Michel Bosman

14 papers B 1Journal 8Unranked 5
YearRankTypeTitle / Venue / Authors
2020 — conf
Correlation of Dielectric Breakdown and Nanoscale Adhesion in Silicon Dioxide Thin Films.
IRPS
Alok Ranjan, Sean J. O'Shea, Michel Bosman, Joel Molina Reyes, Nagarajan Raghavan, Kin Leong Pey
2018 — conf
Mechanism of soft and hard breakdown in hexagonal boron nitride 2D dielectrics.
IRPS
Alok Ranjan, Nagarajan Raghavan, Sean J. O'Shea, Sen Mei, Michel Bosman, Kalya Shubhakar, Kin Leong Pey
2017 — conf
Adding Interactivity to BalanSAR: a Spatial Augmented Reality Game for Balancing in Physical Education.
CHI PLAY (Companion)
Danica Mast, Michel Bosman, Sylvia Schipper, Samantha Diederiks, Sanne de Vries
2017 B conf
BalanSAR: Using Spatial Augmented Reality to Train Children's Balancing Skills in Physical Education.
TEI
Danica Mast, Michel Bosman, Sylvia Schipper, Sanne de Vries
2016 J jnl
Compliance current dominates evolution of NiSi
Microelectron. Reliab.
Sen Mei, Michel Bosman, Nagarajan Raghavan, Xing Wu, Kin Leong Pey
2016 J jnl
Conductive filament formation at grain boundary locations in polycrystalline HfO
Microelectron. Reliab.
Kalya Shubhakar, Sen Mei, Michel Bosman, Nagarajan Raghavan, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey
2015 J jnl
An SEM/STM based nanoprobing and TEM study of breakdown locations in HfO
Microelectron. Reliab.
Kalya Shubhakar, Michel Bosman, O. A. Neucheva, Y. C. Loke, Nagarajan Raghavan, R. Thamankar, Alok Ranjan, Sean J. O'Shea, Kin Leong Pey
2015 — conf
Monte Carlo model of reset stochastics and failure rate estimation of read disturb mechanism in HfOx RRAM.
IRPS
Nagarajan Raghavan, Daniel D. Frey, Michel Bosman, Kin Leong Pey
2015 J jnl
Probabilistic insight to possibility of new metal filament nucleation during repeated cycling of conducting bridge memory.
Microelectron. Reliab.
Nagarajan Raghavan, Michel Bosman, Kin Leong Pey
2015 — conf
Spectroscopy of SILC trap locations and spatial correlation study of percolation path in the high-κ and interfacial layer.
IRPS
Nagarajan Raghavan, Michel Bosman, Kin Leong Pey
2015 J jnl
Statistics of retention failure in the low resistance state for hafnium oxide RRAM using a Kinetic Monte Carlo approach.
Microelectron. Reliab.
Nagarajan Raghavan, Daniel D. Frey, Michel Bosman, Kin Leong Pey
2014 J jnl
Assessment of read disturb immunity in conducting bridge memory devices - A thermodynamic perspective.
Microelectron. Reliab.
Nagarajan Raghavan, Michel Bosman, Kin Leong Pey
2014 J jnl
Impact of local structural and electrical properties of grain boundaries in polycrystalline HfO
Microelectron. Reliab.
Kalya Shubhakar, Nagarajan Raghavan, Sunil Singh Kushvaha, Michel Bosman, Zhongrui Wang, Sean J. O'Shea, Kin Leong Pey
2014 J jnl
Variability model for forming process in oxygen vacancy modulated high-κ based resistive switching memory devices.
Microelectron. Reliab.
Nagarajan Raghavan, Michel Bosman, Daniel D. Frey, Kin Leong Pey