| Year | Rank | Type | Title / Venue / Authors |
|---|---|---|---|
| 2018 | C | conf |
DDECS
|
| 2017 | — | conf |
DFT
|
| 2016 | — | conf |
ATS
|
| 2015 | J | jnl |
Microprocess. Microsystems
|
| 2014 | — | conf |
IDT
|
| 2014 | Misc | conf |
VLSID
|
| 2014 | — | conf |
IDT
|
| 2014 | B | conf |
ETS
|
| 2014 | C | conf |
PDP
|
| 2013 | J | jnl |
Microprocess. Microsystems
|
| 2013 | J | jnl |
IEEE Des. Test
|
| 2013 | — | — |
|
| 2013 | C | conf |
DDECS
|
| 2012 | — | conf |
Asian Test Symposium
|
| 2012 | C | conf |
DDECS
|
| 2012 | B | conf |
ETS
|
| 2012 | C | conf |
DSD
|
| 2011 | C | conf |
DSD
|
| 2008 | B | conf |
ARES
|
| 2007 | C | conf |
PRDC
|