Michael Glavanovics

12 papers C 2Journal 8Unranked 2
YearRankTypeTitle / Venue / Authors
2023 — conf
A common hard-failure mechanism in GaN HEMTs in accelerated switching and single-pulse short-circuit tests.
IRPS
D. Wieland, Sybille Ofner, Manuel Stabentheiner, Boris Butej, Christian Koller, J. Sun, Andrea Minetto, Korbinian Reiser, Oliver Häberlen, Michael Nelhiebel, Michael Glavanovics, Dionyz Pogany, Clemens Ostermaier
2015 C conf
Executable test definition for a state machine driven embedded test controller module.
INDIN
Benjamin Steinwender, Michael Glavanovics, Wilfried Elmenreich
2013 C conf
Distributed power semiconductor stress test & measurement architecture.
INDIN
Benjamin Steinwender, Sascha Einspieler, Michael Glavanovics, Wilfried Elmenreich
2012 J jnl
Modeling of highly anisotropic microstructures for electro-thermal simulations of power semiconductor devices.
Microelectron. Reliab.
Stefano de Filippis, Helmut Köck, Michael Nelhiebel, Vladimír Kosel, Stefan Decker, Michael Glavanovics, Andrea Irace
2011 J jnl
A reliable technology concept for active power cycling to extreme temperatures.
Microelectron. Reliab.
Michael Nelhiebel, Robert Illing, Christoph Schreiber, S. Wöhlert, S. Lanzerstorfer, Markus Ladurner, C. Kadow, Stefan Decker, Donald Dibra, H. Unterwalcher, M. Rogalli, W. Robl, T. Herzig, M. Poschgan, M. Inselsbacher, Michael Glavanovics, Sylvain Fraïssé
2011 J jnl
Applying Bayesian mixtures-of-experts models to statistical description of smart power semiconductor reliability.
Microelectron. Reliab.
Olivia Bluder, Michael Glavanovics, Jürgen Pilz
2011 J jnl
Improved thermal management of low voltage power devices with optimized bond wire positions.
Microelectron. Reliab.
Helmut Köck, Christian Djelassi, Stefano de Filippis, Robert Illing, Michael Nelhiebel, Markus Ladurner, Michael Glavanovics, Dionyz Pogany
2010 J jnl
Non-linear thermal modeling of DMOS transistor and validation using electrical measurements and FEM simulations.
Microelectron. J.
Vladimír Kosel, Robert Illing, Michael Glavanovics, Alexander Satka
2009 J jnl
IR thermography and FEM simulation analysis of on-chip temperature during thermal-cycling power-metal reliability testing using in situ heated structures.
Microelectron. Reliab.
Helmut Köck, Vladimír Kosel, Christian Djelassi, Michael Glavanovics, Dionyz Pogany
2009 — conf
System level modeling of smart power switches using SystemC-AMS for digital protection concept verification.
BMAS
Hans-Peter Kreuter, Vladimír Kosel, Michael Glavanovics, Robert Illing
2007 J jnl
Flexible active cycle stress testing of smart power switches.
Microelectron. Reliab.
Michael Glavanovics, Helmut Köck, Vladimír Kosel, Tobias Smorodin
2004 J jnl
Analysis of wire bond and metallization degradation mechanisms in DMOS power transistors stressed under thermal overload conditions.
Microelectron. Reliab.
Thomas Detzel, Michael Glavanovics, Karin Weber