| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2023 | C | conf |
ICCE
|
| 2021 | — | conf |
ICCE-TW
|
| 2014 | — | conf |
VLSI-DAT
|
| 2012 | J | jnl |
IEEE Trans. Instrum. Meas.
|
| 2011 | J | jnl |
Microelectron. J.
|
| 2010 | J | jnl |
J. Inf. Sci. Eng.
|
| 2010 | J | jnl |
J. Inf. Sci. Eng.
|
| 2007 | C | conf |
VLSI-SoC
|
| 2005 | — | conf |
ISCAS (3)
|
| 2002 | — | conf |
DELTA
|
| 1996 | J | jnl |
IEEE Trans. Computers
|
| 1995 | — | conf |
Asian Test Symposium
|
| 1994 | J | jnl |
IEEE Des. Test Comput.
|