Michael Hassoun

15 papers Misc 8Journal 7
YearRankTypeTitle / Venue / Authors
2026 J jnl
Two-phase inspection policies on an imperfect metrology tool.
Eur. J. Oper. Res.
Stéphane Dauzère-Pérès, Michael Hassoun
2024 Misc conf
Analyzing the Trade-Off Between Quality and Sojourn Time When Optimizing Sampling Plans in Semiconductor Manufacturing.
WSC
Stéphane Dauzère-Pérès, Michael Hassoun
2024 J jnl
The newsvendor problem with GHG emissions from waste disposal under cap-and-trade regulation.
Int. J. Prod. Res.
Jean-Philippe Gayon, Michael Hassoun
2023 J jnl
On the right combination of altruism and randomness in the motion of homogeneous distributed autonomous agents.
Nat. Comput.
Michael Hassoun, Evgeny Kagan
2020 J jnl
A Lagrangian heuristic for minimising risk using multiple heterogeneous metrology tools.
Int. J. Prod. Res.
Stéphane Dauzère-Pérès, Michael Hassoun, Alejandro Sendón
2020 Misc conf
Integrating Critical Queue Time Constraints Into SMT2020 Simulation Models.
WSC
Denny Kopp, Michael Hassoun, Adar Kalir, Lars Mönch
2020 J jnl
On the importance of variability when managing metrology capacity.
Eur. J. Oper. Res.
Stéphane Dauzère-Pérès, Michael Hassoun
2020 J jnl
The single line moving target traveling salesman problem with release times.
Ann. Oper. Res.
Michael Hassoun, Shraga Shoval, Eran Simchon, Liron Yedidsion
2019 Misc conf
A New High-Volume/Low-Mix Simulation Testbed for Semiconductor Manufacturing.
WSC
Michael Hassoun, Denny Kopp, Lars Mönch, Adar Kalir
2017 Misc conf
Towards a new simulation testbed for semiconductor manufacturing.
WSC
Michael Hassoun, Adar Kalir
2016 Misc conf
Optimizing capacity assignment of multiple identical metrology tools.
WSC
Stéphane Dauzère-Pérès, Michael Hassoun, Alejandro Sendón
2015 J jnl
Setting defect charts control limits to balance cycle time and yield for a tandem production line.
Comput. Oper. Res.
Miri Gilenson, Michael Hassoun, Liron Yedidsion
2014 Misc conf
Setting quality control requirements to balance between cycle time and yield inasemiconductor production line.
WSC
Miri Gilenson, Liron Yedidsion, Michael Hassoun
2013 Misc conf
Prediction of product layer cycle time using data mining.
WSC
Michael Hassoun
2012 Misc conf
Setting quality control requirements to balance cycle time and yield: the single machine case.
WSC
Miri Gilenson, Liron Yedidsion, Michael Hassoun