Simon-Najasek, Georg Lorenz, Achim Lindner, Frank Altmann
2014 J jnl
Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures.
Microelectron. Reliab.
Michél Simon-Najasek, Susanne Hübner, Frank Altmann, Andreas Graff
2012 J jnl
Novel techniques for dopant contrast analysis on real IC structures.
Microelectron. Reliab.
Joerg Jatzkowski, Michél Simon-Najasek, Frank Altmann