Michael J. Uren

14 papers Journal 11Unranked 3
YearRankTypeTitle / Venue / Authors
2023 — conf
Dielectric Thickness and Fin Width Dependent OFF-State Degradation in AlGaN/GaN SLCFETs.
IRPS
Akhil S. Kumar, Michael J. Uren, Matthew D. Smith, Martin Kuball, Justin Parke, H. George Henry, Robert S. Howell
2020 — conf
Current collapse and kink effect in GaN RF HEMTs: the key role of the epitaxial buffer.
BCICTS
Michael J. Uren, Martin Kuball
2018 J jnl
On the origin of dynamic R
Microelectron. Reliab.
Serge Karboyan, Michael J. Uren, Manikant, James W. Pomeroy, Martin Kuball
2017 J jnl
Morphological and electrical comparison of Ti and Ta based ohmic contacts for AlGaN/GaN-on-SiC HFETs.
Microelectron. Reliab.
Alexander Pooth, Johan Bergsten, Niklas Rorsman, Hassan Hirshy, R. Perks, Paul J. Tasker, Trevor Martin, Richard F. Webster, Dave Cherns, Michael J. Uren, Martin Kuball
2017 — conf
Temperature dependent substrate trapping in AlGaN/GaN power devices and the impact on dynamic ron.
ESSDERC
Arno Stockman, Michael J. Uren, Alaleh Tajalli, Matteo Meneghini, Benoit Bakeroot, Peter Moens
2015 J jnl
Operating channel temperature in GaN HEMTs: DC versus RF accelerated life testing.
Microelectron. Reliab.
James W. Pomeroy, Michael J. Uren, Benoit Lambert, Martin Kuball
2015 J jnl
Study of hot electrons in AlGaN/GaN HEMTs under RF Class B and Class J operation using electroluminescence.
Microelectron. Reliab.
Tommaso Brazzini, Michael A. Casbon, Huarui Sun, Michael J. Uren, Jonathan Lees, Paul J. Tasker, Helmut Jung, Hervé Blanck, Martin Kuball
2014 J jnl
Implications of gate-edge electric field in AlGaN/GaN high electron mobility transistors during OFF-state degradation.
Microelectron. Reliab.
Huarui Sun, Miguel Montes Bajo, Michael J. Uren, Martin Kuball
2014 J jnl
Liquid crystal electrography: Electric field mapping and detection of peak electric field strength in AlGaN/GaN high electron mobility transistors.
Microelectron. Reliab.
Janina Möreke, Chris Hodges, Laura L. E. Mears, Michael J. Uren, Robert M. Richardson, Martin Kuball
2012 J jnl
Development of an RF IV waveform based stress test procedure for use on GaN HFETs.
Microelectron. Reliab.
William McGenn, Michael J. Uren, Johannes Benedikt, Paul J. Tasker
2003 J jnl
Low frequency drain noise comparison of AlGaN/GaN HEMT's grown on silicon, SiC and sapphire substrates.
Microelectron. Reliab.
Arnaud Curutchet, Nathalie Malbert, Nathalie Labat, André Touboul, Christophe Gaquière, A. Minko, Michael J. Uren
2001 J jnl
A physically based compact model of partially depleted SOI MOSFETs for analog circuit simulation.
IEEE J. Solid State Circuits
Mike S. L. Lee, Bernard M. Tenbroek, William Redman-White, James Benson, Michael J. Uren
1999 J jnl
A multibit ΣΔ modulator in floating-body SOS/SOI CMOS for extreme radiation environments.
IEEE J. Solid State Circuits
Christopher F. Edwards, William Redman-White, Mark Bracey, Bernard M. Tenbroek, Michael S. L. Lee, Michael J. Uren
1998 J jnl
Impact of self-heating and thermal coupling on analog circuits in SOI CMOS.
IEEE J. Solid State Circuits
Bernard M. Tenbroek, Michael S. L. Lee, William Redman-White, R. John T. Bunyan, Michael J. Uren