Michael Goroll

11 papers Journal 11
YearRankTypeTitle / Venue / Authors
2014 J jnl
Acoustic detection of micro-cracks in small electronic devices.
Microelectron. Reliab.
Georg Michael Reuther, Reinhard Pufall, Michael Goroll
2012 J jnl
Degradation of moulding compounds during highly accelerated stress tests - A simple approach to study adhesion by performing button shear tests.
Microelectron. Reliab.
Reinhard Pufall, Michael Goroll, Joachim Mahler, Werner Kanert, M. Bouazza, Olaf Wittler, Rainer Dudek
2012 J jnl
Determination of adhesion and delamination prediction for semiconductor packages by using Grey Scale Correlation and Cohesive Zone Modelling.
Microelectron. Reliab.
Michael Goroll, Reinhard Pufall
2010 J jnl
New aspects in characterization of adhesion of moulding compounds on different surfaces by using a simple button-shear-test method for lifetime prediction of power devices.
Microelectron. Reliab.
Michael Goroll, Reinhard Pufall
2008 J jnl
NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique.
Microelectron. Reliab.
Stefano Aresu, Reinhard Pufall, Michael Goroll, Wolfgang Gustin
2008 J jnl
New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure.
Microelectron. Reliab.
Michael Goroll, Reinhard Pufall, Stefano Aresu, Wolfgang Gustin
2008 J jnl
Reduction of test effort. Looking for more acceleration for reliable components for automotive applications.
Microelectron. Reliab.
Reinhard Pufall, Werner Kanert, Stefano Aresu, Michael Goroll
2007 J jnl
Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices.
Microelectron. Reliab.
Michael Goroll, Werner Kanert, Reinhard Pufall, Stefano Aresu
2007 J jnl
Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors.
Microelectron. Reliab.
Stefano Aresu, Werner Kanert, Reinhard Pufall, Michael Goroll
2006 J jnl
ESD protection structure qualification - a new approach for release for automotive applications.
Microelectron. Reliab.
Michael Goroll, Werner Kanert, Reinhard Pufall
2004 J jnl
Semiconductors in high temperature applications - a future trend in automotive industry.
Microelectron. Reliab.
Michael Goroll, Reinhard Pufall, Werner Kanert, Boris Plikat