Meryem Marzouki

15 papers A 3Misc 1Journal 5Unranked 5

Year	Rank	Type	Title / Venue / Authors
2007	J	`jnl`	Identity control, activity control: from trust to suspicion. Ann. des Télécommunications Meryem Marzouki
2002	J	`jnl`	CAS-BUS: A Test Access Mechanism and a Toolbox Environment for Core-Based System Chip Testing. J. Electron. Test. Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki
2001	J	`jnl`	Cost/Quality Trade-off in Synthesis for BIST. J. Electron. Test. Peter Bukovjan, Laurent Ducerf-Bourbon, Meryem Marzouki
2001	A	`conf`	Testing TAPed cores and wrapped cores with the same test access mechanism. DATE Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki
2000	A	`conf`	CAS-BUS: A Scalable and Reconfigurable Test Access Mechanism for Systems on a Chip. DATE Mounir Benabdenbi, Walid Maroufi, Meryem Marzouki
2000	—	`conf`	Cost/Quality Trade-Off in Synthesis for BIST. LATW Peter Bukovjan, Laurent Ducerf-Bourbon, Meryem Marzouki
2000	—	`conf`	Solving the I/O Bandwidth Problem in System on a Chip Testing. SBCCI Walid Maroufi, Mounir Benabdenbi, Meryem Marzouki
1997	Misc	`conf`	Hardware Test: Can We Learn from Software Testing? VTS J. Abraham, Phyllis G. Frankl, Christian Landrault, Meryem Marzouki, Paolo Prinetto, Chantal Robach, Pascale Thévenod-Fosse
1996	—	`conf`	A Pragmatic, Systematic And Flexible Synthesis For Testability Methodology. Asian Test Symposium Vladimir Castro Alves, A. Ribeiro Antunes, Meryem Marzouki
1996	—	`conf`	FLAMES: A Fuzzy Logic ATMS and Model-based Expert System for Analog Diagnosis. ED&TC Firas Mohamed, Meryem Marzouki, Mohamed Hedi Touati
1996	—	`conf`	System Fault Diagnosis based on a Fuzzy Qualitative Approach. ED&TC Mohamed Hedi Touati, Firas Mohamed, Meryem Marzouki
1996	J	`jnl`	Test and diagnosis of analog circuits: When fuzziness can lead to accuracy. J. Electron. Test. Firas Mohamed, Meryem Marzouki
1993	A	`conf`	Unifying test and diagnosis of interconnects and logic clusters in partial boundary scan boards. ICCAD Meryem Marzouki, Marcelo Lubaszewski, Mohamed Hedi Touati
1991	—	`—`	Approches a base de connaissances pour le test de circuits VLSI : application à la validation de prototypes dans le cadre d'un test sans contact. (Knowledge-based approaches to VLSI circuit testing : application to prototype validation by contactless testing). Meryem Marzouki
1991	J	`jnl`	Model-based reasoning for electron-beam debugging of VLSI circuits. J. Electron. Test. Meryem Marzouki