| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2025 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2025 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2023 | J | jnl |
J. Electronic Imaging
|
| 2023 | J | jnl |
EAI Endorsed Trans. Scalable Inf. Syst.
|
| 2022 | J | jnl |
Int. J. Circuit Theory Appl.
|
| 2022 | J | jnl |
CoRR
|
| 2021 | J | jnl |
CoRR
|
| 2020 | — | conf |
MLIS
|
| 2019 | — | conf |
FSDM
|
| 2019 | — | conf |
FSDM
|
| 2019 | J | jnl |
Univers. Access Inf. Soc.
|
| 2018 | — | conf |
FSDM
|
| 2018 | J | jnl |
Sensors
|
| 2017 | — | conf |
IIAI-AAI
|
| 2017 | — | conf |
Investigation on Gate Capacitances Fluctuation Due to Work-Function Variation in Metal-Gate FinFETs.
FSDM
|
| 2013 | — | conf |
COMPSAC Workshops
|
| 2012 | J | jnl |
J. Zhejiang Univ. Sci. C
|
| 2011 | J | jnl |
J. Zhejiang Univ. Sci. C
|
| 2010 | — | conf |
APCCAS
|
| 2008 | — | conf |
APCCAS
|