Michael G. Pecht

250 papers A 1B 1C 3Misc 2Journal 216Unranked 27
YearRankTypeTitle / Venue / Authors
2026 J jnl
A fault mechanism-guided interpretable causal disentanglement domain generalization detection method for typical faults of induction motor.
Adv. Eng. Informatics
You He, Xinwei Zhao, Lei Su, Jiefei Gu, Ke Li, Michael G. Pecht
2026 J jnl
Impact-Based Maintenance Efficiency Modeling for Multi-Component Systems With Condition-Based Component Selection.
IEEE Access
Lamia May, Mohamed Arezki Mellal, Sameer Al-Dahidi, Michael G. Pecht, Youcef Khelfaoui
2025 J jnl
An Adaptive Online Diagnosis and Prognosis Approach for Digital Circuits.
IEEE Access
Huwei Dong, Michael H. Azarian, Michael G. Pecht
2025 J jnl
Analysis of Standards-Based Counterfeit Microelectronics Detection Methods.
IEEE Access
Devon R. Richman, Michael H. Azarian, Diganta Das, Michael G. Pecht
2025 J jnl
Experimental verification of lithium-ion battery prognostics based on an interacting multiple model particle filter.
Trans. Inst. Meas. Control
Shuai Wang, Wei Han, Lifei Chen, Xiaochen Zhang, Michael G. Pecht
2025 J jnl
High-Dimensional Radio Frequency Fingerprint Synthesis for Indoor Positioning.
IEEE Trans. Instrum. Meas.
Zhongyuan Lyu, Tom Tak-Lam Chan, Gary C. M. Leung, Yui-Lam Chan, Daniel Pak-Kong Lun, Michael G. Pecht
2025 J jnl
How the Risk of Tin Whiskers Affects Design Decisions: Is the Aerospace and Defense Approach to Tin Whiskers the Right Approach.
IEEE Access
Michael G. Pecht, Michael D. Osterman, Edwin C. Tinsley, Chang Lu
2025 J jnl
Reliability analysis for multi-component system considering failure propagation and dependent competing failure process.
Reliab. Eng. Syst. Saf.
Hao Lyu, Zhihang Li, Xuehang Qiao, Bing Lu, Hualong Xie, Michael G. Pecht
2025 J jnl
Reliability and Economic Assessment of Integrated Distributed Hybrid Generation and Battery Storage for Base Transceiver Stations in Intermittent Utility Grids.
IEEE Access
Huzaifa Rauf, Hassan Abbas Khan, Muhammad Waqas Khalid, Naveed Arshad, Michael G. Pecht
2025 J jnl
Semi-supervised dual-constraint centroid contrastive prototypical network for flip chip defect detection under limited labeled data.
Eng. Appl. Artif. Intell.
Yunxia Lou, Lei Su, Jiefei Gu, Xinwei Zhao, Ke Li, Michael G. Pecht
2024 J jnl
A meta transfer learning-driven few-shot fault diagnosis method for combine harvester gearboxes.
Comput. Electron. Agric.
Daoming She, Zhichao Yang, Yudan Duan, Michael G. Pecht
2024 J jnl
Category-level selective dual-adversarial network using significance-augmented unsupervised domain adaptation for surface defect detection.
Expert Syst. Appl.
Siyu Zhang, Lei Su, Jiefei Gu, Ke Li, Weitian Wu, Michael G. Pecht
2024 J jnl
Corrections to "Water-Resistant Smartphone Technologies".
IEEE Access
Quanqing Yu, Rui Xiong, Chuan Li, Michael G. Pecht
2024 J jnl
Flip-chip solder bumps defect detection using a self-search lightweight framework.
Adv. Eng. Informatics
Yu Sun, Lei Su, Jiefei Gu, Xinwei Zhao, Ke Li, Michael G. Pecht
2024 J jnl
Search for a Dual-Convergence Sparse Feature Extractor With Visualization Vibration Signals Architecture Feature for Flip-Chip Defect Detection.
IEEE Trans. Ind. Informatics
Yu Sun, Lei Su, Jiefei Gu, Xinwei Zhao, Ke Li, Michael G. Pecht
2024 J jnl
Small data challenges for intelligent prognostics and health management: a review.
Artif. Intell. Rev.
Chuanjiang Li, Shaobo Li, Yixiong Feng, Konstantinos Gryllias, Fengshou Gu, Michael G. Pecht
2024 J jnl
WavePHMNet: A comprehensive diagnosis and prognosis approach for analog circuits.
Adv. Eng. Informatics
Varun Khemani, Michael H. Azarian, Michael G. Pecht
2023 J jnl
A Novel Three-Probability Spaces Logic Decoupling Distillation for Flip-Chip Defect Detection.
IEEE Trans. Instrum. Meas.
Yu Sun, Lei Su, Jiefei Gu, Ke Li, Michael G. Pecht
2023 J jnl
Influence of Substrate on Microvia Structures in Printed Circuit Boards During Reflow.
IEEE Access
Syed Mujahid Abbas, Qiang Yu, Michael G. Pecht
2023 J jnl
Multi-objective reliability and cost optimization of fuel cell vehicle system with fuzzy feasibility.
Inf. Sci.
Mohamed Arezki Mellal, Enrico Zio, Michael G. Pecht
2023 J jnl
Reliability analysis of dependent competing failure processes with time-varying δ shock model.
Reliab. Eng. Syst. Saf.
Hao Lyu, Hongchen Qu, Zaiyou Yang, Li Ma, Bing Lu, Michael G. Pecht
2023 J jnl
Reliability analysis of the multi-state system with nonlinear degradation model under Markov environment.
Reliab. Eng. Syst. Saf.
Hao Lyu, Hongchen Qu, Hualong Xie, Yimin Zhang, Michael G. Pecht
2022 J jnl
A Review of Second-Life Lithium-Ion Batteries for Stationary Energy Storage Applications.
Proc. IEEE
Xiaosong Hu, Xinchen Deng, Feng Wang, Zhongwei Deng, Xianke Lin, Remus Teodorescu, Michael G. Pecht
2022 J jnl
A Siamese hybrid neural network framework for few-shot fault diagnosis of fixed-wing unmanned aerial vehicles.
J. Comput. Des. Eng.
Chuanjiang Li, Shaobo Li, Ansi Zhang, Lei Yang, Enrico Zio, Michael G. Pecht, Konstantinos Gryllias
2022 J jnl
Detection and Isolation of Wheelset Intermittent Over-Creeps for Electric Multiple Units Based on a Weighted Moving Average Technique.
IEEE Trans. Intell. Transp. Syst.
Yinghong Zhao, Xiao He, Donghua Zhou, Michael G. Pecht
2022 J jnl
Dynamic Equivalent Circuit Model to Estimate State-of-Health of Lithium-Ion Batteries.
IEEE Access
Shehla Amir, Moneeba Gulzar, Muhammad Osama Tarar, Ijaz Haider Naqvi, Nauman Ahmad Zaffar, Michael G. Pecht
2022 J jnl
Imbalanced bearing fault diagnosis under variant working conditions using cost-sensitive deep domain adaptation network.
Expert Syst. Appl.
Zhenyu Wu, Hongkui Zhang, Juchuan Guo, Yang Ji, Michael G. Pecht
2022 J jnl
Implications of the Electric Vehicle Manufacturers' Decision to Mass Adopt Lithium-Iron Phosphate Batteries.
IEEE Access
Harsha Walvekar, Hector Beltran, Shashank Sripad, Michael G. Pecht
2022 J jnl
Reliability modeling for planetary gear transmission system considering dependent failure processes.
Qual. Reliab. Eng. Int.
Hao Lyu, Shuai Wang, Li Ma, Xiaowen Zhang, Michael G. Pecht
2021 J jnl
A Deep Forest-Based Fault Diagnosis Scheme for Electronics-Rich Analog Circuit Systems.
IEEE Trans. Ind. Electron.
Zhen Jia, Zhenbao Liu, Yanfen Gan, Chi-Man Vong, Michael G. Pecht
2021 J jnl
A Machine Learning Degradation Model for Electrochemical Capacitors Operated at High Temperature.
IEEE Access
Darius Roman, Saurabh Saxena, Jens Bruns, Valentin Robu, Michael G. Pecht, David Flynn
2021 J jnl
An Assessment of Validity of the Bathtub Model Hazard Rate Trends in Electronics.
IEEE Access
Aishwarya Gaonkar, Rajkumar B. Patil, San Kyeong, Diganta Das, Michael G. Pecht
2021 J jnl
Capacity-Fading Behavior Analysis for Early Detection of Unhealthy Li-Ion Batteries.
IEEE Trans. Ind. Electron.
Changyong Lee, Sugyeong Jo, Daeil Kwon, Michael G. Pecht
2021 J jnl
Deep Residual Networks With Adaptively Parametric Rectifier Linear Units for Fault Diagnosis.
IEEE Trans. Ind. Electron.
Minghang Zhao, Shisheng Zhong, Xuyun Fu, Baoping Tang, Shaojiang Dong, Michael G. Pecht
2021 J jnl
Detection of intermittent faults based on an optimally weighted moving average T2 control chart with stationary observations.
Autom.
Yinghong Zhao, Xiao He, Junfeng Zhang, Hongquan Ji, Donghua Zhou, Michael G. Pecht
2021 J jnl
Generalized sparse filtering for rotating machinery fault diagnosis.
J. Supercomput.
Chun Cheng, Yan Hu, Jinrui Wang, Haining Liu, Michael G. Pecht
2021 J jnl
Hybrid remaining useful life prediction method. A case study on railway D-cables.
Reliab. Eng. Syst. Saf.
Yu Zang, Wei ShangGuan, Baigen Cai, Huashen Wang, Michael G. Pecht
2021 J jnl
Life Extension of Electronic Products: A Case Study of Smartphones.
IEEE Access
Dylan A. Hazelwood, Michael G. Pecht
2021 J jnl
Machine learning pipeline for battery state of health estimation.
CoRR
Darius Roman, Saurabh Saxena, Valentin Robu, Michael G. Pecht, David Flynn
2021 J jnl
Machine learning pipeline for battery state-of-health estimation.
Nat. Mach. Intell.
Darius Roman, Saurabh Saxena, Valentin Robu, Michael G. Pecht, David Flynn
2021 J jnl
Nonparametric Model-Based Online Junction Temperature and State-of-Health Estimation for Insulated Gate Bipolar Transistors.
IEEE Access
Xiangxiang Liu, Tianlei Jiao, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht
2021 J jnl
Protection Devices in Commercial 18650 Lithium-Ion Batteries.
IEEE Access
Bin Xu, Lingxi Kong, Guangrui Wen, Michael G. Pecht
2021 J jnl
Recent Development of Unpowered Exoskeletons for Lower Extremity: A Survey.
IEEE Access
Bin Zhang, Tao Liu, Michael G. Pecht
2021 J jnl
Reliability Analysis for the Dependent Competing Failure With Wear Model and its Application to the Turbine and Worm System.
IEEE Access
Hao Lyu, Xiaowen Zhang, Zaiyou Yang, Shuai Wang, Changyou Li, Michael G. Pecht
2021 J jnl
Reliability modeling for multistage systems subject to competing failure processes.
Qual. Reliab. Eng. Int.
Hao Lyu, Zaiyou Yang, Shuai Wang, Yaping Zhao, Michael G. Pecht
2021 J jnl
Sparse Reconstruction for Microdefect Detection of Two-Dimensional Ultrasound Image Based on Blind Estimation.
IEEE Trans. Ind. Electron.
Lei Su, Xiaonan Yu, Ke Li, Jiefei Gu, Michael G. Pecht
2021 J jnl
Understanding the Non-Collision Related Battery Safety Risks in Electric Vehicles a Case Study in Electric Vehicle Recalls and the LG Chem Battery.
IEEE Access
Ryan Aalund, Weiping Diao, Lingxi Kong, Michael G. Pecht
2020 J jnl
A Local Adaptive Minority Selection and Oversampling Method for Class-Imbalanced Fault Diagnostics in Industrial Systems.
IEEE Trans. Reliab.
Zhenyu Wu, Wenfang Lin, Binghao Fu, Juchuan Guo, Yang Ji, Michael G. Pecht
2020 J jnl
An Explainable Deep Learning-based Prognostic Model for Rotating Machinery.
CoRR
Namkyoung Lee, Michael H. Azarian, Michael G. Pecht
2020 J jnl
Analysis of Specified Capacity in Power Banks.
IEEE Access
Weiping Diao, Saurabh Saxena, Michael G. Pecht
2020 J jnl
Artificial Intelligence Trends Based on the Patents Granted by the United States Patent and Trademark Office.
IEEE Access
Hamidreza Habibollahi Najaf Abadi, Michael G. Pecht
2020 J jnl
Artificial Intelligence-Related Research Funding by the U.S. National Science Foundation and the National Natural Science Foundation of China.
IEEE Access
Hamidreza Habibollahi Najaf Abadi, Zhou He, Michael G. Pecht
2020 J jnl
Assembly Options and Challenges for Electronic Products With Lead-Free Exemption.
IEEE Access
Chien-Ming Huang, Anto Raj, Michael D. Osterman, Michael G. Pecht
2020 Misc conf
Battery Health Estimation for IoT Devices using V-Edge Dynamics.
HotMobile
Arjun Kumar, Mohammad Ashraful Hoque, Petteri Nurmi, Michael G. Pecht, Sasu Tarkoma, Junehwa Song
2020 J jnl
Board-Level Lifetime Prediction for Power Board of Balise Transmission Module in High-Speed Railways.
IEEE Access
Wei ShangGuan, Yu Zang, Huashen Wang, Michael G. Pecht
2020 J jnl
Correction to "Progressive Improved Convolutional Neural Network for Avionics Fault Diagnosis".
IEEE Access
Shuwen Chen, Hongjuan Ge, Jing Li, Michael G. Pecht
2020 J jnl
Deep Residual Shrinkage Networks for Fault Diagnosis.
IEEE Trans. Ind. Informatics
Minghang Zhao, Shisheng Zhong, Xuyun Fu, Baoping Tang, Michael G. Pecht
2020 J jnl
Degradation Monitoring of Insulation Systems Used in Low-Voltage Electromagnetic Coils under Thermal Loading Conditions from a Creep Point of View.
Sensors
Kai Wang, Haifeng Guo, Aidong Xu, Michael G. Pecht
2020 J jnl
Detection and Detectability of Intermittent Faults Based on Moving Average T2 Control Charts with Multiple Window Lengths.
CoRR
Yinghong Zhao, Xiao He, Michael G. Pecht, Junfeng Zhang, Donghua Zhou
2020 J jnl
Detection of Intermittent Faults Based on an Optimally Weighted Moving Average T^2 Control Chart with Stationary Gaussian Observations.
CoRR
Yinghong Zhao, Xiao He, Junfeng Zhang, Hongquan Ji, Donghua Zhou, Michael G. Pecht
2020 J jnl
Evaluation of Li-Based Battery Current, Voltage, and Temperature Profiles for In-Service Mobile Phones.
IEEE Access
Hayder Ali, Hassan Abbas Khan, Michael G. Pecht
2020 J jnl
Fault Diagnosis Using Adaptive Multifractal Detrended Fluctuation Analysis.
IEEE Trans. Ind. Electron.
Wenliao Du, Myeongsu Kang, Michael G. Pecht
2020 J jnl
Multi-Objective Optimization Design of a Notch Filter Based on Improved NSGA-II for Conducted Emissions.
IEEE Access
Lu Zhang, Hongjuan Ge, Ying Ma, Jianliang Xue, Huang Li, Michael G. Pecht
2020 J jnl
Online Degradation State Assessment Methodology for Multi-Mode Failures of Insulated Gate Bipolar Transistor.
IEEE Access
Xiangxiang Liu, Lingling Li, Diganta Das, Ijaz Haider Naqvi, Michael G. Pecht
2020 J jnl
Reliability design and case study of the domestic compressor subjected to repetitive internal stresses.
Reliab. Eng. Syst. Saf.
Seong-Woo Woo, Michael G. Pecht, Dennis L. O'Neal
2020 J jnl
Reliability of Cylindrical Li-ion Battery Safety Vents.
IEEE Access
Xingyan Yao, Lingxi Kong, Michael G. Pecht
2019 — conf
A Comparative Study of Deep Learning-Based Diagnostics for Automotive Safety Components Using a Raspberry Pi.
ICPHM
Namkyoung Lee, Michael H. Azarian, Michael G. Pecht, Jinyong Kim, Jongsoon Im
2019 J jnl
A Maintenance and Troubleshooting Method Based on Integrated Information and System Principles.
IEEE Access
Yan Su, Xue Rui Liang, Hui Wang, Jin Jun Wang, Michael G. Pecht
2019 — conf
A Multivalued Test and Diagnostic Strategy Optimization Method for Aircraft System Fault Diagnosis.
ICPHM
Yan Su, Xue Rui Liang, Chenxuan Gu, Varun Khemani, Michael G. Pecht
2019 C conf
A Novel Configurations of Modified CUK Converter Using Multiple VLSI Modules for High Voltage Renewable Energy Application.
IECON
Pandav Kiran Maroti, Sanjeevikumar Padmanaban, Jens Bo Holm-Nielsen, Michael G. Pecht, Olouremfemi Ojo
2019 J jnl
A Rotating Machinery Fault Diagnosis Method Based on Feature Learning of Thermal Images.
IEEE Access
Zhen Jia, Zhenbao Liu, Chi-Man Vong, Michael G. Pecht
2019 J jnl
A Weighted Deep Domain Adaptation Method for Industrial Fault Prognostics According to Prior Distribution of Complex Working Conditions.
IEEE Access
Zhenyu Wu, Shuyang Yu, Xinning Zhu, Yang Ji, Michael G. Pecht
2019 J jnl
ACA Curing Process Optimization Based on Curing Degree Considering Shear Strength of Joints.
IEEE Access
Guanghua Wu, Meixian Jiang, Diganta Das, Michael G. Pecht
2019 J jnl
Breaking the Trust: How Companies Are Failing Their Customers.
IEEE Access
Lidia Al-Zogbi, Diganta Das, Peter Rundle, Michael G. Pecht
2019 — conf
Electronic Circuit Diagnosis with No Data.
ICPHM
Varun Khemani, Michael H. Azarian, Michael G. Pecht
2019 — conf
Evaluating Impact of Information Uncertainties on Component Reliability Assessment.
IRPS
Diganta Das, Edmond Elburn, Michael G. Pecht, Bhanu Sood
2019 J jnl
Li-ion Battery Reliability - A Case Study of the Apple iPhone
IEEE Access
Yongquan Sun, Lingxi Kong, Hassan Abbas Khan, Michael G. Pecht
2019 J jnl
Lithium-Ion Battery Health Prognosis Based on a Real Battery Management System Used in Electric Vehicles.
IEEE Trans. Veh. Technol.
Rui Xiong, Yongzhi Zhang, Ju Wang, Hongwen He, Simin Peng, Michael G. Pecht
2019 J jnl
Lithium-Ion Battery Remaining Useful Life Prediction With Box-Cox Transformation and Monte Carlo Simulation.
IEEE Trans. Ind. Electron.
Yongzhi Zhang, Rui Xiong, Hongwen He, Michael G. Pecht
2019 J jnl
Multiple Wavelet Coefficients Fusion in Deep Residual Networks for Fault Diagnosis.
IEEE Trans. Ind. Electron.
Minghang Zhao, Myeongsu Kang, Baoping Tang, Michael G. Pecht
2019 J jnl
Perceptual Vibration Hashing by Sub-Band Coding: An Edge Computing Method for Condition Monitoring.
IEEE Access
Haining Liu, Yixiang Wang, Fajia Li, Xiaohong Wang, Chengliang Liu, Michael G. Pecht
2019 J jnl
Predicting Damage and Life Expectancy of Subsea Power Cables in Offshore Renewable Energy Applications.
IEEE Access
Fateme Dinmohammadi, David Flynn, Chris Bailey, Michael G. Pecht, Chunyan Yin, Pushparajah Rajaguru, Valentin Robu
2019 J jnl
Progressive Improved Convolutional Neural Network for Avionics Fault Diagnosis.
IEEE Access
Shuwen Chen, Hongjuan Ge, Jing Li, Michael G. Pecht
2019 — conf
Quantifying the Impact of Prognostic Distance on Average Cost per Cycle.
ICPHM
Saikath Bhattacharya, Lance Fiondella, Saurabh Saxena, Michael G. Pecht
2019 J jnl
Reduction of Li-ion Battery Qualification Time Based on Prognostics and Health Management.
IEEE Trans. Ind. Electron.
Jinwoo Lee, Daeil Kwon, Michael G. Pecht
2019 J jnl
Simulation and Experimental Verification of Edge Blurring Phenomenon in Microdefect Inspection Based on High-Frequency Ultrasound.
IEEE Access
Lei Su, Xiaonan Yu, Ke Li, Xingyan Yao, Michael G. Pecht
2019 J jnl
Tab Design and Failures in Cylindrical Li-ion Batteries.
IEEE Access
Xingyan Yao, Michael G. Pecht
2019 J jnl
The Explosive Nature of Tab Burrs in Li-Ion Batteries.
IEEE Access
Xingyan Yao, Saurabh Saxena, Lei Su, Michael G. Pecht
2019 J jnl
The Use of UL 1642 Impact Testing for Li-ion Pouch Cells.
IEEE Access
Ryan Aalund, Michael G. Pecht
2019 J jnl
Transmission characteristics analysis of an MCR-WPT system with SP resonance structure based on harmonic current influence.
IEICE Electron. Express
Jingying Zhao, Yongqi Xing, Zhengliang Sun, Michael G. Pecht
2019 J jnl
Water-Resistant Smartphone Technologies.
IEEE Access
Quanqing Yu, Rui Xiong, Chuan Li, Michael G. Pecht
2018 J jnl
A Double-Scale, Particle-Filtering, Energy State Prediction Algorithm for Lithium-Ion Batteries.
IEEE Trans. Ind. Electron.
Rui Xiong, Yongzhi Zhang, Hongwen He, Xuan Zhou, Michael G. Pecht
2018 J jnl
A Joint Distribution-Based Testability Metric Estimation Model for Unreliable Tests.
IEEE Access
Xuerong Ye, Cen Chen, Myeongsu Kang, Guofu Zhai, Michael G. Pecht
2018 J jnl
A Patent Analysis of Prognostics and Health Management (PHM) Innovations for Electrical Systems.
IEEE Access
Zhenbao Liu, Zhen Jia, Chi-Man Vong, Junwei Han, Chenggang Yan, Michael G. Pecht
2018 J jnl
An Editorial From the Editor-in-Chief of the IEEE ACCESS, at the End of his Six Year Term.
IEEE Access
Michael G. Pecht
2018 — conf
An Online State of Health Estimation Method for Lithium-ion Batteries Based on Integrated Voltage.
ICPHM
Yapeng Zhou, Miaohua Huang, Michael G. Pecht
2018 J jnl
Analysis and experiments on transmission characteristics of LCCL mobile wireless power transfer system.
IEICE Electron. Express
Jingying Zhao, Zhengliang Sun, Michael G. Pecht, Sinuo Zhou
2018 — conf
Anomaly Detection During Lithium-ion Battery Qualification Testing.
ICPHM
Saurabh Saxena, Myeongsu Kang, Yinjiao Xing, Michael G. Pecht
2018 J jnl
Challenges and Research Issues of Data Management in IoT for Large-Scale Petrochemical Plants.
IEEE Syst. J.
Lei Shu, Mithun Mukherjee, Michael G. Pecht, Noël Crespi, Son N. Han
2018 J jnl
Computing Lifetime Distributions and Reliability for Systems With Outsourced Components: A Case Study.
IEEE Access
Yongquan Sun, Tieyuan Sun, Michael G. Pecht, Chunyu Yu
2018 — conf
Condition Monitoring Model of a Hydraulic System in Truck Crane.
ICPHM
Wenliao Du, Sugai Han, Xiaowei Song, Shuxia Tian, Michael G. Pecht
2018 J jnl
Creating Self-Aware Low-Voltage Electromagnetic Coils for Incipient Insulation Degradation Monitoring for Smart Manufacturing.
IEEE Access
Kai Wang, Haifeng Guo, Aidong Xu, N. Jordan Jameson, Michael G. Pecht, Bingjun Yan
2018 J jnl
Deep Residual Networks With Dynamically Weighted Wavelet Coefficients for Fault Diagnosis of Planetary Gearboxes.
IEEE Trans. Ind. Electron.
Minghang Zhao, Myeongsu Kang, Baoping Tang, Michael G. Pecht
2018 J jnl
Detection of Generalized-Roughness and Single-Point Bearing Faults Using Linear Prediction-Based Current Noise Cancellation.
IEEE Trans. Ind. Electron.
Fardin Dalvand, Myeongsu Kang, Satar Dalvand, Michael G. Pecht
2018 J jnl
Effective decapsulation of copper wire-bonded microelectronic devices for reliability assessment.
Microelectron. Reliab.
Subramani Manoharan, Chandradip Patel, F. Patrick McCluskey, Michael G. Pecht
2018 J jnl
Electronic Circuit Health Estimation Through Kernel Learning.
IEEE Trans. Ind. Electron.
Arvind Sai Sarathi Vasan, Michael G. Pecht
2018 J jnl
Exploding E-Cigarettes: A Battery Safety Issue.
IEEE Access
Saurabh Saxena, Lingxi Kong, Michael G. Pecht
2018 — conf
Failure Analysis Informing Embedded Health Monitoring of Electromagnetic Relays.
ICSRS
Lucas Kirschbaum, Fateme Dinmohammadi, David Flynn, Valentin Robu, Michael G. Pecht
2018 J jnl
How Poor Reliability Affects Warranties: An Analysis of General Motors' Powertrain Warranty Reduction.
IEEE Access
Payam Motabar, Helmuth E. Gonzalez, Peter Rundle, Michael G. Pecht
2018 J jnl
In-Situ Observations of Lithium Dendrite Growth.
IEEE Access
Lingxi Kong, Yinjiao Xing, Michael G. Pecht
2018 J jnl
Long Short-Term Memory Recurrent Neural Network for Remaining Useful Life Prediction of Lithium-Ion Batteries.
IEEE Trans. Veh. Technol.
Yongzhi Zhang, Rui Xiong, Hongwen He, Michael G. Pecht
2018 J jnl
Malfunctions of Medical Devices Due to Electrostatic Occurrences Big Data Analysis of 10 Years of the FDA's Reports.
IEEE Access
Mehdi Kohani, Michael G. Pecht
2018 J jnl
Phthalates in Electronics: The Risks and the Alternatives.
IEEE Access
Michael G. Pecht, Irfan Ali, Augustus Carlson
2018 J jnl
Reliability Analysis of Repairable Systems Based on a Two-Segment Bathtub-Shaped Failure Intensity Function.
IEEE Access
Xuejiao Du, Zhaojun Yang, Chuanhai Chen, Xiaoxu Li, Michael G. Pecht
2018 J jnl
Remaining useful life prediction for lithium-ion batteries based on an integrated health indicator.
Microelectron. Reliab.
Yongquan Sun, Xueling Hao, Michael G. Pecht, Yapeng Zhou
2018 J jnl
Risk of tin whiskers in the nuclear industry.
Microelectron. Reliab.
Chien-Ming Huang, Daniel Nunez, James Coburn, Michael G. Pecht
2018 J jnl
Unsupervised Locality-Preserving Robust Latent Low-Rank Recovery-Based Subspace Clustering for Fault Diagnosis.
IEEE Access
Jie Gao, Myeongsu Kang, Jing Tian, Lifeng Wu, Michael G. Pecht
2017 J jnl
A Prognostic Model for Stochastic Degrading Systems With State Recovery: Application to Li-Ion Batteries.
IEEE Trans. Reliab.
Zhengxin Zhang, Xiao-Sheng Si, Chang-Hua Hu, Michael G. Pecht
2017 J jnl
A modified boost rectifier for elimination of circulating current in power factor correction applications.
Microelectron. Reliab.
Karthikeyan Venkitusamy, Sanjeevikumar Padmanaban, Michael G. Pecht, Abhishek Awasthi, Rajasekar Selvamuthukumaran
2017 J jnl
A perspective of the IPC report on lead-free electronics in military/aerospace applications.
Microelectron. Reliab.
Aleksandra Fortier, Michael G. Pecht
2017 J jnl
A review of lead-free solders for electronics applications.
Microelectron. Reliab.
Shunfeng Cheng, Chien-Ming Huang, Michael G. Pecht
2017 J jnl
Current Noise Cancellation for Bearing Fault Diagnosis Using Time Shifting.
IEEE Trans. Ind. Electron.
Fardin Dalvand, Satar Dalvand, Fatemeh Sharafi, Michael G. Pecht
2017 J jnl
Impedance-Based Condition Monitoring for Insulation Systems Used in Low-Voltage Electromagnetic Coils.
IEEE Trans. Ind. Electron.
N. Jordan Jameson, Michael H. Azarian, Michael G. Pecht
2017 J jnl
Interacting multiple model particle filter for prognostics of lithium-ion batteries.
Microelectron. Reliab.
Xiaohong Su, Shuai Wang, Michael G. Pecht, Lingling Zhao, Zhe Ye
2017 J jnl
Particle Learning Framework for Estimating the Remaining Useful Life of Lithium-Ion Batteries.
IEEE Trans. Instrum. Meas.
Zhenbao Liu, Gaoyuan Sun, Shuhui Bu, Junwei Han, Xiaojun Tang, Michael G. Pecht
2017 J jnl
Prognostics-Based LED Qualification Using Similarity-Based Statistical Measure With RVM Regression Model.
IEEE Trans. Ind. Electron.
Moon-Hwan Chang, Myeongsu Kang, Michael G. Pecht
2017 J jnl
Signal Model-Based Fault Coding for Diagnostics and Prognostics of Analog Electronic Circuits.
IEEE Trans. Ind. Electron.
Zhenbao Liu, Taimin Liu, Junwei Han, Shuhui Bu, Xiaojun Tang, Michael G. Pecht
2017 J jnl
The Effect of Inverter Failures on the Return on Investment of Solar Photovoltaic Systems.
IEEE Access
Tyler J. Formica, Hassan Abbas Khan, Michael G. Pecht
2017 J jnl
The phenomenon of tin pest: A review.
Microelectron. Reliab.
Ben Cornelius, Shay Treivish, Yair Rosenthal, Michael G. Pecht
2016 J jnl
A Hybrid Feature Selection Scheme for Reducing Diagnostic Performance Deterioration Caused by Outliers in Data-Driven Diagnostics.
IEEE Trans. Ind. Electron.
Myeongsu Kang, Md. Rashedul Islam, Jaeyoung Kim, Jong-Myon Kim, Michael G. Pecht
2016 J jnl
A Massively Parallel Approach to Real-Time Bearing Fault Detection Using Sub-Band Analysis on an FPGA-Based Multicore System.
IEEE Trans. Ind. Electron.
Myeongsu Kang, Jaeyoung Kim, In-Kyu Jeong, Jong-Myon Kim, Michael G. Pecht
2016 — conf
A Sequential
DMBD
Myeongsu Kang, Gopala Krishnan Ramaswami, Melinda Hodkiewicz, Edward Cripps, Jong-Myon Kim, Michael G. Pecht
2016 J jnl
A fusion prognostics-based qualification test methodology for microelectronic products.
Microelectron. Reliab.
Michael G. Pecht, Tadahiro Shibutani, Myeongsu Kang, Melinda Hodkiewicz, Edward Cripps
2016 J jnl
A reliability assessment guide for the transition planning to lead-free electronics for companies whose products are RoHS exempted or excluded.
Microelectron. Reliab.
Michael G. Pecht, Tadahiro Shibutani, Lifeng Wu
2016 J jnl
Conflict Minerals in Electronic Systems: An Overview and Critique of Legal Initiatives.
Sci. Eng. Ethics
N. Jordan Jameson, Xin Song, Michael G. Pecht
2016 — conf
Correlation analysis for impedance-based health monitoring of electromagnetic coils.
ICPHM
N. Jordan Jameson, Michael H. Azarian, Michael G. Pecht
2016 J jnl
Creep fatigue models of solder joints: A critical review.
Microelectron. Reliab.
Ee-Hua Wong, W. D. van Driel, Abhijit Dasgupta, Michael G. Pecht
2016 J jnl
Erratum to: New Minimum Relative Humidity Requirements Are Expected to Lead to More Medical Device Failures.
J. Medical Syst.
Mehdi Kohani, Michael G. Pecht
2016 J jnl
Guest Editorial Industrial Sensing Intelligence.
IEEE Trans. Ind. Informatics
Lei Shu, Carlo Cecati, Michael G. Pecht, Vincenzo Loia, Noël Crespi
2016 J jnl
IoT-Based Prognostics and Systems Health Management for Industrial Applications.
IEEE Access
Daeil Kwon, Melinda R. Hodkiewicz, Jiajie Fan, Tadahiro Shibutani, Michael G. Pecht
2016 J jnl
Motor Bearing Fault Detection Using Spectral Kurtosis-Based Feature Extraction Coupled With K-Nearest Neighbor Distance Analysis.
IEEE Trans. Ind. Electron.
Jing Tian, Carlos Morillo, Michael H. Azarian, Michael G. Pecht
2016 J jnl
New Minimum Relative Humidity Requirements Are Expected to Lead to More Medical Device Failures.
J. Medical Syst.
Mehdi Kohani, Michael G. Pecht
2016 J jnl
RoHS compliance in safety and reliability critical electronics.
Microelectron. Reliab.
Elviz George, Michael G. Pecht
2016 J jnl
Thermal reliability prediction and analysis for high-density electronic systems based on the Markov process.
Microelectron. Reliab.
Yi Wan, Hailong Huang, Diganta Das, Michael G. Pecht
2015 J jnl
A cloud model-based method for the analysis of accelerated life test data.
Microelectron. Reliab.
Wenjin Zhang, Shunli Liu, Bo Sun, Yue Liu, Michael G. Pecht
2015 — conf
A dual-level approach for lithium-ion battery RUL prognosis.
ICPHM
Zhe Ye, Lingling Zhao, Zhuo Wang, Peijun Ma, Xiaohong Su, Long Pang, Michael G. Pecht
2015 — conf
A practical design of reliability and performance test for portable lithium-ion batteries.
ICIA
Jiajie Fan, Wei He, Christopher Hendricks, Michael G. Pecht, Kam-Chuen Yung
2015 J jnl
A return on investment analysis of applying health monitoring to LED lighting systems.
Microelectron. Reliab.
Moon-Hwan Chang, Peter Sandborn, Michael G. Pecht, Winco K. C. Yung, Wenbin Wang
2015 J jnl
An empirical model to describe performance degradation for warranty abuse detection in portable electronics.
Reliab. Eng. Syst. Saf.
Hyun-Seok Oh, Seung-yun Choi, Keunsu Kim, Byeng D. Youn, Michael G. Pecht
2015 J jnl
An evaluation of dwell time and mean cyclic temperature parameters in the Engelmaier model.
Microelectron. Reliab.
Elviz George, Michael D. Osterman, Michael G. Pecht
2015 — conf
An improved exponential model for predicting the remaining useful life of lithium-ion batteries.
ICPHM
Peijun Ma, Shuai Wang, Lingling Zhao, Michael G. Pecht, Xiaohong Su, Zhe Ye
2015 J jnl
Anomaly detection for IGBTs using Mahalanobis distance.
Microelectron. Reliab.
Nishad Patil, Diganta Das, Michael G. Pecht
2015 — conf
Considerations in implementing canary based prognostics.
ICPHM
Sony Mathew, Michael D. Osterman, Michael G. Pecht
2015 J jnl
Field Reliability Estimation for Cochlear Implants.
IEEE Trans. Biomed. Eng.
Liliane L. Tessa, Bhanu P. Sood, Michael G. Pecht
2015 J jnl
Predicting long-term lumen maintenance life of LED light sources using a particle filter-based prognostic approach.
Expert Syst. Appl.
Jiajie Fan, Kam-Chuen Yung, Michael G. Pecht
2015 — conf
Prognostics of lithium-ion batteries using a deterministic Bayesian approach.
ICPHM
Fangdan Zheng, Jiuchun Jiang, Martha Arbayani Zaidan, Wei He, Michael G. Pecht
2014 J jnl
Anomaly Detection of Light-Emitting Diodes Using the Similarity-Based Metric Test.
IEEE Trans. Ind. Informatics
Moon-Hwan Chang, Chaochao Chen, Diganta Das, Michael G. Pecht
2014 J jnl
Detection and Reliability Risks of Counterfeit Electrolytic Capacitors.
IEEE Trans. Reliab.
Anshul Shrivastava, Michael H. Azarian, Carlos Morillo, Bhanu P. Sood, Michael G. Pecht
2014 J jnl
Lithium-ion battery remaining useful life estimation based on fusion nonlinear degradation AR model and RPF algorithm.
Neural Comput. Appl.
Datong Liu, Yue Luo, Jie Liu, Yu Peng, Limeng Guo, Michael G. Pecht
2014 J jnl
Motor Bearing Fault Diagnosis Using Trace Ratio Linear Discriminant Analysis.
IEEE Trans. Ind. Electron.
Xiaohang Jin, Ming-Bo Zhao, Tommy W. S. Chow, Michael G. Pecht
2014 — conf
Prognostics and health management based refurbishment for life extension of electronic systems.
ICIA
Prabhakar V. Varde, Jing Tian, Michael G. Pecht
2014 J jnl
Prognostics of lumen maintenance for High power white light emitting diodes using a nonlinear filter-based approach.
Reliab. Eng. Syst. Saf.
Jiajie Fan, Kam-Chuen Yung, Michael G. Pecht
2014 J jnl
Tin whisker analysis of an automotive engine control unit.
Microelectron. Reliab.
Elviz George, Michael G. Pecht
2013 J jnl
A multi-attribute classification fusion system for insulated gate bipolar transistor diagnostics.
Microelectron. Reliab.
Prasanna Tamilselvan, Pingfeng Wang, Michael G. Pecht
2013 J jnl
An ensemble model for predicting the remaining useful performance of lithium-ion batteries.
Microelectron. Reliab.
Yinjiao Xing, Eden W. M. Ma, Kwok-Leung Tsui, Michael G. Pecht
2013 J jnl
Degradation Data Analysis Using Wiener Processes With Measurement Errors.
IEEE Trans. Reliab.
Zhi-Sheng Ye, Yu Wang, Kwok-Leung Tsui, Michael G. Pecht
2013 J jnl
Diagnostics and Prognostics Method for Analog Electronic Circuits.
IEEE Trans. Ind. Electron.
Arvind Sai Sarathi Vasan, Bing Long, Michael G. Pecht
2013 J jnl
Health Assessment of Cooling Fan Bearings Using Wavelet-Based Filtering.
Sensors
Qiang Miao, Chao Tang, Wei Liang, Michael G. Pecht
2013 J jnl
Long term storage reliability of antifuse field programmable gate arrays.
Microelectron. Reliab.
Nishad Patil, Diganta Das, Estelle Scanff, Michael G. Pecht
2013 J jnl
Online Anomaly Detection for Hard Disk Drives Based on Mahalanobis Distance.
IEEE Trans. Reliab.
Yu Wang, Qiang Miao, Eden W. M. Ma, Kwok-Leung Tsui, Michael G. Pecht
2013 J jnl
Prognostics for state of health estimation of lithium-ion batteries based on combination Gaussian process functional regression.
Microelectron. Reliab.
Datong Liu, Jingyue Pang, Jianbao Zhou, Yu Peng, Michael G. Pecht
2013 J jnl
Remaining useful life prediction of lithium-ion battery with unscented particle filter technique.
Microelectron. Reliab.
Qiang Miao, Lei Xie, Hengjuan Cui, Wei Liang, Michael G. Pecht
2013 J jnl
Size and constraint effects on interfacial fracture behavior of microscale solder interconnects.
Microelectron. Reliab.
B. Li, X. P. Zhang, Y. Yang, L. M. Yin, Michael G. Pecht
2013 J jnl
State of charge estimation for electric vehicle batteries using unscented kalman filtering.
Microelectron. Reliab.
Wei He, Nicholas Williard, Chaochao Chen, Michael G. Pecht
2012 J jnl
A Two-Level Inspection Model With Technological Insertions.
IEEE Trans. Reliab.
Wenbin Wang, Matthew J. Carr, Tommy W. S. Chow, Michael G. Pecht
2012 J jnl
A health indicator method for degradation detection of electronic products.
Microelectron. Reliab.
Sachin Kumar, Nikhil M. Vichare, Eli Dolev, Michael G. Pecht
2012 J jnl
A prognostic approach for non-punch through and field stop IGBTs.
Microelectron. Reliab.
Nishad Patil, Diganta Das, Michael G. Pecht
2012 J jnl
An Options Approach for Decision Support of Systems With Prognostic Capabilities.
IEEE Trans. Reliab.
Gilbert Haddad, Peter A. Sandborn, Michael G. Pecht
2012 J jnl
Benefits and Challenges of System Prognostics.
IEEE Trans. Reliab.
Bo Sun, Shengkui Zeng, Rui Kang, Michael G. Pecht
2012 J jnl
Cost Optimization for Canary-Equipped Electronic Systems in Terms of Inventory Control and Maintenance Decisions.
IEEE Trans. Reliab.
Wenbin Wang, Michael G. Pecht, Yufang Liu
2012 J jnl
Economic design of the mean prognostic distance for canary-equipped electronic systems.
Microelectron. Reliab.
Wenbin Wang, Shuxin Luo, Michael G. Pecht
2012 J jnl
Ensemble-approaches for clustering health status of oil sand pumps.
Expert Syst. Appl.
Francesco Di Maio, J. Hu, Peter W. Tse, Michael G. Pecht, Kwok-Leung Tsui, Enrico Zio
2012 J jnl
Health Monitoring of Cooling Fans Based on Mahalanobis Distance With mRMR Feature Selection.
IEEE Trans. Instrum. Meas.
Xiaohang Jin, Eden W. M. Ma, L. L. Cheng, Michael G. Pecht
2012 J jnl
IEEE 1413: A Standard for Reliability Predictions.
IEEE Trans. Reliab.
Jon G. Elerath, Michael G. Pecht
2012 J jnl
Light emitting diodes reliability review.
Microelectron. Reliab.
Moon-Hwan Chang, Diganta Das, Prabhakar V. Varde, Michael G. Pecht
2012 J jnl
Nvidia's GPU failures: A case for prognostics and health management.
Microelectron. Reliab.
Michael G. Pecht
2012 J jnl
Precursor monitoring approach for reliability assessment of cooling fans.
J. Intell. Manuf.
Hyun-Seok Oh, Tadahiro Shibutani, Michael G. Pecht
2012 J jnl
Remaining Useful Life Estimation Based on a Nonlinear Diffusion Degradation Process.
IEEE Trans. Reliab.
Xiao-Sheng Si, Wenbin Wang, Chang-Hua Hu, Dong-Hua Zhou, Michael G. Pecht
2012 J jnl
Using cross-validation for model parameter selection of sequential probability ratio test.
Expert Syst. Appl.
Shunfeng Cheng, Michael G. Pecht
2011 C conf
A theoretical model to minimize the operational cost for canary-equipped electronic system's health management.
ISI
Wenbin Wang, Yifang Liu, Michael G. Pecht
2011 J jnl
Automatic data mining for telemetry database of computer systems.
Microelectron. Reliab.
C.-H. Wu, C.-H. Yang, S.-C. Lo, Nikhil M. Vichare, E. Rhem, Michael G. Pecht
2011 J jnl
Complex system maintainability verification with limited samples.
Microelectron. Reliab.
Qiang Miao, Liu Liu, Yuan Feng, Michael G. Pecht
2011 J jnl
Economic Analysis of Canary-Based Prognostics and Health Management.
IEEE Trans. Ind. Electron.
Wenbin Wang, Michael G. Pecht
2011 J jnl
Electrostatic Monitoring of Gas Path Debris for Aero-engines.
IEEE Trans. Reliab.
Zhenhua Wen, Hongfu Zuo, Michael G. Pecht
2011 J jnl
Health monitoring of electronic products based on Mahalanobis distance and Weibull decision metrics.
Microelectron. Reliab.
Gang Niu, Satnam Singh, Steven W. Holland, Michael G. Pecht
2011 J jnl
Long-Term Thermal Overstressing of Computers.
IEEE Des. Test Comput.
Kirk A. Gray, Michael G. Pecht
2011 C conf
Prognostics and health monitoring for lithium-ion battery.
ISI
Yinjiao Xing, Qiang Miao, Kwok-Leung Tsui, Michael G. Pecht
2011 — conf
Prognostics-based health management for telecom equipment under free air cooling.
EUROCON
Jun Dai, Diganta Das, Michael G. Pecht
2011 J jnl
Temperature and voltage aging effects on electrical conduction mechanism in epoxy-BaTiO
Microelectron. Reliab.
Mohammed A. Alam, Michael H. Azarian, Michael D. Osterman, Michael G. Pecht
2011 — conf
Using Failure Modes, Mechanisms, and Effects Analysis in Medical Device Adverse Event Investigations.
ICBO
Shunfeng Cheng, Diganta Das, Michael G. Pecht
2010 J jnl
A multi-component and multi-failure mode inspection model based on the delay time concept.
Reliab. Eng. Syst. Saf.
Wenbin Wang, Dragan Banjevic, Michael G. Pecht
2010 J jnl
A prognostics and health management roadmap for information and electronics-rich systems.
Microelectron. Reliab.
Michael G. Pecht, Rubyca Jaai
2010 J jnl
Anomaly Detection Through a Bayesian Support Vector Machine.
IEEE Trans. Reliab.
Vasilis A. Sotiris, Peter W. Tse, Michael G. Pecht
2010 J jnl
Approach to Fault Identification for Electronic Products Using Mahalanobis Distance.
IEEE Trans. Instrum. Meas.
Sachin Kumar, Tommy W. S. Chow, Michael G. Pecht
2010 J jnl
Development of an optimized condition-based maintenance system by data fusion and reliability-centered maintenance.
Reliab. Eng. Syst. Saf.
Gang Niu, Bo-Suk Yang, Michael G. Pecht
2010 — conf
Mahalanobis Distance Approach for Insulated Gate Bipolar Transistors Diagnostics.
CE
Nishad Patil, Diganta Das, Michael G. Pecht
2010 J jnl
Parameter selection for health monitoring of electronic products.
Microelectron. Reliab.
Sachin Kumar, Eli Dolev, Michael G. Pecht
2010 J jnl
Sensor Systems for Prognostics and Health Management.
Sensors
Shunfeng Cheng, Michael H. Azarian, Michael G. Pecht
2009 J jnl
A Highly Accurate Method for Assessing Reliability of Redundant Arrays of Inexpensive Disks (RAID).
IEEE Trans. Computers
Jon G. Elerath, Michael G. Pecht
2009 — conf
A fusion prognostics method for remaining useful life prediction of electronic products.
CASE
Shunfeng Cheng, Michael G. Pecht
2009 — conf
Model-based and data-driven prognosis of automotive and electronic systems.
CASE
Chaitanya Sankavaram, Bharath R. Pattipati, Anuradha Kodali, Krishna R. Pattipati, Mohammad Azam, Sachin Kumar, Michael G. Pecht
2009 J jnl
Modeling of IC Socket Contact Resistance for Reliability and Health Monitoring Applications.
IEEE Trans. Reliab.
Leoncio D. Lopez, Michael G. Pecht
2009 J jnl
Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics.
IEEE Trans. Reliab.
Nishad Patil, Jose Celaya, Diganta Das, Kai Goebel, Michael G. Pecht
2009 J jnl
Reliability Assessment of Land Grid Array Sockets Subjected to Mixed Flowing Gas Environment.
IEEE Trans. Reliab.
Shuang Yang, Ji Wu, Michael G. Pecht
2008 B conf
A hybrid prognostics methodology for electronic products.
IJCNN
Sachin Kumar, Myra Torres, Y. C. Chan, Michael G. Pecht
2008 J jnl
Key reliability concerns with lead-free connectors.
Microelectron. Reliab.
Tadahiro Shibutani, Ji Wu, Qiang Yu, Michael G. Pecht
2008 J jnl
No-fault-found and intermittent failures in electronic products.
Microelectron. Reliab.
Haiyu Qi, Sanka Ganesan, Michael G. Pecht
2008 J jnl
Pressure-induced tin whisker formation.
Microelectron. Reliab.
Tadahiro Shibutani, Qiang Yu, Masaki Shiratori, Michael G. Pecht
2007 A conf
Enhanced Reliability Modeling of RAID Storage Systems.
DSN
Jon G. Elerath, Michael G. Pecht
2007 — conf
Health Monitoring of Electronic Products Using Symbolic Time Series Analysis.
AAAI Fall Symposium: Artificial Intelligence for Prognostics
Sachin Kumar, Michael G. Pecht
2007 J jnl
Introduction to special section on electronic systems prognostics and health management.
Microelectron. Reliab.
Peter Sandborn, Michael G. Pecht
2007 J jnl
Isothermal aging effects on flex cracking of multilayer ceramic capacitors with standard and flexible terminations.
Microelectron. Reliab.
Mohammadreza Keimasi, Michael H. Azarian, Michael G. Pecht
2007 — conf
Multivariate State Estimation Technique for Remaining Useful Life Prediction of Electronic Products.
AAAI Fall Symposium: Artificial Intelligence for Prognostics
Shunfeng Cheng, Michael G. Pecht
2007 J jnl
Prognostics implementation of electronics under vibration loading.
Microelectron. Reliab.
Jie Gu, Donald Barker, Michael G. Pecht
2007 — conf
Support Vector Prognostics Analysis of Electronic Products and Systems.
AAAI Fall Symposium: Artificial Intelligence for Prognostics
Vasilis A. Sotiris, Michael G. Pecht
2007 J jnl
The impact of electrical current, mechanical bending, and thermal annealing on tin whisker growth.
Microelectron. Reliab.
Yuki Fukuda, Michael D. Osterman, Michael G. Pecht
2007 — conf
Uncertainty Assessment of Prognostics of Electronics Subject to Random Vibration.
AAAI Fall Symposium: Artificial Intelligence for Prognostics
Jie Gu, Donald Barker, Michael G. Pecht
2006 J jnl
Electronic device encapsulation using red phosphorus flame retardants.
Microelectron. Reliab.
Michael G. Pecht, Yuliang Deng
2006 J jnl
Low temperature electrical measurements of silicon bipolar monolithic microwave integrated circuit (MMIC) amplifiers.
Microelectron. Reliab.
Mohammadreza Keimasi, Sanka Ganesan, Michael G. Pecht
2006 J jnl
Moisture induced degradation of multilayer ceramic capacitors.
Microelectron. Reliab.
Daniel N. Donahoe, Michael G. Pecht, Isabel K. Lloyd, Sanka Ganesan
2006 — conf
Reduction of Skin Stretch Induced Motion Artifacts in Electrocardiogram Monitoring Using Adaptive Filtering.
EMBC
Yan Liu, Michael G. Pecht
2006 J jnl
Statistical analysis of tin whisker growth.
Microelectron. Reliab.
Tong Fang, Michael D. Osterman, Michael G. Pecht
2006 J jnl
Use of high temperature operating life data to mitigate risks in long-duration space applications that deploy commercial-grade plastic encapsulated semiconductor devices.
Microelectron. Reliab.
Sanka Ganesan, Michael G. Pecht, Sharon Ling
2004 J jnl
Contact discontinuity modeling of electromechanical switches.
IEEE Trans. Reliab.
Jingsong Xie, Michael G. Pecht
2004 J jnl
Load characterization during transportation.
Microelectron. Reliab.
Arun Ramakrishnan, Michael G. Pecht
2003 J jnl
Diffusion and absorption of corrosive gases in electronic encapsulants.
Microelectron. Reliab.
C. Hillman, B. Castillo, Michael G. Pecht
2003 J jnl
Field failure due to creep corrosion on components with palladium pre-plated leadframes.
Microelectron. Reliab.
Ping Zhao, Michael G. Pecht
2002 J jnl
Characterization of plastic encapsulant materials as a baseline for quality assessment and reliability testing.
Microelectron. Reliab.
Leon Lantz, Seongdeok Hwang, Michael G. Pecht
2002 J jnl
Editorial.
Microelectron. Reliab.
Ninoslav Stojadinovic, Michael G. Pecht
2002 J jnl
The "trouble not identified" phenomenon in automotive electronics.
Microelectron. Reliab.
Dawn A. Thomas, Ken Ayers, Michael G. Pecht
2002 J jnl
The IEEE standards on reliability program and reliability prediction methods for electronic equipment.
Microelectron. Reliab.
Michael G. Pecht, Diganta Das, Arun Ramakrishnan
2002 Misc conf
Weapon and communication systems: virtual life assessment of electronic hardware used in the Advanced Amphibious Assault Vehicle (AAAV).
WSC
Ricky Valentin, Jeremy Cunningham, Michael D. Osterman, Abhijit Dasgupta, Michael G. Pecht, Dinos Tsagos
2001 J jnl
An investigation of the mechanical behavior of conductive elastomer interconnects.
Microelectron. Reliab.
Jingsong Xie, Michael G. Pecht, David DeDonato, Ali Hassanzadeh
2001 J jnl
Editorial.
Microelectron. Reliab.
Ninoslav Stojadinovic, Michael G. Pecht
2001 J jnl
In memory of D. Stewart Peck.
Microelectron. Reliab.
Ninoslav Stojadinovic, Michael G. Pecht
2001 J jnl
Process capability indices and product reliability.
Microelectron. Reliab.
Bharatwaj Ramakrishnan, Peter Sandborn, Michael G. Pecht
1996 J jnl
MilSpecs - To Be Or Not To Be.
IEEE Trans. Reliab.
Michael G. Pecht
1994 J jnl
Predicting the reliability of electronic equipment.
Proc. IEEE
Michael G. Pecht, Franklin R. Nash
1990 J jnl
Placement for reliability and routability of convectively cooled PWBs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Michael D. Osterman, Michael G. Pecht
1987 J jnl
A Coupled Algorithmic-Heuristic Approach for Design Optimization.
IEEE Trans. Syst. Man Cybern.
Shapour Azarm, Michael G. Pecht