Mayank Shrivastava

67 papers A* 2B 2Misc 5Journal 5Unranked 53

Year	Rank	Type	Title / Venue / Authors
2025	J	`jnl`	Beyond Johnson-Lindenstrauss: Uniform Bounds for Sketched Bilinear Forms. CoRR Rohan Deb, Qiaobo Li, Mayank Shrivastava, Arindam Banerjee
2025	—	`conf`	Bridging the Performance and Reliability Gap of GaN-on-Si with GaN-on-SiC RF HEMTs by Efficient Electric Field Management Using a Novel p-type Oxide Passivation. IRPS Mohammad Ateeb Munshi, Saniya Syed Wani, Mehak Ashraf Mir, Anup Thakare, Mayank Shrivastava
2025	—	`conf`	Evidence of Back-Gating and its Impact on Breakdown in GaN-on-Si HEMTs with Carbon Doped Buffer Under Pulsed Conditions. IRPS Mohammad Ateeb Munshi, Mehak Ashraf Mir, Mayank Shrivastava
2025	—	`conf`	Experimental Validation of Buffer Traps-Driven Electric Field Dynamics Governing Breakdown and Leakage Trends in AlGaN/GaN Heterostructures. IRPS Rasik Rashid Malik, Simran R. Karthik, Vipin Joshi, Rajarshi Roy Chaudhuri, Mohammad Ateeb Munshi, Mehak Ashraf Mir, Saniya Syed Wani, Mayank Shrivastava
2025	—	`conf`	First Observations and Physical Insights of the Dynamic Breakdown Voltage and Overvoltage Margin Under Pulsed Conditions in β-Ga2O3Based Devices. IRPS Harsh Raj, Mayank Shrivastava
2025	—	`conf`	Novel Trigger Circuit & SCR Device Co-Engineering Based Local (I/O-VSS & I/O-VDD) ESD Clamp Concepts with Improved Latch-Up Susceptibility, Lower Leakage and Lower Capacitance for Ultra High Speed I/Os. IRPS Mitesh Goyal, Mukesh Chaturvedi, Harihar Nath, Mahesh Vaidya, Mayank Shrivastava
2025	—	`conf`	Proposal to Achieve the Ultimate Holding Voltage Tunability in Silicon Controlled Rectifiers (SCRs) for a Wide Range of ESD Protection Application. IRPS Mayank Yadav, Mahesh Vaidya, Mayank Shrivastava
2025	—	`conf`	Small Signal Analysis of Degradation and Breakdown in TMD FETs. IRPS Utpreksh Patbhaje, Rupali Verma, Mayank Shrivastava
2024	—	`conf`	Breakthrough Metal/Graphene Interface Phonon Engineering for Reliable Graphene Based-Heat Spreaders. IRPS Jeevesh Kumar, Aadil Bashir Dar, Asif Altaf Shah, K. M. Amogh, Sumana Chattaraj, Utpreksh Patbhaje, Anand Kumar Rai, Rupali Verma, Mayank Shrivastava
2024	—	`conf`	Decoupling Current and Voltage Mediated Breakdown Mechanisms in CVD MoS2 FETs. IRPS Utpreksh Patbhaje, Rupali Verma, Jeevesh Kumar, Aadil Bashir Dar, Mayank Shrivastava
2024	—	`conf`	Electric Field Coupled Molecular Dynamic Insights into Anisotropic Reliability Issues of Monolayer MoS2 Based 2D FETs. IRPS Asif Altaf Shah, Rupali Verma, Rajarshi Roy Chaudhuri, Aadil Bashir Dar, Jeevcsh Kumar, Anand Kumar Rai, Sumana Chattaraj, Mayank Shrivastava
2024	—	`conf`	Experimental Insights into the Role of Inter-valley and Defect Transitions of Hot Electrons in Determining Self-heating in AlGaN/GaN HEMTs. IRPS Rajarshi Roy Chaudhuri, Vipin Joshi, Saniya S. Wani, Simran R. Karthik, Rasik Rashid Malik, Mayank Shrivastava
2024	—	`conf`	Hot Carrier Dynamics and Electrical Breakdown Analysis in 2D Transition Metal Dichalcogenide FETs. IRPS Rupali Verma, Utpreksh Patbhaje, Asif Altaf Shah, Jeevesh Kumar, Rajarshi Roy Chaudhuri, Aadil Bashir Dar, Mayank Shrivastava
2024	—	`conf`	Load-line Dependent Current Filament Dynamics in N anoscale SCR Devices. IRPS Mitesh Goyal, Mukesh Chaturvedi, Raju Kumar, Mahesh Vaidya, Mayank Shrivastava
2024	—	`conf`	Missing Trigger Circuit Action and Device Engineering for Conventional Nanoscale SCR. IRPS Mitesh Goyal, Mukesh Chaturvedi, Raju Kumar, Mahesh Vaidya, Mayank Shrivastava
2024	—	`conf`	On The Role of Stress Engineering of Surface Passivation in Determining the Device Performance of AlGaN/GaN HEMTs. IRPS Mehak Ashraf Mir, Anup Thakare, Mohammad Ateeb Munshi, V. Avinash, Saniya S. Wani, Zubear Khan, Rajarshi Roy Chaudhuri, Simran R. Karthik, Rasik Rashid Malik, Vipin Joshi, Mayank Shrivastava
2024	A*	`conf`	Sketching for Distributed Deep Learning: A Sharper Analysis. NeurIPS Mayank Shrivastava, Berivan Isik, Qiaobo Li, Sanmi Koyejo, Arindam Banerjee
2023	—	`conf`	3D Approaches to Engineer Holding Voltage of SCR. IRPS Satendra Kumar Gautam, Harsha B. Variar, Juan Luo, Ning Shi, David Marreiro, Shekar Mallikarjunaswamy, Mayank Shrivastava
2023	—	`conf`	Atomic-level Insight and Quantum Chemistry of Ambient Reliability Issues of the TMDs Devices. IRPS Jeevesh Kumar, Hemanjaneyulu Kuruva, Harsha B. Variar, Utpreksh Patbhaje, Mayank Shrivastava
2023	—	`conf`	Circuit Reliability of $\text{MoS}_{2}$ Channel Based 2D Transistors. IRPS Anand Kumar Rai, Harsha B. Variar, Mayank Shrivastava
2023	—	`conf`	Dynamic Interplay of Surface and Buffer Traps in Determining Drain Current Injection induced Device Instability in OFF-state of AlGaN/GaN HEMTs. IRPS Mehak Ashraf Mir, Vipin Joshi, Rajarshi Roy Chaudhuri, Mohammad Ateeb Munshi, Rasik Rashid Malik, Mayank Shrivastava
2023	—	`conf`	Engineering Custom TLP I-V Characteristic Using a SCR-Diode Series ESD Protection Concept. IRPS Harsha B. Variar, Satendra Kumar Gautam, Ashita Kumar, K. M. Amogh, Juan Luo, Ning Shi, David Marreiro, Shekar Mallikarjunaswamy, Mayank Shrivastava
2023	A*	`conf`	Expressive and Efficient Representation Learning for Ranking Links in Temporal Graphs. WWW Susheel Suresh, Mayank Shrivastava, Arko Mukherjee, Jennifer Neville, Pan Li
2023	—	`conf`	Extremely Large Breakdown to Snapback Voltage Offset $(\mathrm{V}_{\mathrm{t}1} > > \mathrm{V}_{\text{BD}})$: Another Way to Improve ESD Resilience of LDMOS Devices. IRPS Aakanksha Mishra, Boeila Sampath Kumar, M. Monishmurali, Shaik Ahamed Suzaad, Shubham Kumar, Kiran Pote Sanjay, Amit Kumar Singh, Ankur Gupta, Mayank Shrivastava
2023	—	`conf`	Impact of Thin-oxide Gate on the On-Resistance of HV-PNP Under ESD Stress. IRPS M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava
2023	B	`conf`	Max-Quantile Grouped Infinite-Arm Bandits. ALT Ivan Lau, Yan Hao Ling, Mayank Shrivastava, Jonathan Scarlett
2023	—	`conf`	Multi-attention TransUNet - A Transformer Approach for Image Description Generation. FICTA (1) Pradumn Mishra, Mayank Shrivastava, Urja Jain, Abhisek Omkar Prasad, Suresh Chandra Satapathy
2023	—	`conf`	Multi-finger turn-on: A potential cause of premature failure in Drain Extended HV Nanosheet Devices. IRPS Jatin, M. Monishmurali, Mayank Shrivastava
2023	—	`conf`	OFF State Reliability Challenges of Monolayer WS2 FET Photodetector: Impact on the Dark and Photo-Illuminated State. IRPS Rupali Verma, Utpreksh Patbhaje, Jeevesh Kumar, Anand Kumar Rai, Mayank Shrivastava
2023	—	`conf`	Physical Insights into the DC and Transient Reverse Bias Reliability of β-Ga2O3 Based Vertical Schottky Barrier Diodes. IRPS Harsh Raj, Vipin Joshi, Rajarshi Roy Chaudhuri, Rasik Rashid Malik, Mayank Shrivastava
2023	—	`conf`	Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and its Impact on p-GaN Gate Stack Instability in AlGaN/GaN HEMTs. IRPS Rasik Rashid Malik, Vipin Joshi, Rajarshi Roy Chaudhuri, Mehak Ashraf Mir, Zubear Khan, Avinas N. Shaji, Madhura Bhattacharya, Anup T. Vitthal, Mayank Shrivastava
2023	—	`conf`	Unique Dependence of the Breakdown Behavior of Normally-OFF Cascode AlGaN/GaN HEMTs on Carrier Transport Through the Carbon-Doped GaN Buffer. IRPS Vipin Joshi, Sayak Dutta Gupta, Rajarshi Roy Chaudhuri, Mayank Shrivastava
2023	—	`conf`	Unique Lattice Temperature Dependent Evolution of Hot Electron Distribution in GaN HEMTs on C-doped GaN Buffer and its Reliability Consequences. IRPS Rajarshi Roy Chaudhuri, Vipin Joshi, Amratansh Gupta, Tanmay Joshi, Rasik Rashid Malik, Mehak Ashraf Mir, Sayak Dutta Gupta, Mayank Shrivastava
2023	—	`conf`	Unveiling Field Driven Performance Unreliabilities Governed by Channel Dynamics in MoSe2 FETs. IRPS Utpreksh Patbhaje, Rupali Verma, Jeevesh Kumar, Ansh, Mayank Shrivastava
2022	—	`conf`	Are Argon and Nitrogen Gases Really Inert to Graphene Devices? DRC Jeevesh Kumar, Mayank Shrivastava
2022	J	`jnl`	CASPR: Customer Activity Sequence-based Prediction and Representation. CoRR Pin-Jung Chen, Sahil Bhatnagar, Sagar Goyal, Damian Konrad Kowalczyk, Mayank Shrivastava
2022	—	`conf`	Effect of Source & Drain Side Abutting on the Low Current Filamentation in LDMOS-SCR Devices. IRPS M. Monishmurali, Nagothu Karmel Kranthi, Gianluca Boselli, Mayank Shrivastava
2022	J	`jnl`	Federated Graph Representation Learning using Self-Supervision. CoRR Susheel Suresh, Danny Godbout, Arko Mukherjee, Mayank Shrivastava, Jennifer Neville, Pan Li
2022	J	`jnl`	Implications of Various Charge Sources in AlGaN/GaN Epi-Stack on the Drain & Gate Connected Field Plate Design in HEMTs. IEEE Access Ankit Soni, Mayank Shrivastava
2022	J	`jnl`	Max-Quantile Grouped Infinite-Arm Bandits. CoRR Ivan Lau, Yan Hao Ling, Mayank Shrivastava, Jonathan Scarlett
2021	—	`conf`	A Novel High Voltage Drain Extended FinFET SCR for SoC Applications. IRPS M. Monishmurali, Mayank Shrivastava
2021	—	`conf`	Peculiar Current Instabilities & Failure Mechanism in Vertically Stacked Nanosheet ggN-FET. IRPS M. Monishmurali, Mayank Shrivastava
2020	—	`conf`	Defect Assisted Metal-TMDs Interface Engineering: A First Principle Insight. DRC Jeevesh Kumar, Ansh, Hemanjaneyulu Kuruva, Mayank Shrivastava
2020	—	`conf`	Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices. IRPS Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
2020	—	`conf`	First Insights into Electro-Thermal Stress Driven Time-Dependent Permanent Degradation Failure of CVD Monolayer MoS2 Channel. IRPS Ansh, Gaurav Sheoran, Jeevesh Kumar, Mayank Shrivastava
2020	—	`conf`	How to Achieve Moving Current Filament in High Voltage LDMOS Devices: Physical Insights & Design Guidelines for Self-Protected Concepts. IRPS Nagothu Karmel Kranthi, Chirag Garg, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
2020	—	`conf`	Improved Turn-on Uniformity & Failure Current Density by n-& p-Tap Engineering in Fin Based SCRs. IRPS M. Monishmurali, Milova Paul, Mayank Shrivastava
2020	—	`conf`	On the Root Cause of Dynamic ON Resistance Behavior in AlGaN/GaN HEMTs. IRPS Sayak Dutta Gupta, Vipin Joshi, Rajarshi Roy Chaudhuri, Anant kr Singh, Sirsha Guha, Mayank Shrivastava
2020	—	`conf`	Physical Insights into Phosphorene Transistor Degradation Under Exposure to Atmospheric Conditions and Electrical Stress. IRPS Jeevesh Kumar, Ansh, Asha Yadav, Anant Singh, Andrew Naclerio, Dmitri N. Zakharov, Piran Kidambi, Mayank Shrivastava
2020	—	`conf`	Threshold Voltage Shift in a-Si: H Thin film Transistors under ESD stress Conditions. IRPS Rajat Sinha, Prasenjit Bhattacharya, Sanjiv Sambandan, Mayank Shrivastava
2019	—	`conf`	Current Filament Dynamics Under ESD Stress in High Voltage (Bidirectional) SCRs and It's Implications on Power Law Behavior. IRPS Nagothu Karmel Kranthi, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
2019	—	`conf`	First Demonstration and Physical Insights into Time-Dependent Breakdown of Graphene Channel and Interconnects. IRPS Abhishek Mishra, Adil Meersha, Nagothu Karmel Kranthi, Kruti Trivedi, Harsha B. Variar, N. S. Veenadhari Bellamkonda, Srinivasan Raghavan, Mayank Shrivastava
2019	—	`conf`	Physical Insights into the Low Current ESD Failure of LDMOS-SCR and its Implication on Power Scalability. IRPS Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava
2019	—	`conf`	UV-Assisted Probing of Deep-Level Interface Traps in GaN MISHEMTs and Their Role in Threshold Voltage & Gate Leakage Instabilities. IRPS Sayak Dutta Gupta, Vipin Joshi, Bhawani Shankar, Swati Shikha, Srinivasan Raghavan, Mayank Shrivastava
2018	—	`conf`	Contact and junction engineering in bulk FinFET technology for improved ESD/latch-up performance with design trade-offs and its implications on hot carrier reliability. IRPS Milova Paul, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava
2018	—	`conf`	Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs. IRPS Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Harsha B. Variar, Mayank Shrivastava
2018	Misc	`conf`	On the ESD Reliability Issues in Carbon Electronics: Graphene and Carbon Nano Tubes. VLSID Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Mayank Shrivastava
2018	—	`conf`	On the ESD behavior of a-Si: H based thin film transistors: Physical insights, design and technological implications. IRPS Rajat Sinha, Prasenjit Bhattacharya, Sanjiv Sambandan, Mayank Shrivastava
2018	—	`conf`	On the trap assisted stress induced safe operating area limits of AlGaN/GaN HEMTs. IRPS Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, R. Sengupta, Heena Khand, N. Mohan, Srinivasan Raghavan, Mayank Shrivastava
2018	—	`conf`	Pinot: Realtime OLAP for 530 Million Users. SIGMOD Conference Jean-François Im, Kishore Gopalakrishna, Subbu Subramaniam, Mayank Shrivastava, Adwait Tumbde, Xiaotian Jiang, Jennifer Dai, Seunghyun Lee, Neha Pawar, Jialiang Li, Ravi Aringunram
2018	—	`conf`	Safe Operating Area (SOA) reliability of Polarization Super Junction (PSJ) GaN FETs. IRPS Bhawani Shankar, Ankit Soni, Sayak Dutta Gupta, Mayank Shrivastava
2017	Misc	`conf`	A Systematic Study on the Hysteresis Behaviour and Reliability of MoS2 FET. VLSID Adil Meersha, B. Sathyajit, Mayank Shrivastava
2017	Misc	`conf`	ESD Behavior of AlGaN/GaN HEMT on Si: Physical Insights, Design Aspects, Cumulative Degradation and Failure Analysis. VLSID Bhawani Shankar, Ankit Soni, Manikant Singh, Rohith Soman, K. N. Bhat, Srinivasan Raghavan, Navakanta Bhat, Mayank Shrivastava
2017	Misc	`conf`	Physics of Current Filamentation in ggNMOS Revisited: Was Our Understanding Scientifically Complete? VLSID Milova Paul, Christian Russ, Boeila Sampath Kumar, Harald Gossner, Mayank Shrivastava
2016	Misc	`conf`	A Fully-Integrated Radio-Frequency Power Amplifier in 28nm CMOS Technology Mounted in BGA Package. VLSID Ankur Gupta, Mayank Shrivastava, Maryam Shojaei Baghini, Harald Gossner, V. Ramgopal Rao
2015	B	`conf`	Towards predictable and risk-free enterprise systems. DSAA Mayank Shrivastava, Maitreya Natu, Vaishali P. Sadaphal
2011	—	`conf`	Two-stream indexing for spoken web search. WWW (Companion Volume) Jitendra Ajmera, Anupam Joshi, Sougata Mukherjea, Nitendra Rajput, Shrey Sahay, Mayank Shrivastava, Kundan Srivastava