Mesut Meterelliyoz

20 papers A 3Journal 6Unranked 11

Year	Rank	Type	Title / Venue / Authors
2019	—	`conf`	A 3.6Mb 10.1Mb/mm ISSCC Pulkit Jain, Umut Arslan, Meenakshi Sekhar, Blake C. Lin, Liqiong Wei, Tanaya Sahu, Juan Alzate-vinasco, Ajay Vangapaty, Mesut Meterelliyoz, Nathan Strutt, Albert B. Chen, Patrick Hentges, Pedro A. Quintero, Chris Connor, Oleg Golonzka, Kevin Fischer, Fatih Hamzaoglu
2019	—	`conf`	A 7Mb STT-MRAM in 22FFL FinFET Technology with 4ns Read Sensing Time at 0.9V Using Write-Verify-Write Scheme and Offset-Cancellation Sensing Technique. ISSCC Liqiong Wei, Juan G. Alzate, Umut Arslan, Justin Brockman, Nilanjan Das, Kevin Fischer, Tahir Ghani, Oleg Golonzka, Patrick Hentges, Rawshan Jahan, Pulkit Jain, Blake C. Lin, Mesut Meterelliyoz, Jim O'Donnell, Conor Puls, Pedro A. Quintero, Tanaya Sahu, Meenakshi Sekhar, Ajay Vangapaty, Chris Wiegand, Fatih Hamzaoglu
2015	J	`jnl`	A 1 Gb 2 GHz 128 GB/s Bandwidth Embedded DRAM in 22 nm Tri-Gate CMOS Technology. IEEE J. Solid State Circuits Fatih Hamzaoglu, Umut Arslan, Nabhendra Bisnik, Swaroop Ghosh, Manoj B. Lal, Nick Lindert, Mesut Meterelliyoz, Randy B. Osborne, Joodong Park, Shigeki Tomishima, Yih Wang, Kevin Zhang
2014	—	`conf`	13.1 A 1Gb 2GHz embedded DRAM in 22nm tri-gate CMOS technology. ISSCC Fatih Hamzaoglu, Umut Arslan, Nabhendra Bisnik, Swaroop Ghosh, Manoj B. Lal, Nick Lindert, Mesut Meterelliyoz, Randy B. Osborne, Joodong Park, Shigeki Tomishima, Yih Wang, Kevin Zhang
2014	—	`conf`	2 VLSIC Mesut Meterelliyoz, Fuad H. Al-amoody, Umut Arslan, Fatih Hamzaoglu, Luke Hood, Manoj B. Lal, Jeffrey L. Miller, Anand Ramasundar, Dan Soltman, Ifar Wan, Yih Wang, Kevin Zhang
2013	J	`jnl`	A 4.6 GHz 162 Mb SRAM Design in 22 nm Tri-Gate CMOS Technology With Integrated Read and Write Assist Circuitry. IEEE J. Solid State Circuits Eric Karl, Yih Wang, Yong-Gee Ng, Zheng Guo, Fatih Hamzaoglu, Mesut Meterelliyoz, John Keane, Uddalak Bhattacharya, Kevin Zhang, Kaizad Mistry, Mark Bohr
2011	—	`conf`	Integrated Design & Test: Conquering the Conflicting Requirements of Low-Power, Variation-Tolerance and Test Cost. Asian Test Symposium Ashish Goel, Swaroop Ghosh, Mesut Meterelliyoz, Jeff Parkhurst, Kaushik Roy
2010	—	`conf`	Accurate characterization of random process variations using a robust low-voltage high-sensitivity sensor featuring replica-bias circuit. ISSCC Mesut Meterelliyoz, Ashish Goel, Jaydeep P. Kulkarni, Kaushik Roy
2010	J	`jnl`	Analysis of SRAM and eDRAM Cache Memories Under Spatial Temperature Variations. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Mesut Meterelliyoz, Jaydeep P. Kulkarni, Kaushik Roy
2010	J	`jnl`	Characterization of Random Process Variations Using Ultralow-Power, High-Sensitivity, Bias-Free Sub-Threshold Process Sensor. IEEE Trans. Circuits Syst. I Regul. Pap. Mesut Meterelliyoz, Peilin Song, Franco Stellari, Jaydeep P. Kulkarni, Kaushik Roy
2009	—	`conf`	Design for burn-in test: a technique for burn-in thermal stability under die-to-die parameter variations. ASP-DAC Mesut Meterelliyoz, Kaushik Roy
2009	—	`conf`	Statistical yield analysis of silicon-on-insulator embedded DRAM. ISQED Rouwaida Kanj, Rajiv V. Joshi, Jente B. Kuang, J. Kim, Mesut Meterelliyoz, William R. Reohr, Sani R. Nassif, Kevin J. Nowka
2008	—	`conf`	A high sensitivity process variation sensor utilizing sub-threshold operation. CICC Mesut Meterelliyoz, Peilin Song, Franco Stellari, Jaydeep P. Kulkarni, Kaushik Roy
2008	J	`jnl`	Rethinking Refresh: Increasing Availability and Reducing Power in DRAM for Cache Applications. IEEE Micro Philip G. Emma, William R. Reohr, Mesut Meterelliyoz
2008	A	`conf`	Thermal analysis of 8-T SRAM for nano-scaled technologies. ISLPED Mesut Meterelliyoz, Jaydeep P. Kulkarni, Kaushik Roy
2007	J	`jnl`	Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. Jung Hwan Choi, Aditya Bansal, Mesut Meterelliyoz, Jayathi Murthy, Kaushik Roy
2006	—	`conf`	A CMOS Thermal Sensor and Its Applications in Temperature Adaptive Design. ISQED Qikai Chen, Mesut Meterelliyoz, Kaushik Roy
2006	—	`conf`	Compact thermal models for estimation of temperature-dependent power/performance in FinFET technology. ASP-DAC Aditya Bansal, Mesut Meterelliyoz, Siddharth Singh, Jung Hwan Choi, Jayathi Murthy, Kaushik Roy
2006	A	`conf`	Leakage power dependent temperature estimation to predict thermal runaway in FinFET circuits. ICCAD Jung Hwan Choi, Aditya Bansal, Mesut Meterelliyoz, Jayathi Murthy, Kaushik Roy
2005	A	`conf`	A leakage control system for thermal stability during burn-in test. ITC Mesut Meterelliyoz, Hamid Mahmoodi, Kaushik Roy