Michael E. Imhof

26 papers A* 3A 5B 1C 3Misc 2Journal 3Unranked 8
YearRankTypeTitle / Venue / Authors
2015 — —
Fault tolerance infrastructure and its reuse for offline testing: synergies of a unified architecture to cope with soft errors and hard faults.
Michael E. Imhof
2015 J jnl
High-Throughput Logic Timing Simulation on GPGPUs.
ACM Trans. Design Autom. Electr. Syst.
Stefan Holst, Michael E. Imhof, Hans-Joachim Wunderlich
2014 A conf
Bit-Flipping Scan - A unified architecture for fault tolerance and offline test.
DATE
Michael E. Imhof, Hans-Joachim Wunderlich
2014 A* conf
GUARD: GUAranteed Reliability in Dynamically Reconfigurable Systems.
DAC
Hongyan Zhang, Michael A. Kochte, Michael E. Imhof, Lars Bauer, Hans-Joachim Wunderlich, Jörg Henkel
2014 — conf
On Covering Structural Defects in NoCs by Functional Tests.
ATS
Atefe Dalirsani, Nadereh Hatami, Michael E. Imhof, Marcus Eggenberger, Gert Schley, Martin Radetzki, Hans-Joachim Wunderlich
2014 Misc conf
Structural Software-Based Self-Test of Network-on-Chip.
VTS
Atefe Dalirsani, Michael E. Imhof, Hans-Joachim Wunderlich
2014 B conf
Variation-aware deterministic ATPG.
ETS
Matthias Sauer, Ilia Polian, Michael E. Imhof, Abdullah Mumtaz, Eric Schneider, Alexander Czutro, Hans-Joachim Wunderlich, Bernd Becker
2013 A conf
Module diversification: Fault tolerance and aging mitigation for runtime reconfigurable architectures.
ITC
Hongyan Zhang, Lars Bauer, Michael A. Kochte, Eric Schneider, Claus Braun, Michael E. Imhof, Hans-Joachim Wunderlich, Jörg Henkel
2013 — conf
Synthesis of workload monitors for on-line stress prediction.
DFTS
Rafal Baranowski, Alejandro Cook, Michael E. Imhof, Chang Liu, Hans-Joachim Wunderlich
2013 J jnl
Test Strategies for Reliable Runtime Reconfigurable Architectures.
IEEE Trans. Computers
Lars Bauer, Claus Braun, Michael E. Imhof, Michael A. Kochte, Eric Schneider, Hongyan Zhang, Jörg Henkel, Hans-Joachim Wunderlich
2012 Misc conf
A pseudo-dynamic comparator for error detection in fault tolerant architectures.
VTS
D. A. Tran, Arnaud Virazel, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Michael E. Imhof, Hans-Joachim Wunderlich
2012 — conf
Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test.
LATW
Alejandro Cook, Sybille Hellebrand, Michael E. Imhof, Abdullah Mumtaz, Hans-Joachim Wunderlich
2012 — conf
OTERA: Online test strategies for reliable reconfigurable architectures - Invited paper for the AHS-2012 special session "Dependability by reconfigurable hardware".
AHS
Lars Bauer, Claus Braun, Michael E. Imhof, Michael A. Kochte, Hongyan Zhang, Hans-Joachim Wunderlich, Jörg Henkel
2012 C conf
Transparent structural online test for reconfigurable systems.
IOLTS
Mohamed Abdelfattah, Lars Bauer, Claus Braun, Michael E. Imhof, Michael A. Kochte, Hongyan Zhang, Jörg Henkel, Hans-Joachim Wunderlich
2012 — conf
Variation-Aware Fault Grading.
Asian Test Symposium
Alexander Czutro, Michael E. Imhof, J. Jiang, Abdullah Mumtaz, Matthias Sauer, Bernd Becker, Ilia Polian, Hans-Joachim Wunderlich
2011 J jnl
Efficient multi-level fault simulation of HW/SW systems for structural faults.
Sci. China Inf. Sci.
Rafal Baranowski, Stefano Di Carlo, Nadereh Hatami, Michael E. Imhof, Michael A. Kochte, Paolo Prinetto, Hans-Joachim Wunderlich, Christian G. Zoellin
2011 — conf
Embedded Test for Highly Accurate Defect Localization.
Asian Test Symposium
Abdullah Mumtaz, Michael E. Imhof, Stefan Holst, Hans-Joachim Wunderlich
2011 A conf
P-PET: Partial pseudo-exhaustive test for high defect coverage.
ITC
Abdullah Mumtaz, Michael E. Imhof, Hans-Joachim Wunderlich
2011 C conf
Soft error correction in embedded storage elements.
IOLTS
Michael E. Imhof, Hans-Joachim Wunderlich
2010 — conf
Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level.
Asian Test Symposium
Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto
2010 A conf
System reliability evaluation using concurrent multi-level simulation of structural faults.
ITC
Michael A. Kochte, Christian G. Zoellin, Rafal Baranowski, Michael E. Imhof, Hans-Joachim Wunderlich, Nadereh Hatami, Stefano Di Carlo, Paolo Prinetto
2009 A conf
Test exploration and validation using transaction level models.
DATE
Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Rauf Salimi Khaligh, Martin Radetzki, Hans-Joachim Wunderlich, Stefano Di Carlo, Paolo Prinetto
2008 C conf
Integrating Scan Design and Soft Error Correction in Low-Power Applications.
IOLTS
Michael E. Imhof, Hans-Joachim Wunderlich, Christian G. Zoellin
2008 A* conf
Scan chain clustering for test power reduction.
DAC
Melanie Elm, Hans-Joachim Wunderlich, Michael E. Imhof, Christian G. Zoellin, Jens Leenstra, Nicolas Mäding
2008 — conf
Test Set Stripping Limiting the Maximum Number of Specified Bits.
DELTA
Michael A. Kochte, Christian G. Zoellin, Michael E. Imhof, Hans-Joachim Wunderlich
2007 A* conf
Scan Test Planning for Power Reduction.
DAC
Michael E. Imhof, Christian G. Zoellin, Hans-Joachim Wunderlich, Nicolas Mäding, Jens Leenstra