Michel Mermet-Guyennet

17 papers Journal 16Unranked 1
YearRankTypeTitle / Venue / Authors
2018 — conf
A 100 kW 1.2 kV 20 kHz DC-DC converter prototype based on the Dual Active Bridge topology.
ICIT
Thomas Lagier, Laurent Chedot, François Wallart, Layal Ghossein, Bruno Lefebvre, Piotr Dworakowski, Michel Mermet-Guyennet, Cyril Buttay
2011 J jnl
Analysis of Clamped Inductive Turnoff Failure in Railway Traction IGBT Power Modules Under Overload Conditions.
IEEE Trans. Ind. Electron.
Xavier Perpiñà, Jean-François Serviere, Jesús Urresti-Ibañez, Ignasi Cortés, Xavier Jordà, Salvador Hidalgo, José Rebollo, Michel Mermet-Guyennet
2011 J jnl
Long-Term Reliability of Railway Power Inverters Cooled by Heat-Pipe-Based Systems.
IEEE Trans. Ind. Electron.
Xavier Perpiñà, Xavier Jordà, Miquel Vellvehí, José Rebollo, Michel Mermet-Guyennet
2009 J jnl
Reliability of lead-free solder in power module with stochastic uncertainty.
Microelectron. Reliab.
Alexandre Micol, Carmen Martin, Olivier Dalverny, Michel Mermet-Guyennet, Moussa Karama
2008 J jnl
IGBT module failure analysis in railway applications.
Microelectron. Reliab.
X. Perpiñà, Jean-François Serviere, Xavier Jordà, A. Fauquet, Salvador Hidalgo, Jesús Urresti-Ibañez, José Rebollo, Michel Mermet-Guyennet
2008 J jnl
Performance and reliability testing of modern IGBT devices under typical operating conditions of aeronautic applications.
Microelectron. Reliab.
Jean-Luc Fock Sui Too, B. Chauchat, Patrick Austin, Patrick Tounsi, Michel Mermet-Guyennet, Régis Meuret
2007 J jnl
A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs.
Microelectron. Reliab.
Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, M. Piton, Michel Mermet-Guyennet
2007 J jnl
Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities.
Microelectron. Reliab.
X. Perpiñà, Alberto Castellazzi, M. Piton, Michel Mermet-Guyennet, José Millán
2007 J jnl
Local thermal cycles determination in thermosyphon-cooled traction IGBT modules reproducing mission profiles.
Microelectron. Reliab.
X. Perpiñà, M. Piton, Michel Mermet-Guyennet, Xavier Jordà, José Millán
2007 J jnl
Measurement of the transient junction temperature in MOSFET devices under operating conditions.
Microelectron. Reliab.
Davide Barlini, Mauro Ciappa, Michel Mermet-Guyennet, Wolfgang Fichtner
2007 J jnl
Revisiting power cycling test for better life-time prediction in traction.
Microelectron. Reliab.
Michel Mermet-Guyennet, X. Perpiñà, M. Piton
2007 J jnl
Robustness test and failure analysis of IGBT modules during turn-off.
Microelectron. Reliab.
Jesús Urresti-Ibañez, Alberto Castellazzi, M. Piton, José Rebollo, Michel Mermet-Guyennet, Mauro Ciappa
2007 J jnl
Thermal fatigue effects on the temperature distribution inside IGBT modules for zone engine aeronautical applications.
Microelectron. Reliab.
T. Lhommeau, Xavier Perpiñà, C. Martin, Régis Meuret, Michel Mermet-Guyennet, Moussa Karama
2007 J jnl
Virtual reliability assessment of integrated power switches based on multi-domain simulation approach.
Microelectron. Reliab.
Pierre Solomalala, J. Saiz, Michel Mermet-Guyennet, Alberto Castellazzi, Mauro Ciappa, X. Chauffleur, Jean-Pierre Fradin
2006 J jnl
Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications.
Microelectron. Reliab.
Alberto Castellazzi, Mauro Ciappa, Wolfgang Fichtner, G. Lourdel, Michel Mermet-Guyennet
2006 J jnl
New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions.
Microelectron. Reliab.
Davide Barlini, Mauro Ciappa, Alberto Castellazzi, Michel Mermet-Guyennet, Wolfgang Fichtner
2006 J jnl
Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current.
Microelectron. Reliab.
X. Perpiñà, Jean-François Serviere, J. Saiz, Davide Barlini, Michel Mermet-Guyennet, José Millán