Michael Nicolaidis

169 papers A 35B 12C 32Misc 21Journal 39Unranked 30
YearRankTypeTitle / Venue / Authors
2023 J jnl
Reducing Power Dissipation in Memory Repair for High Fault Rates.
IEEE Trans. Very Large Scale Integr. Syst.
Panagiota Papavramidou, Michael Nicolaidis
2021 J jnl
The Quest of the Ideal Error Detecting Architecture: The GRAAL Architecture.
IEEE Trans. Sustain. Comput.
Michael G. Dimopoulos, Michael Nicolaidis
2020 J jnl
A Dynamic Sufficient Condition of Deadlock-Freedom for High-Performance Fault-Tolerant Routing in Networks-on-Chips.
IEEE Trans. Emerg. Top. Comput.
Amir Charif, Alexandre Coelho, Nacer-Eddine Zergainoh, Michael Nicolaidis
2020 C conf
An ECC-Based Repair Approach with an Offset-Repair CAM for Mitigating the MBUs Affecting Repair CAM.
IOLTS
Panagiota Papavramidou, Michael Nicolaidis, Patrick Girard
2020 J jnl
Iterative Diagnosis Approach for ECC-Based Memory Repair.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Panagiota Papavramidou, Michael Nicolaidis
2018 A conf
Designing reliable processor cores in ultimate CMOS and beyond: A double sampling solution.
DATE
Thierry Bonnoit, Fraidy Bouesse, Nacer-Eddine Zergainoh, Michael Nicolaidis
2018 J jnl
Reducing Rollback Cost in VLSI Circuits to Improve Fault Tolerance.
IEEE Trans. Very Large Scale Integr. Syst.
Thierry Bonnoit, Nacer-Eddine Zergainoh, Michael Nicolaidis
2017 J jnl
A Framework for Scalable TSV Assignment and Selection in Three-Dimensional Networks-on-Chips.
VLSI Design
Amir Charif, Alexandre Coelho, Nacer-Eddine Zergainoh, Michael Nicolaidis
2017 — conf
Detailed and highly parallelizable cycle-accurate network-on-chip simulation on GPGPU.
ASP-DAC
Amir Charif, Alexandre Coelho, Nacer-Eddine Zergainoh, Michael Nicolaidis
2017 — conf
Low cost rollback to improve fault-tolerance in VLSI circuits.
LASCAS
Thierry Bonnoit, Nacer-Eddine Zergainoh, Michael Nicolaidis, Raoul Velazco
2017 — conf
MINI-ESPADA: A low-cost fully adaptive routing mechanism for Networks-on-Chips.
LATS
Amir Charif, Alexandre Coelho, Nacer-Eddine Zergainoh, Michael Nicolaidis
2017 B conf
Rout3D: A lightweight adaptive routing algorithm for tolerating faulty vertical links in 3D-NoCs.
ETS
Amir Charif, Nacer-Eddine Zergainoh, Alexandre Coelho, Michael Nicolaidis
2016 — conf
A new approach to deadlock-free fully adaptive routing for high-performance fault-tolerant NoCs.
DFT
Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis
2016 B conf
Addressing transient routing errors in fault-tolerant Networks-on-Chips.
ETS
Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis
2016 C conf
Advanced double-sampling architectures.
IOLTS
Michael Nicolaidis, Michael G. Dimopoulos
2016 J jnl
Test Algorithms for ECC-Based Memory Repair in Ultimate CMOS and Post-CMOS.
IEEE Trans. Computers
Panagiota Papavramidou, Michael Nicolaidis
2015 C conf
Low-power memory repair for high defect densities.
IOLTS
Panagiota Papavramidou, Michael Nicolaidis
2015 C conf
MUGEN: A high-performance fault-tolerant routing algorithm for unreliable Networks-on-Chip.
IOLTS
Amir Charif, Nacer-Eddine Zergainoh, Michael Nicolaidis
2015 Misc conf
Memory repair for high defect densities.
VTS
Michael Nicolaidis, Panagiota Papavramidou
2014 B conf
A generic and high-level model of large unreliable NoCs for fault tolerance and performance analysis.
ETS
Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis
2014 B conf
Congestion-Aware Adaptive Routing in 2D-Mesh Multicores.
NCA
Dimiter Avresky, Fabien Chaix, Michael Nicolaidis
2014 J jnl
Fault-tolerant adaptive routing under an unconstrained set of node and link failures for many-core systems-on-chip.
Microprocess. Microsystems
Michael G. Dimopoulos, Yi Gang, Lorena Anghel, Mounir Benabdenbi, Nacer-Eddine Zergainoh, Michael Nicolaidis
2013 J jnl
A Practical Approach to Single Event Transient Analysis for Highly Complex Design.
J. Electron. Test.
Enrico Costenaro, Dan Alexandrescu, Kader Belhaddad, Michael Nicolaidis
2013 Misc conf
An iterative diagnosis approach for ECC-based memory repair.
VTS
Panagiota Papavramidou, Michael Nicolaidis
2013 — conf
Clustering techniques and statistical fault injection for selective mitigation of SEUs in flip-flops.
ISQED
Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Thiago Asis
2013 C conf
Fault-tolerant adaptive routing under permanent and temporary failures for many-core systems-on-chip.
IOLTS
Michael G. Dimopoulos, Yi Gang, Mounir Benabdenbi, Lorena Anghel, Nacer-Eddine Zergainoh, Michael Nicolaidis
2013 Misc conf
Hot topic session 4A: Reliability analysis of complex digital systems.
VTS
Adrian Evans, Michael Nicolaidis, Rob Aitken, Burcin Aktan, Olivier Lauzeral
2013 B conf
Reducing power dissipation in memory repair for high defect densities.
ETS
Panagiota Papavramidou, Michael Nicolaidis
2013 A conf
Reliability challenges of real-time systems in forthcoming technology nodes.
DATE
Said Hamdioui, Michael Nicolaidis, Dimitris Gizopoulos, Arnaud Grasset, Guido Groeseneken, Philippe Bonnot
2013 C conf
Transparent BIST for ECC-based memory repair.
IOLTS
Michael Nicolaidis, Panagiota Papavramidou
2013 J jnl
Using Error Correcting Codes Without Speed Penalty in Embedded Memories: Algorithm, Implementation and Case Study.
J. Electron. Test.
Thierry Bonnoit, Michael Nicolaidis, Nacer-Eddine Zergainoh
2013 B conf
Variability-aware and fault-tolerant self-adaptive applications for many-core chips.
ETS
Gilles Bizot, Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis
2013 C conf
Variability-aware and fault-tolerant self-adaptive applications for many-core chips.
IOLTS
Gilles Bizot, Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis
2012 J jnl
Biologically Inspired Robust Tera-Device Processors.
IEEE Des. Test
Michael Nicolaidis
2012 J jnl
CSL: Configurable Fault Tolerant Serial Links for Inter-die Communication in 3D Systems.
J. Electron. Test.
Vladimir Pasca, Lorena Anghel, Michael Nicolaidis, Mounir Benabdenbi
2012 A conf
Design for test and reliability in ultimate CMOS.
DATE
Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh, Yervant Zorian, Tanay Karnik, Keith A. Bowman, James W. Tschanz, Shih-Lien Lu, Carlos Tokunaga, Arijit Raychowdhury, Muhammad M. Khellah, Jaydeep P. Kulkarni, Vivek De, Dimiter Avresky
2012 C conf
RIIF - Reliability information interchange format.
IOLTS
Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro
2012 Misc conf
Test algorithms for ECC-based memory repair in nanotechnologies.
VTS
Panagiota Papavramidou, Michael Nicolaidis
2012 C conf
Through-silicon-via built-in self-repair for aggressive 3D integration.
IOLTS
Michael Nicolaidis, Vladimir Pasca, Lorena Anghel
2011 — conf
A Practical Approach to Single Event Transients Analysis for Highly Complex Designs.
DFT
Dan Alexandrescu, Enrico Costenaro, Michael Nicolaidis
2011 A conf
A fault-tolerant deadlock-free adaptive routing for on chip interconnects.
DATE
Fabien Chaix, Dimiter Avresky, Nacer-Eddine Zergainoh, Michael Nicolaidis
2011 B conf
Efficient Fault Detection Architecture Design of Latch-Based Low Power DSP/MCU Processor.
ETS
Hai Yu, Michael Nicolaidis, Lorena Anghel, Nacer-Eddine Zergainoh
2011 A conf
Eliminating speed penalty in ECC protected memories.
DATE
Michael Nicolaidis, Thierry Bonnoit, Nacer-Eddine Zergainoh
2011 B conf
I-BIRAS: Interconnect Built-In Self-Repair and Adaptive Serialization in 3D Integrated Systems.
ETS
Michael Nicolaidis, Vladimir Pasca, Lorena Anghel
2011 C conf
Memory BIST with address programmability.
IOLTS
Aymen Fradi, Michael Nicolaidis, Lorena Anghel
2011 B conf
Self-Recovering Parallel Applications in Multi-core Systems.
NCA
Gilles Bizot, Dimiter Avresky, Fabien Chaix, Nacer-Eddine Zergainoh, Michael Nicolaidis
2011 C conf
Towards a tool for implementing delay-free ECC in embedded memories.
ICCD
Thierry Bonnoit, Michael Nicolaidis, Nacer-Eddine Zergainoh
2011 C conf
Variability-aware task mapping strategies for many-cores processor chips.
IOLTS
Fabien Chaix, Gilles Bizot, Michael Nicolaidis, Nacer-Eddine Zergainoh
2010 B conf
Fault-Tolerant Deadlock-Free Adaptive Routing for Any Set of Link and Node Failures in Multi-cores Systems.
NCA
Fabien Chaix, Dimiter Avresky, Nacer-Eddine Zergainoh, Michael Nicolaidis
2010 A conf
Fourth workshop on dependable and secure nanocomputing.
DSN
Jean Arlat, Cristian Constantinescu, Ravishankar K. Iyer, Johan Karlsson, Michael Nicolaidis
2010 C conf
Interconnect Built-In Self-Repair and Adaptive-Serialization (I-BIRAS) for 3D integrated systems.
IOLTS
Michael Nicolaidis, Vladimir Pasca, Lorena Anghel
2009 — conf
An effective approach to detect logic soft errors in digital circuits based on GRAAL.
ISQED
Hai Yu, Michael Nicolaidis, Lorena Anghel
2009 C conf
Enhanced self-configurability and yield in multicore grids.
IOLTS
Eleftherios Kolonis, Michael Nicolaidis, Dimitris Gizopoulos, Mihalis Psarakis, Jacques Henri Collet, Piotr Zajac
2009 A conf
Third workshop on dependable and secure nanocomputing.
DSN
Jean Arlat, Cristian Constantinescu, Ravishankar K. Iyer, Johan Karlsson, Michael Nicolaidis
2009 C conf
Variability and reliability-aware application tasks scheduling and power control (Voltage and Frequency Scaling) in the future nanoscale multiprocessors system on chip.
IOLTS
Gilles Bizot, Nacer-Eddine Zergainoh, Michael Nicolaidis
2008 Misc conf
Low-Cost Highly-Robust Hardened Cells Using Blocking Feedback Transistors.
VTS
Michael Nicolaidis, Renaud Perez, Dan Alexandrescu
2008 A conf
Second workshop on dependable and secure nanocomputing.
DSN
Jean Arlat, Cristian Constantinescu, Ravishankar K. Iyer, Michael Nicolaidis
2008 C conf
Special Session 2: Benchmarking and Standardization in Software-Based SER Characterization: Towards an IEEE Task Force?
IOLTS
Michael Nicolaidis
2008 J jnl
Towards a holistic CAD platform for nanotechnologies.
Microelectron. J.
Eleftherios Kolonis, Michael Nicolaidis
2007 Misc conf
Defects Tolerant Logic Gates for Unreliable Future Nanotechnologies.
IWANN
Lorena Anghel, Michael Nicolaidis
2007 C conf
GRAAL: A Fault-Tolerant Architecture for Enabling Nanometric Technologies.
IOLTS
Michael Nicolaidis
2007 A conf
GRAAL: a new fault tolerant design paradigm for mitigating the flaws of deep nanometric technologies.
ITC
Michael Nicolaidis
2007 A conf
Workshop on Dependable and Secure Nanocomputing.
DSN
Jean Arlat, Ravishankar K. Iyer, Michael Nicolaidis
2006 C conf
A Low-Cost Single-Event Latchup Mitigation Sscheme.
IOLTS
Michael Nicolaidis
2006 B conf
A Transparent based Programmable Memory BIST.
ETS
Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa
2006 C conf
From Nuclear Reaction to System Failures: Can We Address All Levels of Soft Errors Accurately?
IOLTS
Lorena Anghel, Michael Nicolaidis, Nadine Buard
2006 — conf
Multiple Defect Tolerant Devices for Unreliable Future Nanotechnologies.
LATW
Lorena Anghel, Cristiano Lazzari, Michael Nicolaidis
2006 Misc conf
Session Abstract.
VTS
Michael Nicolaidis
2005 A conf
An Efficient BICS Design for SEUs Detection and Correction in Semiconductor Memories.
DATE
Balkaran S. Gill, Michael Nicolaidis, Francis G. Wolff, Christos A. Papachristou, Steven L. Garverick
2005 C conf
Design for Mitigation of Single Event Effects.
IOLTS
Michael Nicolaidis
2005 J jnl
Memory Defect Tolerance Architectures for Nanotechnologies.
J. Electron. Test.
Michael Nicolaidis, Lorena Anghel, Nadir Achouri
2005 A conf
Programmable memory BIST.
ITC
Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa
2005 C conf
Radiation Induced Single-Word Multiple-Bit Upsets Correction in SRAM.
IOLTS
Balkaran S. Gill, Michael Nicolaidis, Christos A. Papachristou
2005 C conf
Simulation and Mitigation of Single Event Effects.
IOLTS
Lorena Anghel, Michael Nicolaidis
2004 Misc conf
A Diversified Memory Built-In Self-Repair Approach for Nanotechnologies.
VTS
Michael Nicolaidis, Nadir Achouri, Lorena Anghel
2004 C conf
Evaluation of Memory Built-in Self Repair Techniques for High Defect Density Technologie.
PRDC
Lorena Anghel, Nadir Achouri, Michael Nicolaidis
2004 J jnl
Simulating Single Event Transients in VDSM ICs for Ground Level Radiation.
J. Electron. Test.
Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis
2003 — conf
A Memory Built-In Self-Repair for High Defect Densities Based on Error Polarities.
DFT
Michael Nicolaidis, Nadir Achouri, Lorena Anghel
2003 J jnl
Carry checking/parity prediction adders and ALUs.
IEEE Trans. Very Large Scale Integr. Syst.
Michael Nicolaidis
2003 A conf
Dynamic Data-bit Memory Built-In Self- Repair.
ICCAD
Michael Nicolaidis, Nadir Achouri, Slimane Boutobza
2003 C conf
Memory Built-In Self-Repair for Nanotechnologies.
IOLTS
Michael Nicolaidis, Nadir Achouri, Lorena Anghel
2003 A conf
Optimal Reconfiguration Functions for Column or Data-bit Built-In Self-Repair.
DATE
Michael Nicolaidis, Nadir Achouri, Slimane Boutobza
2003 A conf
Reliability Threats in VDSM - Shortcomings in Conventional Test and Fault-Tolerance Alternatives.
ITC
Michael Nicolaidis
2002 J jnl
Embedded Robustness IPs for Transient-Error-Free ICs.
IEEE Des. Test Comput.
Eric Dupont, Michael Nicolaidis, Peter Rohr
2002 A conf
Embedded Robustness Ips.
DATE
Eric Dupont, Michael Nicolaidis, Peter Rohr
2002 J jnl
Guest Editorial.
J. Electron. Test.
Dimitris Nikolos, John P. Hayes, Michael Nicolaidis, Cecilia Metra
2002 A conf
IP for Embedded Robustness.
DATE
Michael Nicolaidis
2002 — conf
New Methods for Evaluating the Impact of Single Event Transients in VDSM ICs.
DFT
Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis
2002 A conf
Robustness IPs for Reliability and Security of SoCs.
ITC
Eric Dupont, Michael Nicolaidis
2002 — conf
Simulating Single Event Transients in VDSM ICs for Ground Level Radiation.
LATW
Dan Alexandrescu, Lorena Anghel, Michael Nicolaidis
2002 — conf
Soft Error Protection for Embedded Memories.
MTDT
Michael Nicolaidis
2001 — conf
Designing and Implementing Efficient BISR Techniques for Embedded RAMs.
LATW
Michael Nicolaidis, Slimane Boutobza, Nadir Achouri, R. D. Shawn Blanton, Julie Segal, David Y. Lepejian, Ben Chu, Tony Singh, Harvey Berman
2001 — conf
Fail-Safe Synchronization Circuit for Duplicated Systems.
DFT
Eleftherios Kolonis, Michael Nicolaidis
2001 Misc conf
Soft Errors and Tolerance for Soft Errors.
VTS
Jim Chung, N. Derhacobian, Jean Gasiot, Michael Nicolaidis, David Towne, Raoul Velazco
2000 A conf
Cost Reduction and Evaluation of a Temporary Faults Detecting Technique.
DATE
Lorena Anghel, Michael Nicolaidis
2000 — conf
Evaluation of a Soft Error Tolerance Technique Based on Time and/or Space Redundancy.
SBCCI
Lorena Anghel, Dan Alexandrescu, Michael Nicolaidis
2000 — conf
ISIS: A Fail-Safe Interface Realized in Smart Power Technology.
IOLTW
Michael Nicolaidis, N. Zaidan, Th. Calin, D. Bied-Charreton
2000 — conf
On-Line BIST for Testing Analog Circuits.
LATW
Jaime Velasco-Medina, Iyad Rayane, Michael Nicolaidis
2000 Misc conf
Self-Checking Circuits versus Realistic Faults in Very Deep Submicron.
VTS
Lorena Anghel, Michael Nicolaidis, Issam Alzaher-Noufal
2000 A conf
Tutorial Statement.
DATE
Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Y. Lepejian, Chris W. H. Strolenberg, Kees Veelenturf
1999 A conf
A CAD Framework for Generating Self-Checking 1 Multipliers Based on Residue Codes.
DATE
Issam Alzaher-Noufal, Michael Nicolaidis
1999 Misc conf
A Digital BIST for Operational Amplifiers Embedded in Mixed-Signal Circuits.
VTS
Iyad Rayane, Jaime Velasco-Medina, Michael Nicolaidis
1999 C conf
A New Placement Algorithm Dedicated to Parallel Computers: Bases and Application.
PRDC
Fabien Clermidy, Thierry Collette, Michael Nicolaidis
1999 A conf
A One-Bit-Signature BIST for Embedded Operational Amplifiers in Mixed-Signal Circuits Based on the Slew-Rate Detection.
DATE
Iyad Rayane, Jaime Velasco-Medina, Michael Nicolaidis
1999 Misc conf
Built-In Current Sensor for IDDQ Testing in Deep Submicron CMOS.
VTS
Th. Calin, Lorena Anghel, Michael Nicolaidis
1999 J jnl
Fault-Secure Parity Prediction Booth Multipliers.
IEEE Des. Test Comput.
Michael Nicolaidis, Ricardo de Oliveira Duarte
1999 J jnl
Guest Editorial.
J. Electron. Test.
Michael Nicolaidis, Rob Roy
1999 — conf
On Path Delay Fault Testing of Multiplexer - Based Shifters.
Great Lakes Symposium on VLSI
Haridimos T. Vergos, Dimitris Nikolos, Y. Tsiatouhas, Th. Haniotakis, Michael Nicolaidis
1999 C conf
On-Line BIST for Testing Analog Circuits.
ICCD
Jaime Velasco-Medina, Iyad Rayane, Michael Nicolaidis
1999 A conf
Scaling Deeper to Submicron: On-Line Testing to the Rescue.
DATE
Michael Nicolaidis, Yervant Zorian
1999 Misc conf
Time Redundancy Based Soft-Error Tolerance to Rescue Nanometer Technologies.
VTS
Michael Nicolaidis
1998 — conf
An Approach to the On-Line Testing of Operational Amplifiers.
Asian Test Symposium
Jaime Velasco-Medina, Marcelo Lubaszewski, Michael Nicolaidis
1998 C conf
Current-based testing for analog and mixed-signal circuits.
ICCD
Jaime Velasco-Medina, Michael Nicolaidis
1998 A conf
Design for soft-error robustness to rescue deep submicron scaling.
ITC
Michael Nicolaidis
1998 A conf
Design of Fault-Secure Parity-Prediction Booth Multipliers.
DATE
Michael Nicolaidis, Ricardo de Oliveira Duarte
1998 J jnl
Efficient Totally Self-Checking Shifter Design.
J. Electron. Test.
Ricardo de Oliveira Duarte, Michael Nicolaidis, Hakim Bederr, Yervant Zorian
1998 J jnl
Fail-Safe Interfaces for VLSI: Theoretical Foundations and Implementation.
IEEE Trans. Computers
Michael Nicolaidis
1998 A conf
Fault Detection for Linear Analog Circuits Using Current Injection.
DATE
Jaime Velasco-Medina, Th. Calin, Michael Nicolaidis
1998 J jnl
Guest Editors' Introduction: Online VLSI Testing.
IEEE Des. Test Comput.
Ramesh Karri, Michael Nicolaidis
1998 J jnl
On-Line Testing for VLSI - A Compendium of Approaches.
J. Electron. Test.
Michael Nicolaidis, Yervant Zorian
1998 J jnl
On-line testing for VLSI: state of the art and trends.
Integr.
Michael Nicolaidis
1998 A conf
Scaling Deeper to Submicron: On-Line Testing to the Rescue.
ITC
Michael Nicolaidis
1997 J jnl
Fault-Secure Parity Prediction Arithmetic Operators.
IEEE Des. Test Comput.
Michael Nicolaidis, Ricardo de Oliveira Duarte, Salvador Manich, Joan Figueras
1997 — conf
Fault-secure shifter design: results and implementations.
ED&TC
Ricardo de Oliveira Duarte, Michael Nicolaidis, Hakim Bederr, Yervant Zorian
1997 A conf
On-Line Testing for VLSI.
ITC
Michael Nicolaidis
1996 — conf
Achieving Fault Secureness in Parity Prediction Arithmetic Operators: General Conditions and Implementations.
ED&TC
Michael Nicolaidis, Salvador Manich, Joan Figueras
1996 Misc conf
Can Defect-Tolerant Chips Better Meet the Quality Challenge?
VTS
R. L. Campbell, P. Kuekes, David Y. Lepejian, Wojciech P. Maly, Michael Nicolaidis, Alex Orailoglu
1996 — conf
E-Groups: A New Technique for Fast Backward Propagation in System Level Test Generation.
Asian Test Symposium
Michael Nicolaidis, Rubin A. Parekhji, M. Boudjit
1996 Misc conf
Enhancing realistic fault secureness in parity prediction array arithmetic operators by I
VTS
Salvador Manich, Michael Nicolaidis, Joan Figueras
1996 J jnl
Theory of Transparent BIST for RAMs.
IEEE Trans. Computers
Michael Nicolaidis
1995 J jnl
A strongly code disjoint built-in current sensor for strongly fault-secure static CMOS realizations.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jien-Chung Lo, James C. Daly, Michael Nicolaidis
1995 Misc conf
A tool for automatic generation of self-checking data paths.
VTS
B. Hamdi, Hakim Bederr, Michael Nicolaidis
1995 A conf
An Approach for Designing Total-Dose Tolerant MCMs Based on Current Monitoring.
ITC
Fabian Vargas, Michael Nicolaidis, Yervant Zorian
1995 C conf
Analytic approach for error masking elimination in on-line multipliers.
IEEE Symposium on Computer Arithmetic
Hakim Bederr, Michael Nicolaidis, Alain Guyot
1995 — conf
Area versus detection latency trade-offs in self-checking memory design.
ED&TC
O. Kebichi, Yervant Zorian, Michael Nicolaidis
1995 J jnl
Efficient UBIST implementation for microprocessor sequencing parts.
J. Electron. Test.
Michael Nicolaidis
1995 A conf
Exact Aliasing Computation for RAM BIST.
ITC
O. Kebichi, Michael Nicolaidis, Vyacheslav N. Yarmolik
1995 J jnl
Testing complex couplings in multiport memories.
IEEE Trans. Very Large Scale Integr. Syst.
Michael Nicolaidis, Vladimir Castro Alves, Hakim Bederr
1995 A conf
Upset-Tolerant CMOS SRAM Using Current Monitoring: Prototype and Test Experiments.
ITC
Th. Calin, F. L. Vargas, Michael Nicolaidis
1994 B conf
A Test Methodology Applied to Cellular Logic Programmable Gate Arrays.
FPL
Ricardo de Oliveira Duarte, Michael Nicolaidis
1994 A conf
Aliasing-free Signature Analysis for RAM BIST.
ITC
Vyacheslav N. Yarmolik, Michael Nicolaidis, O. Kebichi
1994 Misc conf
Design for testability of on-line multipliers.
VTS
Hakim Bederr, Michael Nicolaidis, Alain Guyot
1994 — conf
Efficient Implementations of Self-Checking Multiply and Divide Arrays.
EDAC-ETC-EUROASIC
Michael Nicolaidis, Hakim Bederr
1994 Misc conf
Efficient UBIST for RAMs.
VTS
Michael Nicolaidis
1994 J jnl
Fault secure property versus strongly code disjoint checkers.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Michael Nicolaidis
1994 — conf
SEU-Tolerant SRAM Design Based on Current Monitoring.
FTCS
F. L. Vargas, Michael Nicolaidis
1994 J jnl
Trade-offs in scan path and BIST implementations for RAMs.
J. Electron. Test.
Michael Nicolaidis, O. Kebichi, Vladimir Castro Alves
1994 J jnl
Zero aliasing ROM BIST.
J. Electron. Test.
O. Kebichi, Vyacheslav N. Yarmolik, Michael Nicolaidis
1993 — conf
Efficient Implementations of Self-Checking Adders and ALUs.
FTCS
Michael Nicolaidis
1993 Misc conf
Finitely self-checking circuits and their application on current sensors.
VTS
Michael Nicolaidis
1993 C conf
Quiescent Current Monitoring to Improve the Reliability of Electronic Systems in Space Radiation Environments.
ICCD
F. L. Vargas, Michael Nicolaidis, Bernard Courtois
1993 Misc conf
Quiescent current estimation based on quality requirements.
VTS
Fabian Luis Vargas, Michael Nicolaidis, B. Hamdi
1992 C conf
A Tool for Automatic Generation of BISTed and Transparent BISTed Rams.
ICCD
O. Kebichi, Michael Nicolaidis
1992 J jnl
An SFS Berger check prediction ALU and its application to self-checking processor designs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Jien-Chung Lo, Suchai Thanawastien, T. R. N. Rao, Michael Nicolaidis
1992 — conf
Design of Static CMOS Self-Checking Circuits using Built-In Current Sensing.
FTCS
Jien-Chung Lo, James C. Daly, Michael Nicolaidis
1992 Misc conf
Improving the theory of truth table verification of iterative logic arrays.
VTS
Michael Nicolaidis
1992 A conf
Transparent BIST for RAMs.
ITC
Michael Nicolaidis
1991 — conf
A self-checking PLA automatic generator tool based on unordered codes encoding.
EURO-DAC
Kholdoun Torki, Michael Nicolaidis, Antônio Otávio Fernandes
1991 A conf
Built-In Self-Test for Multi-Port RAMs.
ICCAD
Vladimir Castro Alves, Michael Nicolaidis, P. Lestrat, Bernard Courtois
1991 C conf
New Implementations, Tools, and Experiments for Decreasing Self-Checking PLAs Area Overhead.
ICCD
Michael Nicolaidis, M. Boudjit
1991 J jnl
Shorts in self-checking circuits.
J. Electron. Test.
Michael Nicolaidis
1991 J jnl
Silicon compilation of hierarchical control sections with unified BIST testability.
Microprocess. Microsystems
Michael Nicolaidis, Kholdoun Torki, Ahmed Amine Jerraya, Bernard Courtois
1990 A conf
Efficient UBIST implementation for microprocessor sequencing parts.
ITC
Michael Nicolaidis
1989 — conf
A generalized theory of fail-safe systems.
FTCS
Michael Nicolaidis, Serge Noraz, Bernard Courtois
1989 J jnl
Self-checking logic arrays.
Microprocess. Microsystems
Michael Nicolaidis, Bernard Courtois
1989 J jnl
Self-exercising checkers for unified built-in self-test (UBIST).
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Michael Nicolaidis
1988 — conf
A unified built-in-test scheme: UBIST.
FTCS
Michael Nicolaidis
1988 J jnl
Strongly Code Disjoint Checkers.
IEEE Trans. Computers
Michael Nicolaidis, Bernard Courtois
1988 C conf
UBIST version of the SYCO's control section compiler.
ICCD
Kholdoun Torki, Michael Nicolaidis, Ahmed Amine Jerraya, Bernard Courtois