Mehmet Kaynak

21 papers B 1C 1Journal 9Unranked 10
YearRankTypeTitle / Venue / Authors
2021 J jnl
Emerging Terahertz Integrated Systems in Silicon.
IEEE Trans. Circuits Syst. I Regul. Pap.
Xiang Yi, Cheng Wang, Zhi Hu, Jack W. Holloway, Muhammad Ibrahim Wasiq Khan, Mohamed I. Ibrahim, Mina Kim, Georgios C. Dogiamis, Bradford Perkins, Mehmet Kaynak, Rabia Tugce Yazicigil, Anantha P. Chandrakasan, Ruonan Han
2021 J jnl
Erratum to "High-Power Radiation at 1 THz in Silicon: A Fully Scalable Array Using a Multi-Functional Radiating Mesh Structure".
IEEE J. Solid State Circuits
Zhi Hu, Mehmet Kaynak, Ruonan Han
2020 — conf
A 0.9 mW Compact Power Detector with 30 dB Dynamic Range for Automotive Radar Applications.
MWSCAS
Hamza Kandis, Berke Gungor, Melik Yazici, Mehmet Kaynak, Yasar Gurbuz
2020 — conf
A 6-mW W-Band LNA in 0.13µm SiGe BiCMOS for Passive Imaging Systems.
MWSCAS
Berke Gungor, Esref Turkmen, Melik Yazici, Mehmet Kaynak, Yasar Gurbuz
2020 C conf
A 7-Bit 0.22 dB Step Variable Attenuator with Flat States and Low Phase Variation at 1.5-13.5 GHz using iNMOS Switches.
ISCAS
Hamza Kandis, Abdurrahman Burak, Melik Yazici, Mehmet Kaynak, Yasar Gurbuz
2020 — conf
A Co-Integrated Silicon-Based Electronic-Photonic Wideband, High-Power Signal Source.
OFC
Saeed Zeinolabedinzadeh, Patrick Goley, Milad Frounchi, Sunil G. Rao, Christian G. Bottenfield, Gareeyasee Saha, Andy Stark, Stephen E. Ralph, Mehmet Kaynak, Lars Zimmermann, Stefan Lischke, Christian Mai, John D. Cressler
2020 J jnl
A Switchless SiGe BiCMOS Bidirectional Amplifier for Wideband Radar Applications.
IEEE Trans. Circuits Syst. II Express Briefs
Can Çaliskan, Melik Yazici, Mehmet Kaynak, Yasar Gurbuz
2020 — conf
Advanced Thermal Modeling of IC - Package Interaction.
RWS
Zhibo Cao, Matteo Stocchi, Matthias Wietstruck, Federico Garbuglia, Diego Pincini, Mehmet Kaynak
2020 J jnl
Front-End Blocks of a W-Band Dicke Radiometer in SiGe BiCMOS Technology.
IEEE Trans. Circuits Syst.
Berktug Ustundag, Esref Turkmen, Abdurrahman Burak, Berke Gungor, Hamza Kandis, Barbaros Cetindogan, Melik Yazici, Mehmet Kaynak, Yasar Gurbuz
2019 J jnl
Ultra-Low Noise Amplifier for X-Band SiGe BiCMOS Phased Array Applications.
IEEE Trans. Circuits Syst. II Express Briefs
Can Çaliskan, Ilker Kalyoncu, Melik Yazici, Mehmet Kaynak, Yasar Gurbuz
2018 J jnl
Experiments on MEMS Integration in 0.25 μm CMOS Process.
Sensors
Piotr Michalik, Daniel Fernández, Matthias Wietstruck, Mehmet Kaynak, Jordi Madrenas
2018 J jnl
High-Power Radiation at 1 THz in Silicon: A Fully Scalable Array Using a Multi-Functional Radiating Mesh Structure.
IEEE J. Solid State Circuits
Zhi Hu, Mehmet Kaynak, Ruonan Han
2017 — conf
200 mm Wafer level graphene transfer by wafer bonding technique.
ESSDERC
Mesut Inac, Grzegorz Lupina, Matthias Wietstruck, Marco Lisker, Mirko Fraschke, Andreas Mai, Fabio Coccetti, Mehmet Kaynak
2015 — conf
High-performance W-band LNA and SPDT switch in 0.13µm SiGe HBT technology.
RWS
Ahmet Cagri Ulusoy, Robert L. Schmid, Mehmet Kaynak, Bernd Tillack, John D. Cressler
2013 B conf
122 GHz patch antenna designs by using BCB above SiGe BiCMOS wafer process for system-on-chip applications.
PIMRC
R. Wang, Yaoming Sun, Mehmet Kaynak, Johannes Borngräber, B. Goettel, Stefan Beer, Johann-Christoph Scheytt
2013 — conf
A 4-bit SiGe passive phase shifter for X-band phased arrays.
RWS
Ilker Kalyoncu, Emre Ozeren, Mehmet Kaynak, Yasar Gurbuz
2013 — conf
A 4-bit SiGe passive phase shifter for X-band phased arrays.
WiSNet
Ilker Kalyoncu, Emre Ozeren, Mehmet Kaynak, Yasar Gurbuz
2013 — conf
Building blocks for an X-Band SiGe BiCMOS T/R module.
RWS
Tolga Dinc, Ilker Kalyoncu, Mehmet Kaynak, Yasar Gurbuz
2013 — conf
Building blocks for an X-Band SiGe BiCMOS T/R module.
WiSNet
Tolga Dinc, Ilker Kalyoncu, Mehmet Kaynak, Yasar Gurbuz
2013 J jnl
Failure analysis and detection methodology for capacitive RF-MEMS switches based on BEOL BiCMOS process.
Microelectron. Reliab.
Nuria Torres Matabosch, Fabio Coccetti, Mehmet Kaynak, Beatrice Espana, Bernd Tillack, Jean-Louis Cazaux
2012 J jnl
Estimation of RF performance from LF measurements: Towards the design for reliability in RF-MEMS.
Microelectron. Reliab.
Nuria Torres Matabosch, Mehmet Kaynak, Fabio Coccetti, Matthias Wietstruck, Bernd Tillack, Jean Louis Cazaux