Md Toufiq Hasan Anik

15 papers B 2C 2Misc 1Journal 5Unranked 5
YearRankTypeTitle / Venue / Authors
2025 B conf
BISSEL: Built-In Self Security via Embedded Sensors for Reproducible Side-Channel Leakage Assessment.
ETS
Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
2025 C conf
TIGER: TrIaGing KEy Refreshing Frequency via Digital Sensors.
SECRYPT
Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Mohammad Ebrahimabadi, Javad Bahrami, Hossein Pourmehrani, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
2024 — conf
Attacking Multi-Tenant FPGAs Without Manual Placement and Routing.
ISVLSI
Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
2024 J jnl
Multi-modal Pre-silicon Evaluation of Hardware Masking Styles.
J. Electron. Test.
Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Wei Cheng, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
2024 J jnl
On the Resiliency of Protected Masked S-Boxes Against Template Attack in the Presence of Temperature and Aging Misalignments.
IEEE Trans. Very Large Scale Integr. Syst.
Md Toufiq Hasan Anik, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
2023 — conf
Aging-Induced Failure Prognosis via Digital Sensors.
ACM Great Lakes Symposium on VLSI
Md Toufiq Hasan Anik, Hasin Ishraq Reefat, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
2021 J jnl
Detecting Failures and Attacks via Digital Sensors.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
Md Toufiq Hasan Anik, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
2021 J jnl
Masked SABL: A Long Lasting Side-Channel Protection Design Methodology.
IEEE Access
Bijan Fadaeinia, Md Toufiq Hasan Anik, Naghmeh Karimi, Amir Moradi
2021 — conf
On the Impact of Aging on Power Analysis Attacks Targeting Power-Equalized Cryptographic Circuits.
ASP-DAC
Md Toufiq Hasan Anik, Bijan Fadaeinia, Amir Moradi, Naghmeh Karimi
2021 — conf
Real-Time IC Aging Prediction via On-Chip Sensors.
ISVLSI
Ke Huang, Md Toufiq Hasan Anik, Xinqiao Zhang, Naghmeh Karimi
2021 J jnl
Reducing Aging Impacts in Digital Sensors via Run-Time Calibration.
J. Electron. Test.
Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
2021 — conf
Testing and Reliability Enhancement of Security Primitives.
DFT
Md Toufiq Hasan Anik, Jean-Luc Danger, Omar Diankha, Mohammad Ebrahimabadi, Christoph Frisch, Sylvain Guilley, Naghmeh Karimi, Michael Pehl, Sofiane Takarabt
2020 B conf
Failure and Attack Detection by Digital Sensors.
ETS
Md Toufiq Hasan Anik, Rachit Saini, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi
2020 Misc conf
On the Effect of Aging on Digital Sensors.
VLSID
Md Toufiq Hasan Anik, Sylvain Guilley, Jean-Luc Danger, Naghmeh Karimi
2020 C conf
On-Chip Voltage and Temperature Digital Sensor for Security, Reliability, and Portability.
ICCD
Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, Hamed Pirsiavash, Jean-Luc Danger, Sylvain Guilley, Naghmeh Karimi