Michael Mateja

13 papers A 5B 1Misc 1Journal 3Unranked 3
YearRankTypeTitle / Venue / Authors
2012 J jnl
Scan-Based Speed-Path Debug for a Microprocessor.
IEEE Des. Test Comput.
Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang
2010 — conf
Correlating system test Fmax with structural test Fmax and process monitoring measurements.
ASP-DAC
Janine Chen, Jing Zeng, Li-C. Wang, Michael Mateja
2010 A conf
Mining AC delay measurements for understanding speed-limiting paths.
ITC
Janine Chen, Brendon Bolin, Li-C. Wang, Jing Zeng, Dragoljub Gagi Drmanac, Michael Mateja
2010 — conf
On evaluating speed path detection of structural tests.
ISQED
Jing Zeng, Jing Wang, Chia-Ying Chen, Michael Mateja, Li-C. Wang
2010 B conf
Scan based speed-path debug for a microprocessor.
ETS
Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang, Kun-Han Tsai, Ken Amstutz
2010 Misc conf
Selecting the most relevant structural Fmax for system Fmax correlation.
VTS
Janine Chen, Jing Zeng, Li-C. Wang, Jeff Rearick, Michael Mateja
2009 — conf
A Path-Oriented Timing-Aware Diagnosis Methodology of At-Speed Transition Tests.
MTV
Jing Zeng, Jing Wang, Michael Mateja
2009 A conf
Data learning techniques and methodology for Fmax prediction.
ITC
Janine Chen, Li-C. Wang, Po-Hsien Chang, Jing Zeng, S. Yu, Michael Mateja
2008 A conf
The Test Features of the Quad-Core AMD Opteron- Microprocessor.
ITC
Tim Wood, Grady Giles, Chris Kiszely, Martin Schuessler, Daniela Toneva, Joel Irby, Michael Mateja
2000 J jnl
Test Development for a Third-Version ColdFire Microprocessor.
IEEE Des. Test Comput.
Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran
1999 A conf
The testability features of the 3rd generation ColdFire family of microprocessors.
ITC
Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran
1998 J jnl
Test Development for Second-Generation ColdFire Microprocessors.
IEEE Des. Test Comput.
Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja
1997 A conf
A Case Study of the Test Development for the 2nd Generation ColdFire® Microprocessors.
ITC
Michael Mateja, Alfred L. Crouch, Renny Eisele, Grady Giles, Dale Amason